13.07.2015 Views

ARL QUANT'X Energy-Dispersive XRF Spectrometer - MAXLab

ARL QUANT'X Energy-Dispersive XRF Spectrometer - MAXLab

ARL QUANT'X Energy-Dispersive XRF Spectrometer - MAXLab

SHOW MORE
SHOW LESS
  • No tags were found...

Create successful ePaper yourself

Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.

<strong>ARL</strong> QUANT’XED<strong>XRF</strong> <strong>Spectrometer</strong>Exclusive Technology for the Digital AgeAfter 20+ years and 3 generations of technical innovation, the Peltier-cooled Si(Li) detector (PCD) at the heart ofthe <strong>ARL</strong> QUANT’X has yet to find its equal in performance or convenience. Only the Silicon Lithium-drifted [Si(Li)]crystal inside the PCD is sensitive to X-rays from every element across the periodic table, including high-energyphotons from elements such as Mo, Ag and Cd that slice through thinner crystals like a knife through butter. Theproven reliability of Peltier-cooling provides the energy resolution of conventional liquid nitrogen detectors withoutthe hassle of liquid nitrogen. With the <strong>ARL</strong> QUANT’X, you can keep your cool and focus on the analysis.Turn up the powerThanks to an on-board Pentium chip withexclusive Digital Pulse Processing (DPP)technology, the <strong>ARL</strong> QUANT’X can recordX-rays many times faster than conventionalanalog circuitry still prevalent ininstrumentation. The best peak separationfor any analysis can be selected with onesimple software setting. Take fulladvantage of the close-coupled geometryand 50W air-cooled X-ray tube to completeeven the most complicated measurementsin a few minutes or less.Robust and maintenance-freeAdvanced technology doesn’t have to becomplicated. In fact, with the Self-InstallationGuide, installing the <strong>ARL</strong> QUANT’X is as easyas setting up a personal computer. With onlyone moving part inside the sample chamberand no external hardware controls, thepossibility of mechanical problems is minimal.Careful attention to detail ensures that heatdissipation and air circulation are minimized,while replaceable filters on all vents protectthe instrument in dusty environments. A selftestand auto-tuning are some of the manydiagnostic tools intended to catch problemsbefore they affect the results.High performance wherever it'sneededAdvanced technology doesn’t have to bebulky. The world’s only ED<strong>XRF</strong> system tobreak the 1 nanogram detection barrier can fiton any lab counter and is equally at home insteel plants, high-throughput environmentalmonitoring laboratories or demandingcleanroom environments where space andutilities are at a premium. The optionalintegrated laptop computer further reducesthe space requirements and makes theinstrument completely self-contained andtruly mobile.Future-proof technologyWith ethernet technology on the inside and tothe outside, the <strong>ARL</strong> QUANT’X does notrequire proprietary and finicky interfaceboards or multiple serial cables. Ethernetcommunication ensures long-termcompatibility with ever-changing hardwareand software architecture.5-minute analysis of anair filter from the US EPATiCrNiCuSeBrPb5.6 ng/cm26.1 ng/cm21.9 ng/cm215.0 ng/cm29.4 ng/cm224.0 ng/cm237.6 ng/cm2


<strong>ARL</strong> QUANT’XED<strong>XRF</strong> <strong>Spectrometer</strong>Unlimited Performance and Ease of Use CombinedWinTrace software for the <strong>ARL</strong> QUANT’X opens the door to the limitless inherent flexibility of ED<strong>XRF</strong>,drawing on advanced algorithms and practices perfected through decades of research and fieldexperience. For applications from ambient air filters to complex geological materials, you can specifyany number of analytes, choose from seven analytical algorithms and use as many or as few calibrationstandards as necessary.IntuitiveSelect elements by clicking on a periodic table. Quickly buildcustomized methods using templates for many commonapplications. And let automatic current adjustment generate theoptimal excitation for any sample.FlexibleAccurate extraction of peak intensities from the spectra is a criticalstep for any quantitative analysis. Rely on automatic settings to get thejob done, or easily optimize them for the most difficult applications.PowerfulThe comprehensive Fundamental Parameters algorithms for the <strong>ARL</strong><strong>QUANT'X</strong> are the closest that practice ever came to theory. Theindustry's most powerful standardless and semi-standardlessanalysis, together with the ability to account for variablestoichiometry, unmeasured components and sample thickness, arejust some of the features that extend the analytical realm of ED<strong>XRF</strong>.CustomizableSimplify and organize the operator desktop environment withshortcuts that take the user directly to key analytical tasks.SecurePassword-protection in all critical areas of the software assures thesecurity of important data and methods. Operators are only allowedto specify sample names and positions.3-minute analysis ofplastic beads for RoHScertificationCrCuZnPbBrCdBa18 ppm22 ppm4 ppm23 ppm200 ppm18 ppm400 ppm


Application-Specific ConfigurationsThe <strong>ARL</strong> QUANT’X is designed to analyze any material straight out of the box. However, manyapplications are best performed with optional components for maximum accuracy and productivity.In addition, any configuration can be further customized to match your exact needs.APPLICATION TYPICAL ANALYTES SAMPLE HANDLER CHAMBER ENVIRONMENT SOFTWARE OPTIONAerosol Particulate Filters 48+ elements 10-position sample tray Vacuum and Helium flush FP Thickness analysis modulewith sample spinnerRoHS and WEEE Cr, Pb, Cd, Hg, Br 10-position sample tray Air StandardForensics Na-U Extended chamber with Vacuum and Helium flush Standardsingle-sample holderSteel Slags Mg-Fe 10-position sample tray Vacuum StandardMagnetic Media Ti, Cr, Co, R-Theta stage for hard disks Air Magnetic Media Analyzer moduleNi, W, RuSemiconductors Ti, Ni, Cu, Ge, Y-Theta stage for wafers Air FP Thickness analysis moduleZr, Pd, Au, PbNutritional Supplements Mg, Cr, Zn, Se 20-position sample tray Vacuum StandardCoating Thickness Ti, Cr, Fe, Ni, Single-sample holder Air FP Thickness analysis moduleCu, Zn


X-ray Elemental Analysis Capabilitiesfrom ThermoIn addition to these offices, ThermoElectron Corporation maintains anetwork of representative organizationsthroughout the world.X-ray spectrometry is a common and very powerful technique for fast, non-destructive,quantitative analysis of major, minor and trace components in all types of materials,including solids, powders, aqueous or organic solutions, and layered structures. It hasnumerous applications in every industry: pharmaceuticals, environmental monitoring,metals, cement, electronics, and mining, just to name a few.Thermo Electron Corporation provides a full range of X-ray fluorescence and X-ray diffraction instrumentation(ED<strong>XRF</strong>, WD<strong>XRF</strong>, XRD, EDS, ESCA) that cover every aspect of X-ray spectrometry from routine to highly specializedresearch applications. From the versatile <strong>ARL</strong> QUANT’X to the ultra-precise <strong>ARL</strong> 9900, each instrument combinesleading-edge technology with a long history of quality, durability and exceptional analytical performance.Australia+61 2 8844 9500 • analyze.au@thermo.comAustria+43 1 333 50340 • analyze.at@thermo.comBelgium+32 2 482 30 30 • analyze.be@thermo.comCanada+1 800 532 4752 • analyze.ca@thermo.comChina+86 10 5850 3588 • analyze.cn@thermo.comFrance+33 1 60 92 48 00 • analyze.fr@thermo.comGermany+49 6103 4080 • analyze.de@thermo.comIndia+91 22 2778 1101 • analyze.in@thermo.comItaly+39 02 950 591 • analyze.it@thermo.comJapan+81 45 453 9100 • analyze.jp@thermo.comNetherlands+31 76 587 98 88 • analyze.nl@thermo.comNordic+46 8 556 468 00 • analyze.se@thermo.comSouth Africa+27 11 570 1840 • analyze.sa@thermo.comSpain+34 91 657 4930 • analyze.es@thermo.comSwitzerland+41 21 694 71 11 • analyze.ch@thermo.comUK+44 1442 233555 • analyze.uk@thermo.comUSA+1 800 532 4752 • analyze.us@thermo.com<strong>ARL</strong> OPTIM'X compact <strong>XRF</strong><strong>ARL</strong> ADVANT'X sequential <strong>XRF</strong> serieswww.thermo.comThermo Electron Scientific Instruments Corporation,Madison, WI USA is ISO Certified.©2005 Thermo Electron Corporation. All rights reserved.Windows is a trademark of Microsoft corp. All othertrademarks are the property of Thermo ElectronCorporation and its subsidiaries.Specifications, terms and pricing are subject to change.Not all products are available in all countries. Pleaseconsult your local sales representative for details.BR41138_E 03/05C<strong>ARL</strong> X'TRA powder diffractometer<strong>ARL</strong> 9900 integrated <strong>XRF</strong>/XRD

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!