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X-<strong>Ray</strong> <strong>Spectrometry</strong>:Recent Technological Advances
Page 6: X-Ray Spectrometry:Recent Technolog
Page 10: ContentsContributors ..............
Page 16: viiiCONTRIBUTORSJ. KawaiDepartment
Page 22: PrefaceDuring the last decade, rema
Page 26: Chapter 1Introduction1.1 Considerin
Page 30: THE ROLE AND POSITION OF XRS IN ANA
Page 34: THE ROLE AND POSITION OF XRS IN ANA
Page 38: VOLUME OUTLINE 7The third chapter i
Page 42: VOLUME OUTLINE 9Physics, University
Page 46: REFERENCE 11(versus other technique
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14 MICRO X-RAY SOURCESTable 2.1.1 P
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16 MICRO X-RAY SOURCESF80GHESource
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18 MICRO X-RAY SOURCES(1) If the di
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20 MICRO X-RAY SOURCES(a)(b)Figure
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22 MICRO X-RAY SOURCESthe rotating
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24 MICRO X-RAY SOURCES10 5 −5000
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26 MICRO X-RAY SOURCESuntil it was
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2.2 New Synchrotron Radiation Sourc
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INTRODUCTION 31Table 2.2.1 Synchrot
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THIRD GENERATION SOURCES AND OTHER
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FOURTH GENERATION SOURCES 415Intens
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FOURTH GENERATION SOURCES 43Electro
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FOURTH GENERATION SOURCES 45Peak br
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REFERENCES 478. Walker, R. P. and D
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50 LASER-DRIVEN X-RAY SOURCESrange
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52 LASER-DRIVEN X-RAY SOURCESTable
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54 LASER-DRIVEN X-RAY SOURCESin sil
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56 LASER-DRIVEN X-RAY SOURCESextrem
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58 LASER-DRIVEN X-RAY SOURCESclose
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60 LASER-DRIVEN X-RAY SOURCESpower
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62 LASER-DRIVEN X-RAY SOURCESWang,
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64 MULTILAYERS FOR SOFT AND HARD X-
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80 SINGLE CAPILLARIES X-RAY OPTICST
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82 SINGLE CAPILLARIES X-RAY OPTICSD
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84 SINGLE CAPILLARIES X-RAY OPTICS(
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86 SINGLE CAPILLARIES X-RAY OPTICSF
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3.3 Polycapillary X-ray OpticsN. GA
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FUNDAMENTALS OF POLYCAPILLARY OPTIC
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FOCUSING OPTICS 93to the axis, whic
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FOCUSING OPTICS 95small X-ray sourc
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COLLIMATING OPTICS 97minimal workin
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ANALYTICAL APPLICATIONS OF POLYCAPI
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REFERENCES 109working space between
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3.4 Parabolic Compound Refractive X
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PHYSICS OF REFRACTIVE X-RAY LENSES
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PHYSICS OF REFRACTIVE X-RAY LENSES
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APPLICATIONS 117As the dimensions o
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APPLICATIONS 11910 times less. The
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APPLICATIONS 121certified standards
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APPLICATIONS 123The attenuation sig
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APPLICATIONS 125to be a 2D slice of
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APPLICATIONS 127with the penetratin
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REFERENCES 1292CdCl 2Absorbance (ar
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REFERENCES 13145. S. Bohic, A. Simi
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134 SEMICONDUCTOR DETECTORS FOR (IM
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4.2 Gas Proportional Scintillation
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THE PHYSICSOFTHEABSORPTION OF X-RAY
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TRANSPORT OF ELECTRONS IN Xe 20325X
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TRANSPORT OF ELECTRONS IN Xe 205Ele
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THE GAS PROPORTIONAL SCINTILLATION
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THE GAS PROPORTIONAL SCINTILLATION
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APPLICATIONS OF GAS PROPORTIONAL SC
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ACKNOWLEDGEMENTS 213Andalusite (AI
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REFERENCES 21523. Santos, F. P., Di
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218 SUPERCONDUCTING TUNNEL JUNCTION
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∋220 SUPERCONDUCTING TUNNEL JUNCT
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4.4 Cryogenic MicrocalorimetersM. G
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MICROCALORIMETERS 231consequently s
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PERFORMANCE 233JFET for the first s
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PERFORMANCE 235that depends on the
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CURRENT DEVELOPMENTS 237of TES that
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CURRENT DEVELOPMENTS 239X-rayTherma
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CURRENT DEVELOPMENTS 24112010080Fit
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REFERENCES 243absorber geometries,
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REFERENCES 245Tan, P., Cooley, L. D
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248 POSITION SENSITIVE SEMICONDUCTO
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Chapter 5Special Configurations5.1
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MODERN TOTAL REFLECTION X-RAY FLUOR
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MODERN TOTAL REFLECTION X-RAY FLUOR
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SURFACE AND INTERFACE ANALYSIS OF L
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SURFACE AND INTERFACE ANALYSIS OF L
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MICRO X-RAY FLUORESCENCE IMAGING 28
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FUTURE OUTLOOK 289X-Ray image4.8 mm
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REFERENCES 29145. B. W. Batterman,
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294 GRAZING-EXIT X-RAY SPECTROMETRY
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5.3 Portable Equipment for X-ray Fl
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INSTRUMENTATION 309of small size X-
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INSTRUMENTATION 311350030002500X-Ra
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INSTRUMENTATION 313Table 5.3.2 Char
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INSTRUMENTATION 315FWHM (eV)6005505
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INSTRUMENTATION 317Table 5.3.3 Comp
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INSTRUMENTATION 319EISFigure 5.3.10
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INSTRUMENTATION 321Figure 5.3.11 EI
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INSTRUMENTATION 323Table 5.3.5 Dete
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INSTRUMENTATION 325(a)(b)(c)"Unlimi
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INSTRUMENTATION 327Table 5.3.6 Mini
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APPLICATIONS 329Figure 5.3.22 The L
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APPLICATIONS 331Figure 5.3.24 Porta
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APPLICATIONS 3332600240022002000180
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APPLICATIONS 335lead-based poisonin
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APPLICATIONS 337• Provided in sit
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REFERENCES 339a ring-type geometry
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REFERENCES 341contamination associa
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344 SYNCHROTRON RADIATION FOR MICRO
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5.5 High-energy X-ray FluorescenceI
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PERFORMANCE OF HIGH-ENERGY XRF 3571
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PERFORMANCE OF HIGH-ENERGY XRF 359S
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PERFORMANCE OF HIGH-ENERGY XRF 3611
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APPLICATION OF HIGH-ENERGY XRF 3631
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APPLICATION OF HIGH-ENERGY XRF 3651
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APPLICATION OF HIGH-ENERGY XRF 367S
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APPLICATION OF HIGH-ENERGY XRF 369A
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REFERENCES 371SPring-8 utilizing th
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5.6 Low-energy Electron Probe Micro
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LOW-ENERGY SEM AND HIGH-RESOLUTION
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APPLICATIONS 377Figure 5.6.1 ‘Fis
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APPLICATIONS 379100 nm100 nmFigure
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APPLICATIONS 381TEM was soon abando
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APPLICATIONS 3831 µm2 µmsSulfurFS
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REFERENCES 385casing when this is r
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5.7 Energy Dispersive X-ray Microan
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SIGNALS GENERATED IN A THIN TEM SPE
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SIGNALS GENERATED IN A THIN TEM SPE
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ELECTRON ENERGY LOSS SPECTROSCOPY V
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QUANTITATIVE ANALYSIS IN EDX 3951(a
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QUANTITATIVE ANALYSIS IN EDX 397the
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QUANTITATIVE ANALYSIS IN EDX 399max
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QUANTITATIVE ANALYSIS IN EDX 401of
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CONCLUSION 403(At %)(At %)656361595
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5.8 X-Ray Absorption TechniquesJ. K
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EXTREME CONDITIONS 407Figure 5.8.3
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COMBINATION WITH OPTICAL LUMINESCEN
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PHOTOCONDUCTIVE AND ELECTROCHEMICAL
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TOTAL REFLECTION XAFS 413q >> δ cP
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STRONG FIELD EFFECTS 415Absorbance
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STRONG FIELD EFFECTS 417Dispersed X
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EELS, ELNES AND EXELFS 4195.8.11 MI
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EXEFS 421Figure 5.8.25 An inner str
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STANDARDIZATION 423oscillation is d
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STANDARDIZATION 425Sc 2 O 3TiO 2MnO
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SUMMARY 427Figure 5.8.32 Ritsumeika
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REFERENCES 429This shortcoming has
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REFERENCES 43195. Tanaka, T., Bando
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REFERENCES 433192. Citrin, P. H. Su
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436 MONTE CARLO SIMULATION FOR X-RA
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6.2 Spectrum EvaluationP. LEMBERGEU
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LEAST-SQUARES FITTING USING ANALYTI
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ENERGY AND RESOLUTION CALIBRATION 4
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NUMERICAL PEAK SHAPE CORRECTION 469
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MODIFIED GAUSSIANS 471In these equa
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REPLACING THE GAUSSIAN BY A VOIGTIA
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CONVOLUTION OF MC SIMULATED SPECTRA
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PARTIAL LEAST-SQUARES REGRESSION 47
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FUTURE PERSPECTIVES 483to it during
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REFERENCES 485Philips, G.W. and Mar
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488 X-RAY FLUORESCENCE ANALYSIS IN
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7.2 Total Reflection X-ray Fluoresc
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IMPROVEMENTS IN TXRF INSTRUMENTATIO
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TXRF WITH CHEMICAL PRECONCENTRATION
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TXRF WITH CHEMICAL PRECONCENTRATION
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STANDARDIZATION OF TXRF AND OTHER M
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STANDARDIZATION OF TXRF AND OTHER M
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FILM ANALYSIS 529Normalized fluores
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REFERENCES 531(W-Si, Mo-Si, etc.),
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7.3 X-Ray Spectrometry in Archaeome
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ACCESSIBILITY OF TECHNIQUES: PORTAB
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SYNCHROTRON RADIATION IN ARCHAEOMET
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PROBING THE TEXTURE OF ANCIENT MATE
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RADIATION DAMAGE 545been the key of
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RECENT PIXE AND µ-PIXE APPLICATION
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CONCLUSIONS 549and three white prod
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REFERENCES 55114. G. Pappalardo, Nu
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7.4 X-Ray Spectrometry in Forensic
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FORENSIC APPLICATIONS OF LABORATORY
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FORENSIC APPLICATIONS OF SYNCHROTRO
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FORENSIC APPLICATIONS OF SYNCHROTRO
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FORENSIC APPLICATIONS OF HIGH ENERG
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REFERENCES 567products by glancing
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570 SPECIATION AND SURFACE ANALYSIS
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594 INDEXCryogenic microcalorimeter
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596 INDEX‘Gaussian equivalent FWH
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598 INDEXMonte Carlo (MC) simulatio
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600 INDEXSemiconductor detectors, 1
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602 INDEXTotal reflection X-ray flu
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