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Constant Envelope OFDM Phase Modulation - Dr. James R. Zeidler

Constant Envelope OFDM Phase Modulation - Dr. James R. Zeidler

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VITADecember 22, 1976Born, Mesa, Arizona1997–1998 Associate EngineerInter-Tel, Chandler, ArizonaSummer 1998Summer InternshipLos Alamos National LaboratoryLos Alamos, New Mexico1999 BSc in Electrical EngineeringArizona State University, Tempe, ArizonaSummer 2001Summer InternshipSPAWAR Systems Center, San Diego, California2001 MSc in Electrical EngineeringUniversity of California at San Diego, La Jolla, California2001–2005 Research AssistantCenter for Wireless CommunicationsUniversity of California at San Diego, La Jolla, CaliforniaSummer 2004Summer InternshipSPAWAR Systems Center, San Diego, California2005 PhD in Electrical EngineeringUniversity of California at San Diego, La Jolla, CaliforniaPUBLICATIONSS. C. Thompson, J. G. Proakis, and J. R. <strong>Zeidler</strong>, “<strong>Constant</strong> <strong>Envelope</strong> Binary <strong>OFDM</strong><strong>Phase</strong> <strong>Modulation</strong>,” in Proc. IEEE Milcom, vol. 1, Boston, Oct. 2003, pp. 621–626.S. C. Thompson, A. U. Ahmed, J. G. Proakis, and J. R. <strong>Zeidler</strong>, “<strong>Constant</strong> <strong>Envelope</strong><strong>OFDM</strong> <strong>Phase</strong> <strong>Modulation</strong>: Spectral Containment, Signal Space Properties and Performance,”in Proc. IEEE Milcom, vol. 2, Monterey, Oct. 2004, pp. 1129–1135.S. C. Thompson, A. U. Ahmed, J. G. Proakis, and J. R. <strong>Zeidler</strong>, “<strong>Constant</strong> <strong>Envelope</strong><strong>OFDM</strong> <strong>Phase</strong> <strong>Modulation</strong>,” submitted to IEEE Transactions on Communications.S. C. Thompson, J. G. Proakis, and J. R. <strong>Zeidler</strong>, “Noncoherent Reception of <strong>Constant</strong><strong>Envelope</strong> <strong>OFDM</strong> in Flat Fading Channels,” in Proc. IEEE PIMRC, Berlin, Sept. 2005.S. C. Thompson, J. G. Proakis, and J. R. <strong>Zeidler</strong>, “The Effectiveness of Signal Clippingfor PAPR Reduction and Total Degradation in <strong>OFDM</strong> Systems,” in Proc. IEEEGlobecom, St. Louis, Dec. 2005.xiv

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