Small Angle X-ray Scattering (SAXS) Measurements
Small Angle X-ray Scattering (SAXS) Measurements
Small Angle X-ray Scattering (SAXS) Measurements
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Table 1.<br />
Instrument Configuration and Scan Parameters for <strong>Small</strong> <strong>Angle</strong> <strong>Scattering</strong><br />
measurements (<strong>SAXS</strong>)<br />
Optics: Cross Beam Optic (CBO) with Parallel beam<br />
Sample Preparation : use the ground powder from previous measurements and<br />
sandwich approximately 3mg of sample between two layers of 0.0001” thick mylar film<br />
(from Chemplex). Screw the sample into the transmission holder and place in the beam<br />
path. Background measurements were also taken of just the two layers mylar film.<br />
For <strong>SAXS</strong><br />
Slits: Selection Slit: 0.03 mm<br />
Divergence Slit: 1mm<br />
Scatter Slit: 0.2 mm<br />
Receiving Slit: 0.1 mm<br />
Install Vacuum path boxes (2)<br />
Filter: No filter needed, no monochromator<br />
Detector: Scintillation Counter NaI (Tl)<br />
Scan Range: 0.1º to 8.0º 2�<br />
Scan Type: 2� only , fixed slit mode, chose a fixed 2theta = 1.5 degree<br />
Step Size: 0.01º2�<br />
Scan Speed: 10second dwell time FT (total time 98minutes)<br />
Run 2theta scans<br />
To measure background without sample use Al absorber as attenuator<br />
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