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Modification of nanocrystalline rf sputtered tin oxide thin film using ...

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Fogure-2: AFM images <strong>of</strong> (a) as-deposited, (b) irradiated at 1×10 13 ions/cm 2 (Group A), (c)<br />

annealed, and (d) irradiated at 1×10 13 ions/cm 2 (Group B) <strong>film</strong>s.<br />

14

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