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<strong>Medical</strong> Device Materials V<br />

Proceed<strong>in</strong>gs from the Materials & Processes for <strong>Medical</strong> Devices Conference 2009<br />

August 10–12, 2009, M<strong>in</strong>neapolis, M<strong>in</strong>nesota, USA, J. Gilbert, Ed., p 41-45<br />

<strong>Ultrasonic</strong> <strong>Clean<strong>in</strong>g</strong>-<strong>Induced</strong> <strong>Failures</strong> <strong>in</strong> <strong>Medical</strong> Devices<br />

B.A. James, C. McVeigh, S.N. Rosenbloom, E. P. Guyer, S.I. Lieberman<br />

Exponent Failure Analysis Associates, Menlo Park, CA, USA<br />

Abstract<br />

<strong>Ultrasonic</strong> clean<strong>in</strong>g is often used as part of the manufactur<strong>in</strong>g<br />

process of small medical devices such as guide wires and<br />

vascular implants. <strong>Ultrasonic</strong> clean<strong>in</strong>g at frequencies close to<br />

the natural frequency of the device can result <strong>in</strong> resonance,<br />

result<strong>in</strong>g <strong>in</strong> significant mechanical damage and possibly<br />

premature failure. This paper provides case studies of<br />

ultrasonic clean<strong>in</strong>g-<strong>in</strong>duced fatigue and correspond<strong>in</strong>g failures<br />

<strong>in</strong> small medical devices. Preventative measures, <strong>in</strong>clud<strong>in</strong>g<br />

analytical tools such as f<strong>in</strong>ite element analysis (FEA), to<br />

ensure that ultrasonic clean<strong>in</strong>g frequencies do not result <strong>in</strong><br />

resonance and stresses sufficient to cause fatigue damage are<br />

also discussed.<br />

Background<br />

<strong>Ultrasonic</strong> clean<strong>in</strong>g has been known for years to have the<br />

potential to <strong>in</strong>duce harmonic oscillation and correspond<strong>in</strong>g<br />

fatigue damage <strong>in</strong> small structures used <strong>in</strong> the electronics<br />

<strong>in</strong>dustry 1, 2 . However, only limited, anecdotal evidence has<br />

been provided for ultrasonic clean<strong>in</strong>g-<strong>in</strong>duced fatigue <strong>in</strong> small<br />

medical devices 3 . While the dangers of ultrasonic clean<strong>in</strong>g<br />

may be well known with<strong>in</strong> specific medical device companies,<br />

judg<strong>in</strong>g by the number of problems observed by the authors,<br />

this issue does not appear to be common knowledge across the<br />

entire medical device <strong>in</strong>dustry.<br />

The natural frequency of a given structure is a function of its<br />

elastic moduli, geometry, and mass. Vibration amplitudes<br />

<strong>in</strong>crease dramatically as the frequency of an impressed force<br />

approaches the natural frequency of the structure 4<br />

. A<br />

condition of resonance occurs when the impressed force<br />

frequency equals a structure’s natural frequency. At and near<br />

resonance, relatively small energy <strong>in</strong>put can result <strong>in</strong> large<br />

vibration amplitudes. These large deflection amplitudes at<br />

near-resonance conditions can result <strong>in</strong> fatigue crack <strong>in</strong>itiation<br />

and growth.<br />

Case Study 1 – 316L Sta<strong>in</strong>less Steel Stent<br />

A medical device manufacturer noted occasional strut<br />

fractures dur<strong>in</strong>g balloon expansion tests associated with the<br />

validation of a new stent geometry. These stents had been<br />

subjected to typical manufactur<strong>in</strong>g processes, <strong>in</strong>clud<strong>in</strong>g<br />

ultrasonic clean<strong>in</strong>g for several m<strong>in</strong>utes. Scann<strong>in</strong>g electron<br />

41<br />

Copyright © 2010 <strong>ASM</strong> <strong>International</strong>®<br />

All rights reserved<br />

www.asm<strong>in</strong>ternational.org<br />

microscopy (SEM) exam<strong>in</strong>ation of the fracture surfaces<br />

clearly <strong>in</strong>dicated fatigue was the cause of the breaks, shown <strong>in</strong><br />

Figure 1 and Figure 2. The stents had not been subjected to<br />

any source of cyclic load<strong>in</strong>g other than ultrasonic clean<strong>in</strong>g.<br />

Stents that had not been subjected to balloon expansion were<br />

also exam<strong>in</strong>ed for any evidence of cracks. Several cracks<br />

were observed <strong>in</strong> these undeployed stents, an example of<br />

which is shown <strong>in</strong> Figure 3.<br />

Figure 1: Lower magnification SEM image of 316L stent<br />

fracture surface<br />

Figure 2: Higher magnification SEM image of 316L stent<br />

fracture surface.


Figure 3: SEM image of ultrasonic crack <strong>in</strong> stent, prior to<br />

deployment.<br />

Case Study 2 – Catheter Wire Fracture<br />

A catheter guide wire fractured dur<strong>in</strong>g service, break<strong>in</strong>g<br />

with<strong>in</strong> the patient. A non-destructive exam<strong>in</strong>ation of the<br />

fractured wire us<strong>in</strong>g SEM was conducted. Evidence<br />

preservation issues required that the guide wire fracture<br />

surface could not be cleaned prior to the SEM exam<strong>in</strong>ation.<br />

Clear evidence of fatigue crack <strong>in</strong>itiation and growth was<br />

observed between the debris on the wire fracture surface, as<br />

shown <strong>in</strong> Figure 4 and Figure 5.<br />

The subject guide wire had not know<strong>in</strong>gly been subjected to<br />

any cyclic load<strong>in</strong>g prior to service. However, the<br />

manufacturer did report that ultrasonic clean<strong>in</strong>g was used<br />

dur<strong>in</strong>g manufactur<strong>in</strong>g. Based on our analysis, it appears that<br />

ultrasonic clean<strong>in</strong>g was the only process that could produce<br />

the thousands of cycles needed to result <strong>in</strong> the observed<br />

fatigue crack <strong>in</strong>itiation and propagation.<br />

42<br />

Figure 4: SEM image of guide wire fracture surface. For<br />

evidence preservation, the fracture surface was not cleaned.<br />

Figure 5: Higher magnification SEM image of guide wire<br />

fracture show<strong>in</strong>g beach marks consistent with fatigue crack<br />

growth.<br />

Case Study 3 – Nit<strong>in</strong>ol Stent Fracture<br />

A nit<strong>in</strong>ol stent subjected to an un<strong>in</strong>tentionally long ultrasonic<br />

clean<strong>in</strong>g treatment fractured dur<strong>in</strong>g bend test<strong>in</strong>g. SEM<br />

analysis showed that striations were present on the fracture<br />

surface, <strong>in</strong>dicat<strong>in</strong>g that a fatigue crack preceded the overload<br />

fracture as shown <strong>in</strong> Figure 6 and Figure 7. Several other<br />

cracks were observed at multiple locations along the stent,<br />

shown <strong>in</strong> Figure 8.


Figure 6: SEM image of fractured nit<strong>in</strong>ol stent.<br />

Figure 7: SEM image of striations on fractured nit<strong>in</strong>ol stent.<br />

Figure 8: SEM image of cracks from other locations on the<br />

subject nit<strong>in</strong>ol stent.<br />

43<br />

F<strong>in</strong>ite Element Analysis<br />

FEA is a numerical analysis technique which is commonly<br />

used to compute stresses and stra<strong>in</strong>s aris<strong>in</strong>g <strong>in</strong> various<br />

structures as a function of the structure’s geometry, material<br />

constitutive response, applied loads, and boundary conditions.<br />

FEA can also be used to solve for the normal modes<br />

(eigenmodes) of an oscillat<strong>in</strong>g structure; i.e., the patterns of<br />

motion <strong>in</strong> which each part of the structure moves s<strong>in</strong>usoidally<br />

with the same frequency.<br />

The excitation frequencies associated with these normal<br />

modes are known as the natural or resonant frequencies of the<br />

structure. All physical structures have a set of normal modes<br />

(and associated resonant frequencies) that depend on the<br />

structural stiffness (mechanical properties and geometry),<br />

density, applied load<strong>in</strong>g (or existence of a residual or prestress),<br />

and boundary conditions.<br />

Although a structure may have normal modes spread over a<br />

wide frequency range, FEA mode extractions are used to scan<br />

an appropriate range of forc<strong>in</strong>g frequencies (e.g., the<br />

frequency of the ultrasonic cleaner). This is a useful exercise<br />

to determ<strong>in</strong>e if resonance is likely to occur at or near a<br />

proposed clean<strong>in</strong>g frequency. Alternatively, <strong>in</strong> the event that<br />

failure has already occurred, the extracted modes can be used<br />

to elucidate the cause of failure.<br />

Case Study 4 – FEA of Sta<strong>in</strong>less Steel Stent Failure<br />

A 316L sta<strong>in</strong>less steel stent (model shown <strong>in</strong> Figure 9)<br />

exhibited evidence of fatigue orig<strong>in</strong>at<strong>in</strong>g at the <strong>in</strong>trados of a<br />

crown-strut <strong>in</strong>terface after a crimp<strong>in</strong>g operation dur<strong>in</strong>g<br />

manufacture, as shown <strong>in</strong> Figure 10. Figure 11 is an SEM<br />

image of the fracture surface and revealed a fatigue-related<br />

failure. However, the source of the cyclic stress was unclear.<br />

It was noted that prior to crimp<strong>in</strong>g, an ultrasonic clean<strong>in</strong>g<br />

procedure had been employed. The ultrasonic cleaner was<br />

known to operate at approximately 140 kHz. An FEA<br />

eigenmode analysis was performed to extract all of the key<br />

resonant frequencies near 140 kHz; the associated modes are<br />

shown <strong>in</strong> Figure 12. The deformed shapes clearly show<br />

localized motion at the stent ends where failure was observed<br />

dur<strong>in</strong>g subsequent crimp<strong>in</strong>g. The natural mode which occurs<br />

at exactly 140 kHz is shown <strong>in</strong> Figure 13 <strong>in</strong> more detail. The<br />

displacement of the end crowns at this natural frequency<br />

would drive a significant cyclic stress amplitude <strong>in</strong> the failure<br />

region. This data <strong>in</strong>dicates that ultrasonic clean<strong>in</strong>g was the<br />

likely candidate for <strong>in</strong>itiat<strong>in</strong>g the fatigue crack which<br />

subsequently propagated and failed dur<strong>in</strong>g crimp<strong>in</strong>g.


Figure 9: F<strong>in</strong>ite Element model of subject sta<strong>in</strong>less steel stent.<br />

Figure 10: Fracture observed at crown-strut <strong>in</strong>terface.<br />

Figure 11: SEM of fracture surface <strong>in</strong> sta<strong>in</strong>less steel stent.<br />

44<br />

Figure 12: Shape assumed by stent when resonance occurs at<br />

a natural frequency of 139.6 kHz, 139.7 kHz, 140.0 kHz and<br />

140.5 kHz. At each frequency the maximum amplitude occurs<br />

at the end crowns (where failure was observed dur<strong>in</strong>g<br />

crimp<strong>in</strong>g).<br />

Figure 13: Close up of stent shape when resonance occurs at<br />

a natural frequency of 140.0 kHz.


Discussion<br />

<strong>Ultrasonic</strong> clean<strong>in</strong>g is a seem<strong>in</strong>gly benign process that is<br />

prevalent throughout the medical device <strong>in</strong>dustry. It has been<br />

demonstrated <strong>in</strong> this paper that ultrasonic clean<strong>in</strong>g can <strong>in</strong>duce<br />

significant damage to small medical devices subjected to this<br />

process. It is noted that any small device with a resonant<br />

frequency near that of the ultrasonic clean<strong>in</strong>g frequency is<br />

susceptible to this failure mechanism.<br />

The obvious concern is one of reliability. If small cracks are<br />

<strong>in</strong>duced <strong>in</strong> these devices, it is challeng<strong>in</strong>g at best to detect<br />

these defects unless the devices are subjected to stresses and<br />

thorough <strong>in</strong>spection prior to the f<strong>in</strong>al manufactur<strong>in</strong>g step. As<br />

a result, <strong>in</strong>cipient ultrasonic clean<strong>in</strong>g-<strong>in</strong>duced cracks can<br />

rema<strong>in</strong> undetected <strong>in</strong> f<strong>in</strong>ished devices. There are virtually no<br />

practical non-destructive techniques for detect<strong>in</strong>g m<strong>in</strong>ute<br />

cracks <strong>in</strong> small devices that can be used <strong>in</strong> a large<br />

manufactur<strong>in</strong>g process. However, FEA can be a useful tool <strong>in</strong><br />

characteriz<strong>in</strong>g the susceptibility of small-scale devices to<br />

ultrasonic-<strong>in</strong>duced fatigue. The example given here was<br />

performed after the failure, but this approach can be conducted<br />

as a proactive (rather than reactive) step to help mitigate<br />

possible failures.<br />

As stated above, the electronics manufactur<strong>in</strong>g <strong>in</strong>dustry has<br />

long recognized the potential harmful effects of ultrasonic<br />

clean<strong>in</strong>g-<strong>in</strong>duced fatigue on small parts. However, the ability<br />

to produce surfaces free of particulates and contam<strong>in</strong>ates is<br />

important to the electronics manufactur<strong>in</strong>g <strong>in</strong>dustry.<br />

Additionally, these large-scale electronics clean<strong>in</strong>g processes<br />

are also subjected to stricter environmental controls. Due to<br />

clean<strong>in</strong>g-<strong>in</strong>duced damage concerns, many electronics <strong>in</strong>dustry<br />

clean<strong>in</strong>g procedures do not utilize ultrasound. These clean<strong>in</strong>g<br />

procedures <strong>in</strong>clude overflow and cascad<strong>in</strong>g r<strong>in</strong>se-baths, as<br />

well as sp<strong>in</strong> and spray r<strong>in</strong>s<strong>in</strong>g 5<br />

. Any new clean<strong>in</strong>g process<br />

applied to small medical devices should be analyzed for each<br />

specific circumstance to ensure that it does not adversely<br />

affect the performance of the device.<br />

Conclusions<br />

The potential for ultrasonic clean<strong>in</strong>g to <strong>in</strong>duce harmonic<br />

oscillation and subsequent fatigue damage <strong>in</strong> small structures<br />

is an issue that is not yet common knowledge throughout the<br />

medical device <strong>in</strong>dustry. The problem has been wellestablished<br />

<strong>in</strong> the electronics <strong>in</strong>dustry, and has been proven to<br />

affect a variety of medical devices made from different alloys.<br />

FEA is capable of accurately predict<strong>in</strong>g the natural frequency<br />

of a device, allow<strong>in</strong>g a manufacturer to make process or even<br />

design changes that avoid resonant conditions that could lead<br />

to significant mechanical damage and premature failure.<br />

Alternative techniques that avoid ultrasonic-<strong>in</strong>duced damage<br />

have been used successfully <strong>in</strong> the electronics manufactur<strong>in</strong>g<br />

45<br />

<strong>in</strong>dustries, and could be employed <strong>in</strong> the medical device<br />

<strong>in</strong>dustry to avoid the problems associated with ultrasonic<br />

clean<strong>in</strong>g-<strong>in</strong>duced resonance and fatigue.<br />

References<br />

1 L.A. Mallette, I. Chen, T.W. Johnson, “A Case Study <strong>in</strong><br />

<strong>Ultrasonic</strong> <strong>Clean<strong>in</strong>g</strong> Damage”, Aerospace Conference, IEEE,<br />

Volume 3, Issue 21-28, 1998, pp. 77-80.<br />

2 J. Yuqi, T. Dong, S. Xianzhong, L. Fai, “The Effect of<br />

<strong>Ultrasonic</strong> <strong>Clean<strong>in</strong>g</strong> on the Bond Wires”, Proceed<strong>in</strong>gs of the<br />

12 th IPFA, 2005, S<strong>in</strong>gapore, IEEE, pp. 237-241.<br />

3 R.V. Marrey, R. Burgermeister, R.B. Grishaber, R.O.<br />

Ritchie, “Fatigue Life and Prediction for Cobalt-Chromium<br />

Stents: A Fracture Mechanics Analysis”, Biomaterials 27,<br />

2006, pp. 1988-2000.<br />

4 S. Timoshenko, D.H. Young, W. Weaver, Vibration<br />

Problems <strong>in</strong> Eng<strong>in</strong>eer<strong>in</strong>g, 4 th Edition, Wiley and Sons, 1974.<br />

5 Handbook of Silicon Wafer <strong>Clean<strong>in</strong>g</strong> Technology, 2 nd<br />

Edition, Editors K.A. Re<strong>in</strong>hardt, W. Kern, William Andrews<br />

Publish<strong>in</strong>g, 2008.


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