X-5000 MOBILE - Horiba

X-5000 MOBILE
Power & Flexibility
Fully Integrated Closed-Beam
Portable EDXRF System
Instrument Control
and Analysis Software
50kV, 10W;
Automated Multiple Filters
Silicon Drift Detector;
Low PPM LOD’s

Power and Performance in a Portable Package
For those who demand benchtop analytical power
with the ease of portability, the X-5000 offers the
fi eld-rugged, closed-beam X-5000 for on-site
analysis in virtually any environment.
The X-5000 offers true portability with a high level of
power and performance: our advanced 3-beam (kVmA-fi
lter settings) method and the latest in detector
technology – an innovative, large area Silicon Drift
Detector (SDD), used and tested extensively in highend,
laboratory based instrumentation. Use it as your
primary XRF analyzer, your lab XRF back up, your
screening tool or your fi eld inspection XRF system.
On-Board PC with Large Display Virtual Keyboard
Virtual keyboard
Set up test conditions
The X-5000 is offered with two different x-ray tube
anode choices. A tantalum (Ta) anode x-ray tube
confi guration is utilized for excellent sensitivity
measuring 25+ transition metals including Cd, Ag, Au,
Pb, Cr, and even Rare Earth Elements. A rhodium (Rh)
anode confi guration is offered when the application
calls for optimized analysis of light elements including
Al, Si, S, Mg and P, along with mid range transition
metals.
The X-5000 can also be customized for specifi c
applications - ask our representative for more details
including limits of detection.
Choose testing mode
View Results

Detection limits for the X-5000
Element X-5000
Aluminum AI 1,000
Antimony Sb 10-50
Barium Ba 20-100
Cadmium Cd 5-10
Calcium Ca 40
Chlorine Cl 150
Chromium Cr 2
Copper Cu 1
Iron Fe 1
Lead Pb 1
Magnesium Mg 2,000
Manganese Mn 2
Molybdenum Mo 1
Nickel Ni 1
Phosphorus P 1,000
Potassium K >500
Silicon Si 1,000
Silver Ag 10-20
Sulfur S 250
Tin Sn 5-50
Titanium Ti 10
Vanadium V 8
Zinc Zn 1
• Ranges shown due to effects of sample matrix, presence of interfering elements.
• LOD’s are for a 2-minute test per beam, 3-sigma confi dence.

Specifications
50kV, 200μA x-ray tube
Application optimized x-ray tube anode: Rh for light element focused applications; Ta for heavy transition metal
focused applications
High resolution Silicon Drift detector that delivers < 165 eV resolution (FWHM Mn K-alpha line) in a proven,
fi eld-rugged package
Rugged, injection molded, sealed carrying case and sealed test platform
Powerful Pentium processor, embedded XP and sealed, fi eld-hardened color touchscreen
Multiple analysis modes including Fundamental Parameters, Compton Normalization, Empirical Calibration
models, Spectral Matching
6-position primary beam fi lters for optimal performance across the periodic table
Sample platform with interlocked testing cover
AC Power or 3 hours Li-ion battery power with optional battery pack (typical duty cycles)
Total weight 20 lbs/9 kg
Dimensions (approx.) 12” x 13” x 8” in./ 30 x 33 x 20 cm
Sample chamber dimensions 12” x 8” x 5” / 30 x 20 x 12.5 cm
HORIBA Instruments, Inc.
34 Bunsen
Irvine, CA 92618 USA
Phone: 1-800-446-7422
www.horiba.com/us/oil
Email: labinfo@horiba.com
Copyright @ 2011, HORIBA Instruments, Inc.
For further information on this document
or our products, please contact us.