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Wafer Inspection Equipment Market

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competition has led to increased demands for better quality and least defects in the<br />

semiconductor devices. Moreover, increasing demands for high performance chips for mission<br />

critical applications in industries and R&D activities will present considerable growth<br />

opportunities for the wafer inspection equipment market through the forecast period.<br />

IoT, and digitization are the major trends expected to transform the globe, which would require<br />

semiconductor technologies as the basis of their framework. Smart connected TVs, vehicle<br />

automation, kitchen automation, smart city, smart grids, are among the many such IoT concepts<br />

that are expected to gain traction over the next few years. This will increase demand for the<br />

electronic product manufacturing, which will in turn fuel the wafer inspection equipment<br />

market growth.<br />

<strong>Wafer</strong> <strong>Inspection</strong> <strong>Equipment</strong> <strong>Market</strong> Taxonomy<br />

On the basis of technology, the global wafer inspection equipment market is classified into:<br />

<br />

<br />

E-beam<br />

Optical<br />

On the basis of wafer type, the global wafer inspection equipment market is classified into:<br />

<br />

<br />

Unpatterned wafer<br />

Patterned wafer<br />

On the basis of end user, the global wafer inspection equipment market is classified into:<br />

<br />

<br />

<br />

Integrated device manufacturers<br />

Memory manufacturers<br />

Foundries<br />

Read more on research study @<br />

https://www.coherentmarketinsights.com/ongoing-insight/wafer-inspection-equipment-market-637<br />

Advent of 3D finFETs, NAND and advanced DRAMs technologies are expected to present<br />

considerable growth challenge to the industry growth<br />

Optical and E-beam are complementary technologies that perform distinct operations in the<br />

workflow. optical has fast throughputs and finds great applications in the end use. On the other<br />

hand E-beam helps in detection of smallest defects, however the throughputs are low. Owing

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