gtl5050 gtl 5050 probing system - GigaTest Labs

GTL5050
GTL 5050 PROBING SYSTEM
P R O B I N G P L A T F O R M
BGAEmulation MICRO CCD CAMERA 3D PROBING REMOTE POSITIONER CONTROL
Boards
VIA Arrays
For complex SI characterization challenges, it’s everything you need to know.
Backplanes
GIGATEST LABS GTL 5050
• R O TAT I N G
P L AT F O R M •
PCB Test Boards

If you’re relying on vertical side-to-side probing for
two-sided structures, you haven’t seen anything yet.
Until now, if you’ve had the need to measure
signal paths from opposite sides of a test board,
you haven’t had a lot of options. Now you do.
If you’re like most engineers, you
have relied on mounting test devices
securely in the vertical plane and
probing from opposite sides of
the structure. And then hoped for
accurate, meaningful results.
An imprecise process, probing this way
required you to rotate the microscope
from side to side, severly limiting your
ability to view and place the probes
GTL 5050 System is designed for
simultaneous probing on opposite
sides of a PCB. It allows you to
measure transmission paths between
line-cards when mounted directly
to the backplane.
GIGATEST LABS GTL 5050
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accurately. A slight misalignment of
the probe or movement of the board
would increase the likelihood of
measurement errors, requiring you
to repear the entire process.
In addition, measuring line-cards and
back planes separately then combining
the resulting data matracies mathmatically
to create the combined transmission
path is far less than ideal for
end-to-end characterization, particularly
at data rates greater than 2.5 Gbps.
MEASURING SUCCESS ON
A RANGE OF STRUCTURES
In order to achieve successful SI
measurements, you need the ability
to probe test structures of multiple
The GTL 5050 System’s rotating platform offers unprecedented visibility and access to both sides of a PCB.
sizes, from packages to emulation
boards. On many test structures,
such as BGA packages and emulation
boards, in which the signal path
traverses from one side of the board
to the other, you must have the
ability to probe sides simultaneously.
You also need the ability to test linecard
to line-card when they’re attached
to the main backplane. And you need
the ability to place the probes and
control their travel, precisely.
THE GTL 5050 SYSTEM:
THE RESULT OF 20 YEARS
OF TESTING
The GTL 5050 System was designed
from the ground up by SI professionals
with decades of experience working to
solve complex test and measurement
challenges, like yours.
The GTL 5050 is the first system that
lets you probe a wide variety of threedimensional
and two-sided structures.

You can now simultaneously probe
multiple-board interconnects, BGA
packages, test sockets, contactors,
PCB test boards, via arrays, emulation
boards, and backplanes. The GTL
5050 gives you unprecedented
control and visual access to your
structure, thus improving accuracy
in the testing process.
Unlike other lab bench SI probing
solutions, the GTL 5050 uses a rotating
platform that is mounted on a rigid
steel pedestal base. The test structure
is securely fixed on the rotating
platform, allowing you to perform
probing on each side of the board,
with amplroom for multiple positioners.
Q.
HOW IS THE GTL 5050
SYSTEM DIFFERENT?
• The GTL 5050 is the first system
of its type with a large rotating
platform that lets you probe
two sides simultaneously and
get accurate top-to-bottom
measurements.
• With a two-line-card-backplane
configuration, the GTL 5050
system can test the full signal
path in one measurement.
• Its remote positioners include
CCD/optics for precise viewing
and probe placement on the
bottom side.
A.
• The model GTL 5050 can
accommodate a wide range
of test structures, from
extremely small BGA sockets
up to test boards as large as
30”x20” in size.
Probe placement on the board bottom-side
is accomplished with Gigatest
Labs’ unique joystick-controlled remote
positioners and integrated CCD optics.
These innovations enable precise
placement of the probes on the
bottom side test vias.
A REVOLUTIONARY PLATFORM
The GTL 5050 System dramatically
improves your ability to accurately
probe test structures, particularly
those requiring top-bottom or
multi-level access.
GTL 50| 50 ROTATING PLATFORM
Top Surface View
Bottom Surface View
Remote-positioner with integrated CCD optics.
COMPLETE VISIBILITY AND CONTROL
The GTL 5050 System’s unique joystick
controlled remote positioners
enable a new level of precision in the
placement and control of probes. Its
innovative micro-CCD camera option
provides access to hard-to-view places,
Locking platens ensure stability.
with visual access and probe placement
in limited space, which is a particular
challenge with line-card to line-card
measurements. The system also
features free-motion arm-mounted
stereozoom optics to make it easy to
view top-side test sites and vias, as well
as probes.
THE FLEXIBILITY TO ACCOMMODATE
YOUR UNIQUE PROJECT
The GTL 5050 system can accommodate
a wide range of test structures.
Its sliding platens, which incorporate
precision linear motion bearings, offer
easy adjustment to accommodate test
samples ranging from small packages
up to large emulation boards. To
ensure rigidity and stability during the
probing process, the platens lock
securely. The system can accommodate
eight or more positioners for complex
aggressor/victim measurements.
Typical line-card to line-card probing configuration.

GTL5050
GTL 5050 PROBING SYSTEM
P R O B I N G P L A T F O R M
Everything you need to know for complex SI characterization
Founded in 1989, GigaTest Labs specializes in measurement and model development of high speed
digital interconnects and develops high-performance measurement tools to accomplish these complex
engineering tasks. GigaTest Labs staff includes some of the most respected professionals in the signal
integrity industry.
TO LEARN MORE ABOUT THE UNIQUE ADVANTAGES OF THE
GTL5050 SYSTEM, CALL OR WRITE TODAY.
Harry Christie, VP Sales
408.524.2700 | harry@gigatest.com
GigaTest Labs, Inc., 760 Palomar Avenue, Sunnyvale, CA 94085
TEL: 408.524.2700 | FAX: 408.524.2777 | www.gigatest.com
Data is subject to change. © 2007 GigaTest Labs, Inc. All rights reserved. 10/07 GTL