Single-Event Transient Pulse-Width Measurements in Advanced ...

More documents

Recommendations

Info

Heavy-Ion – 130-nm & 90-nmVanderbilt Radiation Effects GroupSET pulse width (ps)2000180016001400120010008006004002000130-nmIBM 130-nm (8RF)9.7 9.7(60°)SET pulse width (ps)1600max140012001000 +1óavg800-1ó600min40031.2 31.2200(50°)LET (MeV-cm0 2 /mg)58.7 58.7(38°)9.7(130-nm)130-nm90-nm9.0(90-nm)58.7(55°)1000 160090-nm1400130-nm vs 90-nm10010Events measuredSET pulse-width (ps)31.2(130-nm)12001000800600400200030.0(90-nm)LET (MeV-cm 2 /mg)IBM 90-nm (9SF)max+1óavg-1óminSchool of Engineering1.8 3 5.7 9 20.6 30 40.7 59LET (MeV-cm 2 /mg)58.7(130-nm)59.0(90-nm)10000100010010Events measured Results indicate increasing SET pulse widths with scaling important aslatch setup/hold times decrease with scaling more SETs latched as errorMURI ReviewMay 13, 2008 6
1.2 48 58.7 75 100Vanderbilt Radiation Effects GroupSchool of Engineering-1σ+1σ -1σ+1σSET cross section per inverter (!m 2 )100.80.60.40.20.0Cross Section Comparisonmin-1óavg+1ó100240 480 720 960 1200 1440SET pulse width (ps)9.7 MeV-cm^2/mg20 MeV-cm^2/mg58.7 MeV-cm^2/mg130-nmEvents measured10.6 30 40.7 592 /mg)maxSET cross section per inverter (!m 2 )5 MeV-cm^2/mg0.620 MeV-cm^2/mg40 MeV-cm^2/mg0.40.2010001000100Events measured100 300 500 700 900 1100 1300SET pulse width (ps)90-nm Event cross section dominated by pulses between 300 ps to 700 ps in 130 nm 400 ps to 900 ps in 90 nm Increase in wider transients translates to higher error rates with scalingMURI ReviewMay 13, 2008 7
Page 4: Autonomous SET captureVanderbilt Ra
Page 9 and 10: Alpha-Induced SETsVanderbilt Radiat
Page 11 and 12: Comparison - Energetic ParticlesVan
Page 13 and 14: Other ApplicationsVanderbilt Radiat
Page 15 and 16: Characterizing Guard BandsVanderbil
Page 17: ConclusionVanderbilt Radiation Effe

Single-Event Transient Pulse-Width Measurements in Advanced ...

You also want an ePaper? Increase the reach of your titles

Delete template?

Save as template?