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xiiPREFACEto cover all the important and emerging fieldssufficiently well.We do hope this book will help analyticalchemists and other users of X-ray spectrometryto fully exploit the capabilities of this set ofpowerful analytical tools and to further expandits applications in such fields as material andenvironmental sciences, medicine, toxicology,forensics, archaeometry and many others.K. TsujiJ. InjukR. Van GriekenOsaka, Antwerp
Page 2: X-Ray Spectrometry:Recent Technolog
Page 8: Copyright © 2004John Wiley & Sons
Page 14: ContributorsF. AdamsDepartment of C
Page 18: CONTRIBUTORSixB. K. TannerBEDE Scie
Page 26: Chapter 1Introduction1.1 Considerin
Page 30: THE ROLE AND POSITION OF XRS IN ANA
Page 34: THE ROLE AND POSITION OF XRS IN ANA
Page 38: VOLUME OUTLINE 7The third chapter i
Page 42: VOLUME OUTLINE 9Physics, University
Page 46: REFERENCE 11(versus other technique
Page 52: 14 MICRO X-RAY SOURCESTable 2.1.1 P
Page 56: 16 MICRO X-RAY SOURCESF80GHESource
Page 60: 18 MICRO X-RAY SOURCES(1) If the di
Page 64: 20 MICRO X-RAY SOURCES(a)(b)Figure
Page 68: 22 MICRO X-RAY SOURCESthe rotating
Page 72: 24 MICRO X-RAY SOURCES10 5 −5000
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26 MICRO X-RAY SOURCESuntil it was
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2.2 New Synchrotron Radiation Sourc
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INTRODUCTION 31Table 2.2.1 Synchrot
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THIRD GENERATION SOURCES AND OTHER
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FOURTH GENERATION SOURCES 415Intens
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FOURTH GENERATION SOURCES 43Electro
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FOURTH GENERATION SOURCES 45Peak br
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REFERENCES 478. Walker, R. P. and D
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50 LASER-DRIVEN X-RAY SOURCESrange
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52 LASER-DRIVEN X-RAY SOURCESTable
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54 LASER-DRIVEN X-RAY SOURCESin sil
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56 LASER-DRIVEN X-RAY SOURCESextrem
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58 LASER-DRIVEN X-RAY SOURCESclose
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60 LASER-DRIVEN X-RAY SOURCESpower
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62 LASER-DRIVEN X-RAY SOURCESWang,
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64 MULTILAYERS FOR SOFT AND HARD X-
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80 SINGLE CAPILLARIES X-RAY OPTICST
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82 SINGLE CAPILLARIES X-RAY OPTICSD
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84 SINGLE CAPILLARIES X-RAY OPTICS(
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86 SINGLE CAPILLARIES X-RAY OPTICSF
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3.3 Polycapillary X-ray OpticsN. GA
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FUNDAMENTALS OF POLYCAPILLARY OPTIC
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FOCUSING OPTICS 93to the axis, whic
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FOCUSING OPTICS 95small X-ray sourc
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COLLIMATING OPTICS 97minimal workin
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ANALYTICAL APPLICATIONS OF POLYCAPI
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REFERENCES 109working space between
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3.4 Parabolic Compound Refractive X
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PHYSICS OF REFRACTIVE X-RAY LENSES
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PHYSICS OF REFRACTIVE X-RAY LENSES
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APPLICATIONS 117As the dimensions o
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APPLICATIONS 11910 times less. The
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APPLICATIONS 121certified standards
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APPLICATIONS 123The attenuation sig
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APPLICATIONS 125to be a 2D slice of
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APPLICATIONS 127with the penetratin
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REFERENCES 1292CdCl 2Absorbance (ar
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REFERENCES 13145. S. Bohic, A. Simi
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134 SEMICONDUCTOR DETECTORS FOR (IM
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4.2 Gas Proportional Scintillation
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THE PHYSICSOFTHEABSORPTION OF X-RAY
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TRANSPORT OF ELECTRONS IN Xe 20325X
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TRANSPORT OF ELECTRONS IN Xe 205Ele
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THE GAS PROPORTIONAL SCINTILLATION
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THE GAS PROPORTIONAL SCINTILLATION
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APPLICATIONS OF GAS PROPORTIONAL SC
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ACKNOWLEDGEMENTS 213Andalusite (AI
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REFERENCES 21523. Santos, F. P., Di
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218 SUPERCONDUCTING TUNNEL JUNCTION
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∋220 SUPERCONDUCTING TUNNEL JUNCT
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4.4 Cryogenic MicrocalorimetersM. G
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MICROCALORIMETERS 231consequently s
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PERFORMANCE 233JFET for the first s
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PERFORMANCE 235that depends on the
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CURRENT DEVELOPMENTS 237of TES that
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CURRENT DEVELOPMENTS 239X-rayTherma
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CURRENT DEVELOPMENTS 24112010080Fit
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REFERENCES 243absorber geometries,
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REFERENCES 245Tan, P., Cooley, L. D
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248 POSITION SENSITIVE SEMICONDUCTO
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Chapter 5Special Configurations5.1
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MODERN TOTAL REFLECTION X-RAY FLUOR
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MODERN TOTAL REFLECTION X-RAY FLUOR
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SURFACE AND INTERFACE ANALYSIS OF L
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SURFACE AND INTERFACE ANALYSIS OF L
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MICRO X-RAY FLUORESCENCE IMAGING 28
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FUTURE OUTLOOK 289X-Ray image4.8 mm
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REFERENCES 29145. B. W. Batterman,
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294 GRAZING-EXIT X-RAY SPECTROMETRY
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5.3 Portable Equipment for X-ray Fl
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INSTRUMENTATION 309of small size X-
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INSTRUMENTATION 311350030002500X-Ra
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INSTRUMENTATION 313Table 5.3.2 Char
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INSTRUMENTATION 315FWHM (eV)6005505
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INSTRUMENTATION 317Table 5.3.3 Comp
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INSTRUMENTATION 319EISFigure 5.3.10
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INSTRUMENTATION 321Figure 5.3.11 EI
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INSTRUMENTATION 323Table 5.3.5 Dete
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INSTRUMENTATION 325(a)(b)(c)"Unlimi
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INSTRUMENTATION 327Table 5.3.6 Mini
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APPLICATIONS 329Figure 5.3.22 The L
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APPLICATIONS 331Figure 5.3.24 Porta
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APPLICATIONS 3332600240022002000180
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APPLICATIONS 335lead-based poisonin
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APPLICATIONS 337• Provided in sit
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REFERENCES 339a ring-type geometry
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REFERENCES 341contamination associa
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344 SYNCHROTRON RADIATION FOR MICRO
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5.5 High-energy X-ray FluorescenceI
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PERFORMANCE OF HIGH-ENERGY XRF 3571
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PERFORMANCE OF HIGH-ENERGY XRF 359S
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PERFORMANCE OF HIGH-ENERGY XRF 3611
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APPLICATION OF HIGH-ENERGY XRF 3631
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APPLICATION OF HIGH-ENERGY XRF 3651
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APPLICATION OF HIGH-ENERGY XRF 367S
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APPLICATION OF HIGH-ENERGY XRF 369A
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REFERENCES 371SPring-8 utilizing th
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5.6 Low-energy Electron Probe Micro
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LOW-ENERGY SEM AND HIGH-RESOLUTION
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APPLICATIONS 377Figure 5.6.1 ‘Fis
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APPLICATIONS 379100 nm100 nmFigure
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APPLICATIONS 381TEM was soon abando
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APPLICATIONS 3831 µm2 µmsSulfurFS
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REFERENCES 385casing when this is r
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5.7 Energy Dispersive X-ray Microan
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SIGNALS GENERATED IN A THIN TEM SPE
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SIGNALS GENERATED IN A THIN TEM SPE
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ELECTRON ENERGY LOSS SPECTROSCOPY V
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QUANTITATIVE ANALYSIS IN EDX 3951(a
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QUANTITATIVE ANALYSIS IN EDX 397the
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QUANTITATIVE ANALYSIS IN EDX 399max
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QUANTITATIVE ANALYSIS IN EDX 401of
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CONCLUSION 403(At %)(At %)656361595
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5.8 X-Ray Absorption TechniquesJ. K
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EXTREME CONDITIONS 407Figure 5.8.3
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COMBINATION WITH OPTICAL LUMINESCEN
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PHOTOCONDUCTIVE AND ELECTROCHEMICAL
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TOTAL REFLECTION XAFS 413q >> δ cP
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STRONG FIELD EFFECTS 415Absorbance
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STRONG FIELD EFFECTS 417Dispersed X
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EELS, ELNES AND EXELFS 4195.8.11 MI
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EXEFS 421Figure 5.8.25 An inner str
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STANDARDIZATION 423oscillation is d
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STANDARDIZATION 425Sc 2 O 3TiO 2MnO
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SUMMARY 427Figure 5.8.32 Ritsumeika
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REFERENCES 429This shortcoming has
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REFERENCES 43195. Tanaka, T., Bando
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REFERENCES 433192. Citrin, P. H. Su
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436 MONTE CARLO SIMULATION FOR X-RA
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6.2 Spectrum EvaluationP. LEMBERGEU
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LEAST-SQUARES FITTING USING ANALYTI
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ENERGY AND RESOLUTION CALIBRATION 4
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NUMERICAL PEAK SHAPE CORRECTION 469
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MODIFIED GAUSSIANS 471In these equa
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REPLACING THE GAUSSIAN BY A VOIGTIA
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CONVOLUTION OF MC SIMULATED SPECTRA
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PARTIAL LEAST-SQUARES REGRESSION 47
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FUTURE PERSPECTIVES 483to it during
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REFERENCES 485Philips, G.W. and Mar
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488 X-RAY FLUORESCENCE ANALYSIS IN
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7.2 Total Reflection X-ray Fluoresc
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IMPROVEMENTS IN TXRF INSTRUMENTATIO
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TXRF WITH CHEMICAL PRECONCENTRATION
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TXRF WITH CHEMICAL PRECONCENTRATION
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STANDARDIZATION OF TXRF AND OTHER M
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STANDARDIZATION OF TXRF AND OTHER M
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FILM ANALYSIS 529Normalized fluores
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REFERENCES 531(W-Si, Mo-Si, etc.),
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7.3 X-Ray Spectrometry in Archaeome
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ACCESSIBILITY OF TECHNIQUES: PORTAB
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SYNCHROTRON RADIATION IN ARCHAEOMET
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PROBING THE TEXTURE OF ANCIENT MATE
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RADIATION DAMAGE 545been the key of
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RECENT PIXE AND µ-PIXE APPLICATION
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CONCLUSIONS 549and three white prod
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REFERENCES 55114. G. Pappalardo, Nu
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7.4 X-Ray Spectrometry in Forensic
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FORENSIC APPLICATIONS OF LABORATORY
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FORENSIC APPLICATIONS OF SYNCHROTRO
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FORENSIC APPLICATIONS OF SYNCHROTRO
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FORENSIC APPLICATIONS OF HIGH ENERG
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REFERENCES 567products by glancing
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570 SPECIATION AND SURFACE ANALYSIS
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594 INDEXCryogenic microcalorimeter
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596 INDEX‘Gaussian equivalent FWH
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598 INDEXMonte Carlo (MC) simulatio
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600 INDEXSemiconductor detectors, 1
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602 INDEXTotal reflection X-ray flu
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