full program - Denver X-ray Conference
full program - Denver X-ray Conference
full program - Denver X-ray Conference
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XRD POSTER SESSION MONDAY, 6 AUGUST<br />
D-44 A Theoretical Study of X-<strong>ray</strong> Diffraction from Nanomaterials<br />
H. Öztürk, I.C.Noyan, Columbia University, New York, NY, USA<br />
Hanfei Yan, Brookhaven National Laboratory, Upton, NY, USA<br />
D-52 X-<strong>ray</strong> Analysis of Coal Fly Ash<br />
J.P. Nicolich, D.A. Silva, W.R. Grace, Cambridge, MA, USA<br />
S. Cole-Wilson, W.R. Grace, Columbia, MD, USA<br />
D-56 NIST Standard Reference Materials for X-<strong>ray</strong> Metrology<br />
J.P. Cline, D. Windover, A. Henins, NIST, Gaithersburg, MD, USA<br />
D-58 Efficient and Accurate Measurement of Very Sharp Crystallographic Textures:<br />
A New Measurement Strategy<br />
F. Bachmann, T.Q. Nguyen, H. Schaeben, Institut fuer Geophysik und Geoinformatik, TU Bergakademie Freiberg,<br />
Germany<br />
M. Witte, G. Gottstein, Institut fuer Metallkunde und Metallpyhsik, RWTH Aachen, Germany<br />
D-59 Thickness Dependence of the Hydrophilic-Hydrophobic Switching Function of<br />
Methylcellulose Thin Films: An X-<strong>ray</strong> Reflectivity Study<br />
V.A. Innis-Samson, K. Sakurai, National Institute for Materials Science, Tsukuba, Ibaraki, Japan<br />
D-61 Structure Analysis of Divalent Doped Manganites<br />
WITHDRAWN<br />
I. Mansuri, D. Varshney, M.W. Shaikh, School of Physics, Vigyan Bhavan, Devi Ahilya University, Indore, India<br />
I. Mansuri, D. Prasad, Department of Physics, Shri Venkateshwar Institute of Technology, Indore, India<br />
D-63 Structural Study of Yttrium Substituted GdCu 2<br />
D. Prasad, K.K. Choudhary, Shri Vaishnav Institute of Technology and Science, Indore, India<br />
D. Prasad, I. Mansuri, Shri Venkteshwar Institute of Technology, Indore, India<br />
D-71 Characterization of X-<strong>ray</strong> Irradiated Graphene Oxide Coatings Using X-<strong>ray</strong><br />
Diffraction, X-<strong>ray</strong> Photoelectron Spectroscopy, and Atomic Force Microscopy<br />
T. Blanton, D. Majumdar, S. Brandt, J. Fornalik, Eastman Kodak Company, Corporate Research and Engineering,<br />
Rochester, NY, USA<br />
D-72 Structural Analysis and Photocatalytic Properties in 3-layer Aurivillius Oxides<br />
J. Shi, Alfred, E.J. Nichols, J. Liu, V. Blair, S. Misture, Alfred University, Alfred, NY, USA<br />
D-77 Evaluation of Lithium Ion Battery by XRD Analysis<br />
Y. Shiramata, T. Konya, W. Yashiro, A. Nakano, Application Laboratories X-<strong>ray</strong> Research Laboratory<br />
D-78 Characterization of Greigite Mineral by XRD and SEM/EDS Analyses in Pleistocene and<br />
Pliocene Sediments from Black Sea-Turkey<br />
A. Aktosun, Turkish Petroleum Corporation, Research Center, Ankara, Turkey<br />
WITHDRAWN<br />
D-79 X-<strong>ray</strong> Diffraction Analysis of the Dislocation Structure of Cu-Nb Interfaces<br />
G. Csiszar, T. Ungar, Materials Physics Department, Eotvos University Budapest, Hungary<br />
A. Misra, D.W. Brown, Center for Integrated Nanotechnologies, Materials Physics and Applications Div., Alamos National<br />
Lab, Los Alamos, NM, USA<br />
Post Deadline<br />
D-80 Structural and Conductivity Studies of LA0.95SR0.05GAO2.975 Gallate<br />
K. Sood, K. Singh, O.P. Pandey, School of Physics and Materials Science, Thapar University, Patiala, India<br />
D-81 Thermal Scanning with Neutron Diffraction<br />
S. Lee, I.C. Noyan, Columbia University, New York, NY, USA<br />
X. Wang, K. An, A.D. Stocia, H. Skorpenske, Oak Ridge National Laboratory, Oak Ridge, TN, USA<br />
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