Single-Event Transient Pulse-Width Measurements in Advanced ...

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ImpactVanderbilt Radiation Effects GroupSchool of Engineering Resolve controversy on expected pulse widths Quantify technology trends in SET pulse widths Characterize effect of RHBD structures such as multiplewell contacts and guard bands on SET pulse widths Determine effect of charge sharing on SETs Technique can also be used to measure other spurioussignals such as cross-talk pulsesMURI ReviewMay 13, 2008 16
ConclusionVanderbilt Radiation Effects GroupSchool of Engineering Autonomous SET characterization technique developedand implemented to obtain precise distributions ofheavy-ion, neutron, proton and alpha induced SETwidths in 130-nm/90-nm CMOS Width and range of dominant SETs increase with scaling Neutron and alpha particle induced SETs are of order oflegitimate logic signals – concern for commercialapplications High density well contacts and guard bands helpsreduce more than 70% of SETs longer than 1 nsMURI ReviewMay 13, 2008 17
Page 4: Autonomous SET captureVanderbilt Ra
Page 7 and 8: 1.2 48 58.7 75 100Vanderbilt Radiat
Page 9 and 10: Alpha-Induced SETsVanderbilt Radiat
Page 11 and 12: Comparison - Energetic ParticlesVan
Page 13 and 14: Other ApplicationsVanderbilt Radiat
Page 15: Characterizing Guard BandsVanderbil

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