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Small Angle X-ray Scattering (SAXS) Measurements

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<strong>Small</strong> <strong>Angle</strong> X-<strong>ray</strong> <strong>Scattering</strong> (<strong>SAXS</strong>) <strong>Measurements</strong><br />

1. Start up the X-<strong>ray</strong> generator, elapsed time of 30 to 60 min is usually<br />

required to stabilize the focal position of the X-<strong>ray</strong> tube.<br />

2. It is presumed that the instrument has been aligned for parallel beam<br />

geometry with standard stage already.<br />

3. Inside Rigaku Control Panel:<br />

Go in the RINT2200 and change following:<br />

� In system construction (See Below)<br />

a. Attachment-Sample Holder (transmission method)<br />

b. Slit- <strong>SAXS</strong> slit<br />

c. If monochromator choice: No Monochromator<br />

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� In geometry of the system (Figure 7)<br />

a. <strong>Small</strong> <strong>Angle</strong><br />

4. On the goniometer put standard sample holder, remove diffracted beam<br />

monochromator and start automatic alignment. During the alignment you<br />

will be asked to put the <strong>SAXS</strong> sample holder. <strong>SAXS</strong> slit and other<br />

attachments.<br />

5. Components that you will be asked to put are<br />

<strong>SAXS</strong> selection slit in place of PB slit<br />

Vacuum Path<br />

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<strong>SAXS</strong> Unit<br />

6. Always put the sample in a way that sample surface faces the detector<br />

side.<br />

7. For collecting <strong>SAXS</strong> data, run a 2theta scan. A representative scan<br />

condition is described in Table 1 below.<br />

8. For analyzing <strong>SAXS</strong> data with NANO-Solver, a ratio of intensities (R) with<br />

and without sample is required, i.e.<br />

R = (Intensity with sample placed in sample holder using count<br />

monitor/Intensity without sample placed in sample holder using count<br />

monitor). Good values of R are between 1/3 to ½ (30-50%).<br />

a. If lower try slicing thinner sample or use reflection <strong>SAXS</strong><br />

b. If too high, add a layer to sample to increase X-<strong>ray</strong> absorbance<br />

Theta-D = 0<br />

Collect raw counts in theta/2theta mode with count monitor window and<br />

setting Theta-d and Theta-s at 0 degrees (0 degree for both arms by<br />

driving Theta-d and theta-s to zero) and using a Al absorber as attenuator<br />

in Manual Mode (see below), Make sure for all the runs the DS, RS and<br />

SS have same value.<br />

Now choose control axis as theta/2theta and using count monitor, press<br />

execute button. Note the counts both with and without the sample to get R.<br />

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Table 1.<br />

Instrument Configuration and Scan Parameters for <strong>Small</strong> <strong>Angle</strong> <strong>Scattering</strong><br />

measurements (<strong>SAXS</strong>)<br />

Optics: Cross Beam Optic (CBO) with Parallel beam<br />

Sample Preparation : use the ground powder from previous measurements and<br />

sandwich approximately 3mg of sample between two layers of 0.0001” thick mylar film<br />

(from Chemplex). Screw the sample into the transmission holder and place in the beam<br />

path. Background measurements were also taken of just the two layers mylar film.<br />

For <strong>SAXS</strong><br />

Slits: Selection Slit: 0.03 mm<br />

Divergence Slit: 1mm<br />

Scatter Slit: 0.2 mm<br />

Receiving Slit: 0.1 mm<br />

Install Vacuum path boxes (2)<br />

Filter: No filter needed, no monochromator<br />

Detector: Scintillation Counter NaI (Tl)<br />

Scan Range: 0.1º to 8.0º 2�<br />

Scan Type: 2� only , fixed slit mode, chose a fixed 2theta = 1.5 degree<br />

Step Size: 0.01º2�<br />

Scan Speed: 10second dwell time FT (total time 98minutes)<br />

Run 2theta scans<br />

To measure background without sample use Al absorber as attenuator<br />

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Figure 1. <strong>SAXS</strong> Transmission holder with sample sand witched in mylar film<br />

Figure 2. Various selection slits. Use 0.03 mm slit for <strong>SAXS</strong> measurement.<br />

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