Andrey Chuvilin

More documents

Recommendations

Info

$(Microsoft PowerPoint - \325\302 ... - elch.chem.msu.ru$

0.135nm 0.109nm 0.09nm Si 4H-SiC Si 3 N 4
• instrumental resolution increase • possibility to decrease HT • contrast increase • dose decrease HT [kV] [nm] d o [nm] 1500 0.0006 0.084 400 0.0016 0.171 300 0.0020 0.196 200 0.0025 0.235 100 0.0037 0.315 80 0.0042 0.345 60 0.0049 0.387 40 0.0060 0.454 20 0.0086 0.592 0.05 0.1
Page 5: • Factors limiting resolution in
Page 10 and 11: Cs=0
Page 13 and 14: Typical values: C s = 0.5 - 2.5 mm
Page 15 and 16: I 2 d I 1
Page 17 and 18: • ionisation
Page 19 and 20: • ionisation • heating • knoc
Page 23 and 24: Aberrations of round static space-c
Page 25: S B
Page 32: A. Chuvilin, A. Khlobystov, D. Ober
Page 35: A. Chuvilin, J.C. Meyer, G. Algara-
Page 39 and 40: M.C. Gimenez-Lopez, A. Chuvilin, U.
Page 41 and 42: Self-assembly of a sulphur-terminat
Page 43 and 44: J.Leschner, J.Biskupek, A.Chuvilin,
Page 45: Dr. Dirk Obergfell Dr. Siegmar Roth

Andrey Chuvilin

Create successful ePaper yourself

Delete template?

Save as template?