MARKS PUBLISHED FOR OPPOSITION

JANUARY 11, 2005 U.S. PATENT AND TRADEMARK OFFICE TM 9
SN 76-272,226. TOKYO ELECTRON LIMITED, MINATO-KU,
TOKYO 107, JAPAN, FILED 6-15-2001.
PRIORITY CLAIMED UNDER SEC. 44(D) ON JAPAN
APPLICATION NO. 2000-136001, FILED 12-18-2000, REG. NO.
4569181, DATED 5-17-2002, EXPIRES 5-17-2012.
NO CLAIM IS MADE TO THE EXCLUSIVE RIGHT TO
USE "TECHNOLOGY", APART FROM THE MARK AS
SHOWN.
CLASS 7—MACHINERY
FOR METAL WORKING MACHINES, NAMELY, LA-
SER PROCESSING MACHINES, GRINDERS, ELECTRON
BEAM PROCESSING MACHINES, LASER CUTTERS,
ELECTRIC WELDING MACHINES; CHEMICAL PRO-
CESSING MACHINES, NAMELY, GASIFIERS, SILICON
WAFER CLEANING AND DRYING MACHINES, CHE-
MICAL VAPOR DEPOSITION MACHINES FOR GENER-
AL INDUSTRIAL USE; SEMICONDUCTOR
MANUFACTURING, PROCESSING AND PRODUCTION
MACHINES, NAMELY, SEMICONDUCTOR MANUFAC-
TURING MACHINES, SEMICONDUCTOR WAFER PRO-
CESSING MACHINES, SEMICONDUCTOR
PRODUCTION MACHINES, ALL FOR THE PROCES-
SING AND PRODUCTION OF SEMICONDUCTOR SUB-
STRATES, THIN FILMS, SILICON DISCS AND WAFERS;
LIQUID CRYSTAL DISPLAY MANUFACTURING, PRO-
CESSING AND PRODUCTION MACHINES (U.S. CLS. 13,
19, 21, 23, 31, 34 AND 35).
CLASS 9—ELECTRICAL AND SCIENTIFIC
APPARATUS
FOR SEMICONDUCTOR TESTING MACHINES FOR
TESTING AND INSPECTING WAFERS AND INTE-
GRATED CIRCUITS; SEMICONDUCTOR PROBE
CARDS FOR TESTING INTEGRATED CIRCUITS; PHY-
SICOCHEMICAL APPARATUS, NAMELY, GAS ANALY-
SIS UNITS, AIR ANALYSIS UNITS; MEASURING
APPARATUS, NAMELY, SURFACE ROUGHNESS TEST-
ING MACHINES, GASOMETERS, WATER METERS,
ACCELEROMETERS, PHOTOMETERS, ACTIN-
OMETERS, REFRACTOMETERS, BAROMETERS, MAN-
OMETERS, PRESSURE INDICATORS, PRESSURE
MEASURING UNITS, CHEMICAL FLUID MEASURING
CUPS, CALORIMETERS, FLOWMETERS, ANGLE
GAUGES, CLINOMETERS, PRECISION INSTRUMENTS
IN THE NATURE OF LENGTH GAUGES, VACUUM
MEASURING SENSORS, FLATNESS TESTING MA-
CHINES, AUTOMATIC HUMIDITY CONTROLLERS,
AUTOMATIC PRESSURE CONTROLLERS, AUTOMATIC
LIQUID LEVEL CONTROLLERS, AUTOMATIC FLUID
FLOW CONTROLLERS, AUTOMATIC CALORIE CON-
TROLLERS, THERMOSTATS, AUTOMATIC VACUUM
CONTROLLERS, PROGRAM CONTROLLING MA-
CHINES, NAMELY, EQUIPMENT CONTROLLER AND
MACHINE CONTROLLER HAVING A PROGRAM FOR
CONTROLLING APPARATUSES FOR USE IN THE
MANUFACTURE OF AND TESTING OF SEMICONDUC-
TORS AND LIQUID CRYSTAL DISPLAYS, AERO-
METERS, WATER LEVEL INDICATORS, SPIRIT
LEVELS, SEISMOGRAPHS, FILM THICKNESS MEA-
SURING UNITS, FILM INSPECTION UNITS; POWER
DISTRIBUTION OR CONTROLLING APPARATUS,
NAMELY, REACTORS, DISTRIBUTION BOXES, ELEC-
TRIC RELAYS, DISTRIBUTOR BOXES, SWITCH-
BOARDS, BRANCH BOXES, CELL SWITCHES,
INVERTERS, TRANSFORMERS, ELECTRIC SWITCHES,
ELECTRIC RESISTANCES, ELECTRIC CONTACTS,
CURRENT CONTROLLERS, WIRE CONNECTORS,
FLASHERS, CIRCUIT BREAKERS, CONDENSERS,
ELECTRICAL FUSES, ELECTRICAL CONTROLLERS
FOR USE IN THE MANUFACTURE AND TESTING OF
SEMICONDUCTORS AND LIQUID CRYSTAL DIS-
PLAYS; OPTICAL INSTRUMENTS, NAMELY, OPTICAL
LENSES, OPTICAL OBJECTIVE LENSES, CORRECTING
LENSES, METALLURGICAL MICROSCOPES, SPECTRO-
SCOPES, EYEPIECES, ZOOM MICROSCOPES, OPTICAL
CONDENSERS, POLARIZING MICROSCOPES, PRISMS
FOR SCIENTIFIC PURPOSES; TELECOMMUNICATION
MACHINES, NAMELY, PRIORITY CONTROLLERS FOR
CONTROLLING SEMICONDUCTOR MANUFACTUR-
ING SYSTEMS FOR USE IN THE MANUFACTURE OF
AND TESTING OF SEMICONDUCTORS AND LIQUID
CRYSTAL DISPLAYS AND TELEMETERING APPARA-
TUS FOR USE IN THE MANUFACTURE AND TESTING
OF SEMICONDUCTORS AND LIQUID CRYSTAL DIS-
PLAYS, HIGH-FREQUENCY APPARATUS FOR USE IN
THE MANUFACTURE AND TESTING OF SEMICON-
DUCTORS AND LIQUID CRYSTAL DISPLAYS,
SWITCHBOARD LAMPS, ELECTRICAL TRANSFOR-
MERS, ELECTRIC COILS, FREQUENCY CONVERTERS,
AMPLIFIERS, CHOCKING COILS; ELECTRONIC MA-
CHINES, NAMELY, COMPUTERS, NOTEBOOK COMPU-
TERS, OPTICAL CHARACTER READERS, LAPTOP
COMPUTERS, MOUSE, MICROPROCESSORS, BAR
CODE READERS, LASERS NOT FOR MEDICAL PUR-
POSES, X-RAYS PRODUCING APPARATUS AND IN-
STALLATIONS NOT FOR MEDICAL PURPOSES,
PROTECTION DEVICES AGAINST X-RAYS NOT FOR
MEDICAL PURPOSES, NAMELY, SHIELDS; COMPUTER
SIMULATORS CONSISTING OF ELECTRONIC EVALU-
ATING DEVICES FOR EVALUATING RELIABILITY,
REPEATABILITY AND TRANSFER FOR THE CON-
TROL OF SEMICONDUCTOR MANUFACTURING, PRO-
CESSING AND PRODUCTION MACHINES,
SIMULATION APPARATUS CONSISTING OF ELEC-
TRONIC EVALUATING DEVICES FOR EVALUATING
RELIABILITY, REPEATABILITY AND TRANSFER FOR
MANUFACTURE AND TESTING OF SEMICONDUC-
TORS AND LIQUID CRYSTAL DISPLAYS, SCANNERS,
MAGNETIC DISCS, MAGNETIC TAPES, DEMAGNETI-
ZERS FOR MAGNETIC TAPES, ELECTRIC MONITOR-
ING APPARATUS, ELECTRONIC PENS, CENTRAL
PROCESSING UNITS, COMPUTER MEMORIES, COM-
PUTER MONITORS, DISK DRIVES FOR COMPUTERS,
MAGNETIC TAPES FOR COMPUTERS, PRINTERS FOR
USE WITH COMPUTERS, COMPUTER KEYBOARDS,
FLOPPY DISKS, CATHODE-RAY TUBES, DIODES,
NAMELY, SEMICONDUCTOR DIODES, CRYSTAL
DIODES AND LIGHT EMITTING DIODES, TRANSIS-
TORS, SEMICONDUCTORS, SILICON WAFERS, INTE-
GRATED CIRCUITS, PRINTED CIRCUITS; COMPUTER
SOFTWARE FOR USE WITH SEMICONDUCTOR MAN-
UFACTURING, PROCESSING AND PRODUCTION MA-
CHINES AND FOR USE WITH SEMICONDUCTOR
TESTING MACHINES; COMPUTER OPERATING AND
APPLICATION SOFTWARE FOR USE IN THE MANU-
FACTURE AND TESTING OF SEMICONDUCTORS AND
LIQUID CRYSTAL DISPLAYS; COMPUTER OPERAT-
ING AND APPLICATION SOFTWARE FOR USE WITH
SEMICONDUCTOR MANUFACTURING, PROCESSING
AND PRODUCTION MACHINES, SEMICONDUCTOR
TESTING MACHINES AND LIQUID CRYSTAL DISPLAY
MANUFACTURING, PROCESSING AND PRODUCTION
MACHINES; RECORDED VIDEO DISCS AND TAPES
FEATURING SEMICONDUCTOR MANUFACTURING,
PROCESSING AND PRODUCTION MACHINES, FEA-
TURING LIQUID CRYSTAL DISPLAY MANUFACTUR-
ING, PROCESSING AND PRODUCTION MACHINES
AND FEATURING SEMICONDUCTOR TESTING MA-
CHINES; PLASMA ETCHING AND COATING MA-
CHINES; PHOTO-RESIST COATING MACHINES;
SPUTTERING MACHINES (U.S. CLS. 21, 23, 26, 36 AND
38).
CLASS 11—ENVIRONMENTAL CONTROL AP-
PARATUS
FOR THERMAL OXIDATION FURNACES (U.S. CLS.
13, 21, 23, 31 AND 34).