Performance and Reliability - Flash Memory Summit

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Within each test environment (qualification or DVT) multiple views are evaluated. Design & Manufacturing Field & <strong>Reliability</strong> SSD Test Environments
Root Cause – Design/Components/DRAM – Component Failures / i.e. red phosphourous – Head/Media instability – Design margin <strong>Reliability</strong> Testing HDD design verification / qualification ( rotational media) Test Process ⇒ Pattern reads/writes/verify ⇒ Power cycling ⇒ Extended test at temperature ⇒ Voltage margining ⇒ Temperature Cycling ⇒ Voltage margining & 4 corner
Page 1 and 2: Standardized Testing for SSD’s Pe
Page 3: • Engineering Verification - EVT
Page 6 and 7: Key Features of Standardized Testin
Page 8 and 9: SSD Design & Manufacturing - Design
Page 12 and 13: HDD field reliability (variable fac
Page 14 and 15: Root Cause - Wear leveling performa
Page 16 and 17: What the Customer Expects (in a wor
Page 18 and 19: Sample Tests 08/20/08 ? = Device De
Page 20 and 21: SSD3 & SSDQuick2 • Based upon a l
Page 22 and 23: pwrprof • This script demonstrate
Page 24 and 25: Splicer • Write Shutoff (Write Sp

Performance and Reliability - Flash Memory Summit

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