Performance and Reliability - Flash Memory Summit

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HDD field reliability (variable factors in rotational media) Root Cause – Contamination – Handling, head laps – Lube issues – Motor bearings – Growing defect lists Reliability Testing Test Process ⇒ Multiple full media R/W. ⇒ Head/Surface defects ⇒ W/R adjacent tracks ⇒ Dwell at elevated temperature
– Endurance Root Cause – Performance-mfg. variability – Bit failures / Data Retention – Component Failures – Write splice – Metadata corruption – Write performance – Erase failures – Design Margin Reliability Testing SSD design verification / qualification Test Process ⇒ Multiple writes ⇒ Performance verification ⇒ Disturb testing / pattern writes ⇒ Temperature Cycling ⇒ Voltage margining & 4 corner ⇒ Power cycling mid writes ⇒ Random I/O w/ power cycling ⇒ Cold write ⇒ Margined erase ⇒ Four Corners
Page 1 and 2: Standardized Testing for SSD’s Pe
Page 3: • Engineering Verification - EVT
Page 6 and 7: Key Features of Standardized Testin
Page 8 and 9: SSD Design & Manufacturing - Design
Page 10 and 11: Within each test environment (quali
Page 14 and 15: Root Cause - Wear leveling performa
Page 16 and 17: What the Customer Expects (in a wor
Page 18 and 19: Sample Tests 08/20/08 ? = Device De
Page 20 and 21: SSD3 & SSDQuick2 • Based upon a l
Page 22 and 23: pwrprof • This script demonstrate
Page 24 and 25: Splicer • Write Shutoff (Write Sp

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