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JANUARY 11, 2005 U.S. PATENT AND TRADEMARK OFFICE TM 7<br />

CLASS 9—ELECTRICAL AND SCIENTIFIC<br />

APPARATUS<br />

<strong>FOR</strong> ELECTRICAL AND ELECTRONIC CONTROL,<br />

REGULATING, SWITCHING AND MONITORING DE-<br />

VICES, IN PARTICULAR <strong>FOR</strong> SERVO MOTORS,<br />

NAMELY, DIGITAL AND ELECTRONIC DRIVE AND<br />

CONTROL SYSTEMS <strong>FOR</strong> THE REGULATION AND<br />

OPERATION OF ELECTRIC MOTORS, COMPRISING<br />

ELECTRONIC DRIVE CONTROL UNITS, DIGITAL<br />

AND ANALOG INTERFACE MODULES, MOTORS, OP-<br />

ERATOR CONTROLS, SENSORS, AS WELL AS MEA-<br />

SURING SIGNAL AND CONTROL LINES, DIGITAL<br />

CONTROL AND DRIVE SYSTEM <strong>FOR</strong> POSITIONING<br />

SHAFTS IN THE FIELD OF AUTOMATION TECHNOL-<br />

OGY, ESSENTIALLY CONSISTING OF CONTROL<br />

UNITS COMPRISED OF COMPUTER HARDWARE<br />

AND SOFTWARE, ELECTRONIC DRIVE REGULATORS;<br />

SOFTWARE AND COMPUTER PROGRAMS <strong>FOR</strong> REG-<br />

ULATION AND OPERATION OF ELECTRIC MOTORS;<br />

SOFTWARE <strong>FOR</strong> SYNCHRONIZATION OF ELECTRIC<br />

MOTORS (U.S. CLS. 21, 23, 26, 36 AND 38).<br />

CLASS 42—SCIENTIFIC, COMPUTER AND<br />

LEGAL SERVICES<br />

<strong>FOR</strong> TECHNICAL PLANNING <strong>FOR</strong> OTHERS AND<br />

TECHNICAL CONSULTATION REGARDING THE USE<br />

AND OPERATION OF ELECTRIC MOTORS AND ELEC-<br />

TRICAL AND ELECTRONIC CONTROL, REGULATION,<br />

SWITCHING AND MONITORING DEVICES, IN PARTI-<br />

CULAR IN RESPECT TO HANDLING AND ASSEMBLY<br />

SYSTEMS, PACKAGING AND FOODSTUFF MACHIN-<br />

ERY, PRINTING AND PAPER PROCESSING MACHIN-<br />

ERY AND MACHINE TOOLS; DEVELOPMENT OF<br />

SOFTWARE <strong>FOR</strong> OTHERS <strong>FOR</strong> THE OPERATION OF<br />

DIGITAL AUTOMATION DEVICES (U.S. CLS. 100 AND<br />

101).<br />

MARY BOAGNI, EXAMINING ATTORNEY<br />

SN 76-271,868. TOKYO ELECTRON LIMITED, MINATO-KU,<br />

TOKYO 107, JAPAN, FILED 6-15-2001.<br />

PRIORITY CLAIMED UNDER SEC. 44(D) ON JAPAN<br />

APPLICATION NO. 2000-136000, FILED 12-18-2000, REG. NO.<br />

4569180, DATED 5-17-2002, EXPIRES 5-17-2012.<br />

NO CLAIM IS MADE TO THE EXCLUSIVE RIGHT TO<br />

USE "TECHNOLOGY", APART FROM THE MARK AS<br />

SHOWN.<br />

THE MARK CONSISTS OF CURVED LINES. THE THICK-<br />

EST LINE IS IN BLUE AND THE THINNER LINES ARE ALL<br />

IN GREEN. THE WORDING IS IN PURPLE.<br />

CLASS 7—MACHINERY<br />

<strong>FOR</strong> METAL WORKING MACHINES, NAMELY, LA-<br />

SER PROCESSING MACHINES, GRINDERS, ELECTRON<br />

BEAM PROCESSING MACHINES, LASER CUTTERS,<br />

ELECTRIC WELDING MACHINES; CHEMICAL PRO-<br />

CESSING MACHINES, NAMELY, GASIFIERS, SILICON<br />

WAFER CLEANING AND DRYING MACHINES, CHE-<br />

MICAL VAPOR DEPOSITION MACHINES <strong>FOR</strong> GENER-<br />

AL INDUSTRIAL USE; SEMICONDUCTOR<br />

MANUFACTURING, PROCESSING AND PRODUCTION<br />

MACHINES, NAMELY, SEMICONDUCTOR MANUFAC-<br />

TURING MACHINES, SEMICONDUCTOR WAFER PRO-<br />

CESSING MACHINES, SEMICONDUCTOR<br />

PRODUCTION MACHINES, ALL <strong>FOR</strong> THE PROCES-<br />

SING AND PRODUCTION OF SEMICONDUCTOR SUB-<br />

STRATES, THIN FILMS, SILICON DISCS AND WAFERS;<br />

LIQUID CRYSTAL DISPLAY MANUFACTURING, PRO-<br />

CESSING AND PRODUCTION MACHINES (U.S. CLS. 13,<br />

19, 21, 23, 31, 34 AND 35).<br />

CLASS 9—ELECTRICAL AND SCIENTIFIC<br />

APPARATUS<br />

<strong>FOR</strong> SEMICONDUCTOR TESTING MACHINES <strong>FOR</strong><br />

TESTING AND INSPECTING WAFERS AND INTE-<br />

GRATED CIRCUITS; SEMICONDUCTOR PROBE<br />

CARDS <strong>FOR</strong> TESTING INTEGRATED CIRCUITS; PHY-<br />

SICOCHEMICAL APPARATUS, NAMELY, GAS ANALY-<br />

SIS UNITS, AIR ANALYSIS UNITS; MEASURING<br />

APPARATUS, NAMELY, SURFACE ROUGHNESS TEST-<br />

ING MACHINES, GASOMETERS, WATER METERS,<br />

ACCELEROMETERS, PHOTOMETERS, ACTIN-<br />

OMETERS, REFRACTOMETERS, BAROMETERS, MAN-<br />

OMETERS, PRESSURE INDICATORS, PRESSURE<br />

MEASURING UNITS, CHEMICAL FLUID MEASURING<br />

CUPS, CALORIMETERS, FLOWMETERS, ANGLE<br />

GAUGES, CLINOMETERS, PRECISION INSTRUMENTS<br />

IN THE NATURE OF LENGTH GAUGES, VACUUM<br />

MEASURING SENSORS, FLATNESS TESTING MA-<br />

CHINES, AUTOMATIC HUMIDITY CONTROLLERS,<br />

AUTOMATIC PRESSURE CONTROLLERS, AUTOMATIC<br />

LIQUID LEVEL CONTROLLERS, AUTOMATIC FLUID<br />

FLOW CONTROLLERS, AUTOMATIC CALORIE CON-<br />

TROLLERS, THERMOSTATS, AUTOMATIC VACUUM<br />

CONTROLLERS, PROGRAM CONTROLLING MA-<br />

CHINES, NAMELY, EQUIPMENT CONTROLLER AND<br />

MACHINE CONTROLLER HAVING A PROGRAM <strong>FOR</strong><br />

CONTROLLING APPARATUSES <strong>FOR</strong> USE IN THE<br />

MANUFACTURE OF AND TESTING OF SEMICONDUC-<br />

TORS AND LIQUID CRYSTAL DISPLAYS; AERO-<br />

METERS, WATER LEVEL INDICATORS, SPIRIT<br />

LEVELS, SEISMOGRAPHS, FILM THICKNESS MEA-<br />

SURING UNITS, FILM INSPECTION UNITS; POWER<br />

DISTRIBUTION OR CONTROLLING APPARATUS,<br />

NAMELY, REACTORS, DISTRIBUTION BOXES, ELEC-<br />

TRIC RELAYS, DISTRIBUTOR BOXES, SWITCH-<br />

BOARDS, BRANCH BOXES, CELL SWITCHES,<br />

INVERTERS, TRANS<strong>FOR</strong>MERS, ELECTRIC SWITCHES,<br />

ELECTRIC RESISTANCES, ELECTRIC CONTACTS,<br />

CURRENT CONTROLLERS, WIRE CONNECTORS,<br />

FLASHERS, CIRCUIT BREAKERS, CONDENSERS,<br />

ELECTRICAL FUSES, ELECTRICAL CONTROLLERS<br />

<strong>FOR</strong> USE IN THE MANUFACTURE AND TESTING OF<br />

SEMICONDUCTORS AND LIQUID CRYSTAL DIS-<br />

PLAYS; OPTICAL INSTRUMENTS, NAMELY, OPTICAL<br />

LENSES, OPTICAL OBJECTIVE LENSES, CORRECTING<br />

LENSES, METALLURGICAL MICROSCOPES, SPECTRO-<br />

SCOPES, EYEPIECES, ZOOM MICROSCOPES, OPTICAL<br />

CONDENSERS, POLARIZING MICROSCOPES, PRISMS<br />

<strong>FOR</strong> SCIENTIFIC PURPOSES; TELECOMMUNICATION<br />

MACHINES, NAMELY, PRIORITY CONTROLLERS <strong>FOR</strong><br />

CONTROLLING SEMICONDUCTOR MANUFACTUR-<br />

ING SYSTEMS <strong>FOR</strong> USE IN THE MANUFACTURE OF<br />

AND TESTING OF SEMICONDUCTORS AND LIQUID<br />

CRYSTAL DISPLAYS AND TELEMETERING APPARA-<br />

TUS <strong>FOR</strong> USE IN THE MANUFACTURE AND TESTING<br />

OF SEMICONDUCTORS AND LIQUID CRYSTAL DIS-<br />

PLAYS, HIGH-FREQUENCY APPARATUS <strong>FOR</strong> USE IN<br />

THE MANUFACTURE AND TESTING OF SEMICON-<br />

DUCTORS AND LIQUID CRYSTAL DISPLAYS,<br />

SWITCHBOARD LAMPS, ELECTRICAL TRANS<strong>FOR</strong>-<br />

MERS, ELECTRIC COILS, FREQUENCY CONVERTERS,<br />

AMPLIFIERS, CHOCKING COILS; ELECTRONIC MA-<br />

CHINES, NAMELY, COMPUTERS, NOTEBOOK COMPU-<br />

TERS, OPTICAL CHARACTER READERS, LAPTOP<br />

COMPUTERS, MOUSE, MICROPROCESSORS, BAR<br />

CODE READERS, LASERS NOT <strong>FOR</strong> MEDICAL PUR-

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