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SL092030 - NXP.com

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Philips Semiconductors Product Specification Revision 3.0 2004 January 30I•CODE UIDSL2 ICS1111 I•CODE UID INLET/SMART LABEL CHARACTERISATION AND TESTThe parameters re<strong>com</strong>mended to be characterised for the I•CODE UID Inlet/Smart Label are:SYMBOL PARAMETER CONDITIONSf res Resonant frequency Resonant frequency @ T amb = 22 °C @ H minH minThreshold value of the field strengthfor BEGIN ROUND <strong>com</strong>mandResponse at BEGIN ROUND <strong>com</strong>mandTo detect damage of memory cells during production of inlets/labels a final test of the memory after assemblyof the inlet/label is re<strong>com</strong>mended (WRITE, BEGIN ROUND). This is necessary to achieve lowest failure rates.33

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