Curriculum Vitae T.Prohaska I - Department für Chemie - Boku

Curriculum Vitae T.Prohaska
Education
03/2002 Habilitation (venia docendi) in Analytical Chemistry, BOKU Vienna
12/1994 Doctoral Examination: „Doktor der technischen Wissenschaften
(Dr. techn.)“, Degree Summa cum Laude.
12/1992 – 05/1995 Doctoral Thesis at the Institute of Analytical Chemistry: „Investigation of Surface
Reactions by Scanning Probe Microscopy“;
supervision: Prof. Dr. Manfred Grasserbauer, Univ.Ass. Dr. Gernot Friedbacher.
11/1992: University Diploma in Technical Chemistry at the Vienna
University of Technology, Degree Summa cum Laude.
03/1992 – 10/1992 Diploma-thesis at the Institute of Analytical Chemistry: ‘In-situ Investigations of
Surface Reactions on Alkali Halides by Atomic Force Microscopy (AFM)’.
supervision: Prof. Dr. Manfred Grasserbauer, Univ.Ass. Dr. Gernot Friedbacher.
04/1987-11/1992 Study of Technical Chemistry at the Vienna University of
Technology.
07/1986 School Leaving Examination (Abitur), Summa cum Laude.
Research abroad
01/1999 – 12/2000 EC research fellow (Marie Curie Stipendium) am European Commission
Research Centre (IRMM) Geel/Belgien, Isotope Measurement Unit (M.
Grasserbauer, P. Taylor)
Reference measurements by IDMS, setup of a multicollector ICP-MS.
06/1996 – 08/1996 Research work at the Muroran Institute of Technology Muroran/Japan,
Department of Mechanical Engineering, (Prof. Dr. H. Shirahata)
Rare earth element analysis by ICP-MS under cleanroom conditions.
07/1994 – 08/1994 Research work at the UNICAMP Campinas/Brasilien Department of
Semiconductor and Photonics (Prof.Dr. V.Baranauskas)
Diamand film deposition on silicon and porous silicon analysis by AFM and STM.
09/1993 Research work at the University of Technology Espoo/Finland, Department of
Chemical Engineering and Laboratory of Inorganic and Analytical Chemistry
(Prof.Dr. L.Niinistö)
Thin film deposition by ALE and SILAR.
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