Radiation-Hardened (RH) Products for Powering FPGAs

Linear Technology Space QualifiedProducts Website

Linear Technology Space QualifiedProducts Website

4K Topside Glassivation

Ø LTC planning to release Class V SMDs by Q1CY12Ø LTC Technology/Quality Conformance Inspections includes:q Group B subgroups 1- 4 plus 6 for each assembly lotq Group B/2 and B/3 for each inspection lotq Group B/5 for each wafer lotRHA Class V vs. LTC RH Flowq Subgroups are per MIL-STD-883 Test Method 5004 for Class S screening and TM5005for QCI/TCI/Qualification (Group B Class S).Ø LTC does not use Si3N4 [silicon nitride] top-side passivation on any RHofferings to date. Such passivation encourages radiation-induced trappedcharges which reduces hardness.Ø LTC uses a low temperature chemical deposited oxide, otherwise knownas ‘silox’ or ‘silicon dioxide’ as a non-scratch-proof top-side barrier.Ø 4,000 angstroms glassivation and no Silicon Nitride versus minimum6,000 angstroms and 2K Silicon Nitride as per MIL-PRF-38535 AppendixA and MIL-STD-883 TM5007 (Wafer Lot Acceptance)q LTC performs Glassivation as an integral part of its wafer fabrication process

nnnnnStandard Bipolar (BIPS700)uuFeatures 7-micron geometryNPN F T : 300MHzRadiation-Hardened ProcessesComplimentary Bipolar (Combi)uuFeatures 7-micron geometryRH1498/99Complimentary Bipolar (Combi)uuFeatures 2-micron geometryRH1814Stepper Bipolar (BIPU405)uuuFeatures 4-micron geometryNew Technology Insertion – RH6105MILDICE (In Development)RH3845MILDICE (In Development)High-Speed Bipolar (BIPH400)uuuFeatures 4-micron geometryR1959MILDICE (In Development – Vehicle to New Technology Insertion)NPN F T : 2GHzn High-Performance Bipolar (BIPC150)uuuuFeatures 1.5-micron geometry, PMOS structures, and SiCr thinfilm resistorsRH3080MKDICE (Vehicle to New Technology Insertion & Hillview CA Fab Qual)R3480MILDICE (In Development)NPN F T : 700MHz

Space Partnership ProgramPower Products with “RH DICE Inside”

Voltage Regulator AnalysisnnWorst Case Analysisu Stabilityu Step Loadu Current Limitu Short Circuitu Startup/Brownoutu Conducted Susceptibility/Ripple Rejectionu Headroomu Voltage RegulationStress & De-Rating Analysisu Nominalu Worst Caseu Transientu TOR, EEE-Inst-002 Compliant

Power Supply AnalysisnWorst Case Analysisu Stabilityu Conducted Susceptibilityu Input Conducted Emissionsu Output Rippleu Switching Frequencyu Efficiencyu Voltage Regulationu Output Over Voltage Failure / Protectionu Transient Load Step Responseu Gate Drive Analysisu Magnetics Characteristicsu Filter Analysis – Damping, Impedance, Q, and Stabilityu Primary Over-current Trip ThresholduuuuShort- CircuitIsolation Resistance and CapacitanceInrush & OutrushTurn on Overshoot/Turn off

Power Supply AnalysisnStress & De-Rating Analysisu Nominalu Worst Caseu Transient

Power ProductsNew Releases

RH3080MKDICE

RH1573KDICE

Power ProductsIn Development

RH1959 - Step-Down Switching Regulator

Pulsed-Laser Test of MSK5058RH (RH3480MILDICE)Dakai Chen & Ted Wilcox, GSFC, Aug’11

SEE Test of LT3480

Pulsed-Laser Test of MSK5059RH (RH1959MILDICE)Dakai Chen & Ted Wilcox, GSFC, Aug’11

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Enhanced Low Dose Radiation SensitivityProducts & Lots Characterized

• No ELDRS found per TM1019.7 para. 3.13.1.1 for the devices tested, applying the test methodformula to every parameter tested: [Cond D delta / Cond A delta] < 1.5

Questions & Answers SessionRafi AlbarianManager, Space & Harsh Environment Products