Technical Note 79_17 - EISCAT

- 42 -Te s t - c onn c c t i o n s used :The l o g i c ana Ly zer is connec t.ed t o the data-chan ne l s o naccumu La t o r c a r d LC2 (front-pane l flat-cable connecto r s )I t is re c o~ne n d e d t h a t the a na l y ze r clock - b i t s are c onnectedt o the memo r y - wr i t e signal t o t he result- me mor y (terminals2A12 o n memor y cards ) a nd t he d i g i t a l s cap e is t rigged o nhig h-to-low t r ans i t i o n of the c loc k- sig na l . The testing mustb e p e r f orme d in t wo steps . ( Na t e that when perf orming thist e st , t he cor re La t.or- memory c a r d should b e disconnected , d uet o noise inje cti o n on t h e p ower l i ne s ) .TESTP ROGRAM 1 : ACCUMULAT I ON \H TII - l 2 3 2 T IM ER ( SU BROUT INE 1)Prog r aml i s t i ng :F I:I l/:> F' ,;h JO ::; I I.:UI,l' l i) N!J. ft[F fW::nilEn- I./ le'O.,)0 10 7I i ld!l. cunr CU!lL B COf !F" -tl A D[lF~ . LClV', O',.' O-l öo Ol,) Oe) 1 0 00 0. 1' 00 10 0 0 O70 00 0 4 00 2' \" '.'" 10 oo 171 ,:·0 (':~ 00 17~' 0 0 O~ 0 0 O14 00 0 3 0 0 Otl CC lJH1 11 t lTl Hi TN ~ ) IF