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What's a low leakage current filter from the practical point of view?

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TDK-EPC presentation<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong><br />

<strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>?<br />

Low <strong>leakage</strong> <strong>current</strong> requirements in power applications:<br />

target conflicts and consequences for EMC <strong>filter</strong> design<br />

Christian Paulwitz, EPCOS AG, EMC Laboratory, Regensburg, Germany<br />

EPCOS AG<br />

A Member <strong>of</strong> TDK-EPC Corporation<br />

Magnetics • MAG D&A LAB<br />

Regensburg, Germany<br />

June 12, 2012


TDK-EPC presentation<br />

Who is TDK-EPC?<br />

Short Company Presentation<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 2


TDK-EPC presentation<br />

TDK-EPC. Global excellence in electronic<br />

components, modules and systems<br />

SAE<br />

Recording Heads<br />

for HDD<br />

Electronic<br />

Components<br />

TDK-Lambda<br />

Power Supplies<br />

O<strong>the</strong>r<br />

TDK businesses<br />

ATL<br />

Batteries<br />

TDK-EPC<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 3


TDK-EPC presentation<br />

TDK-EPC at a glance<br />

TDK-EPC has emerged <strong>from</strong> <strong>the</strong> combination <strong>of</strong> EPCOS and <strong>the</strong> electronic components<br />

business <strong>of</strong> TDK and markets its products under <strong>the</strong> product brands, TDK and EPCOS.<br />

Key info (Fiscal Year 2012, ending March 31)<br />

Evolution<br />

Core business<br />

Headquarters<br />

Electronic components,<br />

modules and systems<br />

Tokyo, Japan<br />

Munich, Germany<br />

1935<br />

TDK (Tokyo Denki Kagaku Kogyo =<br />

Tokyo Electric and Chemical<br />

Industries) established in Japan<br />

to manufacture and commercialize<br />

ferrites<br />

Sales<br />

Number <strong>of</strong><br />

sites<br />

Employees<br />

total<br />

EUR 3.5 billion<br />

approx. 40,<br />

more than 50 plants<br />

43,000<br />

1999<br />

2009<br />

Oct. 1<br />

EPCOS founded in Germany,<br />

emerging <strong>from</strong> Siemens Matsushita<br />

Components, a joint venture <strong>of</strong><br />

Siemens Passive Components with<br />

Matsushita<br />

TDK-EPC Corporation established<br />

in Japan<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 4


TDK-EPC presentation<br />

Broad portfolio <strong>of</strong> TDK and EPCOS solutions<br />

• Multilayer Ceramic<br />

Capacitors<br />

• Aluminum Electrolytic<br />

Capacitors<br />

• Film Capacitors<br />

• Ferrites<br />

• Inductors<br />

• Transformers<br />

• EMC Components<br />

• SAW and BAW Filter Products<br />

• Radio-Frequency Modules<br />

• ESD/EMI Modules<br />

• MEMS Products<br />

• Multilayer High-Frequency<br />

Components<br />

• Microwave Ceramic<br />

Components<br />

• Piezo<br />

Devices<br />

• Thermistors<br />

• Varistors<br />

• Surge<br />

Arresters<br />

• Sensors<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© EPCOS TDK-EPC AG 2012<br />

A Member MAG <strong>of</strong> TDK-EPC D&A LAB Corporation<br />

• 06/12 • 5<br />

CC 04/12 • 05


TDK-EPC presentation<br />

Pr<strong>of</strong>essional High-End EMC Filters<br />

Over<strong>view</strong> standard <strong>filter</strong>s<br />

1-line <strong>filter</strong>s<br />

Feedthrough components, up to 500 A<br />

2-line <strong>filter</strong>s<br />

19 series, 164 types, up to 1000 A<br />

3-line <strong>filter</strong>s<br />

12 series, 80 types, up to 2500 A<br />

4-line <strong>filter</strong>s<br />

7 series, 38 types, up to 1600 A<br />

Filters for shielded rooms<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 6


TDK-EPC presentation<br />

Complete Solution Provider for Drive Applications<br />

Line reactors / PFC<br />

chokes<br />

Main<br />

Rectifier<br />

DC link<br />

Inverter<br />

Dv/dt choke<br />

Sine-wave<br />

<strong>filter</strong><br />

Motor<br />

M<br />

Ongoing portfolio extension<br />

Existing portfolio<br />

EMC <strong>filter</strong>s<br />

Standard and<br />

custom specific<br />

SineFormer TM<br />

Reduces<br />

common-mode<br />

disturbances<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 7


TDK-EPC presentation<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong><br />

<strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>?<br />

Low <strong>leakage</strong> <strong>current</strong> requirements in power applications:<br />

target conflicts and consequences for EMC <strong>filter</strong> design<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 8


TDK-EPC presentation<br />

Presentation Structure<br />

• Leakage <strong>current</strong>: What do we talk about?<br />

• Origins <strong>of</strong> Leakage Current<br />

• Consequences for EMC <strong>filter</strong>ing<br />

• Suitability <strong>of</strong> different measurement procedures<br />

• Summary<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 9


TDK-EPC presentation<br />

Leakage Current: What do we talk about?<br />

International Electrotechnical Vocabulary:<br />

“electric <strong>current</strong> in an unwanted conductive path<br />

under normal operating conditions”<br />

Examples for different settings:<br />

‣ possible direct <strong>current</strong> through a human body (touch <strong>current</strong>),<br />

‣ ensure correct function <strong>of</strong> protective devices during normal operation<br />

conditions (residual <strong>current</strong>),<br />

‣ Leakage <strong>current</strong>s reducing installation life time (z. B. bearing <strong>current</strong>s in<br />

converter-driven motors),<br />

‣ High <strong>leakage</strong> <strong>current</strong>s in unbalanced and harmonic-containing systems<br />

(e. g. PEN installations).<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 10


TDK-EPC presentation<br />

Leakage Current: What do we talk about?<br />

Physiological effects <strong>of</strong> <strong>the</strong> electric <strong>current</strong>:<br />

Duration <strong>of</strong> <strong>current</strong> f<strong>low</strong> t<br />

Zones:<br />

AC-1 – Imperceptible<br />

AC-2 – Perceptible<br />

AC-3 – Reversible<br />

effects: muscular<br />

contraction<br />

AC-4 – Possibility <strong>of</strong><br />

irreversible<br />

effects.<br />

Probability <strong>of</strong> heart<br />

fibrillation:<br />

AC-4-1: up to 5 %<br />

AC-4-2: up to 50 %<br />

AC-4-3 >50 %<br />

Current through <strong>the</strong> body I B<br />

Source: IEC/TS 60479-1 (2005)<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 11


TDK-EPC presentation<br />

Leakage Current: What do we talk about?<br />

Thresholds <strong>of</strong> protective devices – like RCD – correspond to <strong>the</strong> areas <strong>of</strong><br />

physiological effects on a human body.<br />

Note:<br />

RCD device “30 mA” → tripping threshold approx. 15 mA<br />

RCD device “300 mA” → tripping threshold approx. 150 mA<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 12


TDK-EPC presentation<br />

Leakage Current: What do we talk about?<br />

Typical touch <strong>current</strong> requirements (maximum <strong>current</strong> which may f<strong>low</strong><br />

through a human body) for devices :<br />

3.5 mA (example: for plugable devices, if it is touched while<br />

<strong>the</strong> PE conductor might be broken)<br />

0.5 mA (example: protective class II, medical devices)<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 13


TDK-EPC presentation<br />

Origins <strong>of</strong> Leakage Current<br />

What is a <strong>low</strong>-<strong>leakage</strong> <strong>current</strong> <strong>filter</strong>?<br />

‣ … all EMC <strong>filter</strong>s – as long as no voltage will be applied!<br />

That means: Leakage <strong>current</strong> depends not only on <strong>filter</strong> components,<br />

but<br />

‣ … on <strong>the</strong> power supply voltage (amplitude, frequency, phase balance,<br />

harmonics content);<br />

‣ … on <strong>the</strong> internal voltage sources <strong>of</strong> <strong>the</strong> application:<br />

to be found at switch-mode PWM voltages!<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 14


TDK-EPC presentation<br />

Origins <strong>of</strong> Leakage Current<br />

Sources, responsible for causing <strong>leakage</strong> <strong>current</strong>:<br />

supply voltage<br />

EMC <strong>filter</strong> power electronic application<br />

mains cable with parasitic<br />

properties<br />

<strong>leakage</strong> <strong>current</strong> parts, caused<br />

by supply voltage<br />

<strong>leakage</strong> <strong>current</strong> parts, caused by voltages<br />

application-internally generated<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 15


TDK-EPC presentation<br />

Origins <strong>of</strong> Leakage Current<br />

Sources, responsible for causing <strong>leakage</strong> <strong>current</strong>:<br />

supply voltage<br />

EMC <strong>filter</strong><br />

power electronic application<br />

f mains : n x 50 Hz<br />

f pulse : 2…16 kHz<br />

Z L : ~ 0 Typical location<br />

for residual <strong>current</strong><br />

Z C : large measurements<br />

(<strong>the</strong> smaller C <strong>the</strong> smaller I leak )<br />

Z L : according to L: ra<strong>the</strong>r large<br />

Z C : according to C: ra<strong>the</strong>r small<br />

(<strong>the</strong> larger C <strong>the</strong> smaller I leak )<br />

Note also: <strong>leakage</strong> <strong>current</strong> raises at f pulse ~ resonance frequency <strong>of</strong> L and C<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 16


TDK-EPC presentation<br />

Suitability <strong>of</strong> Different Measurement Procedures<br />

What are <strong>the</strong> specific requirements? – Examples:<br />

1) Limitation <strong>of</strong> <strong>the</strong> maximum touch <strong>current</strong><br />

(typical requirements for devices with plugs)?<br />

2) RCD compatibility<br />

(in most cases more important requirement at fixed installed<br />

applications)?<br />

Attention:<br />

• One <strong>of</strong> <strong>the</strong> requirements does not automatically cover <strong>the</strong> o<strong>the</strong>r one!<br />

• Definition <strong>of</strong> operating modes!<br />

• Definition <strong>of</strong> setup conditions, which might be relevant for <strong>leakage</strong><br />

<strong>current</strong>s!<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 17


TDK-EPC presentation<br />

Suitability <strong>of</strong> Different Measurement Procedures<br />

Touch <strong>current</strong>, e. g. according to IEC/EN 60990 (figure 4), weighting with<br />

regard to perception/reaction:<br />

100.0%<br />

A<br />

B<br />

1,5 kΩ<br />

test<br />

terminal<br />

500 Ω<br />

220 nF<br />

20 kΩ<br />

Bewertung weighting<br />

U 1 U 2<br />

22 nF<br />

90.0%<br />

80.0%<br />

70.0%<br />

60.0%<br />

50.0%<br />

40.0%<br />

30.0%<br />

20.0%<br />

10.0%<br />

Weighted touch <strong>current</strong><br />

(perception and reaction):<br />

U 2<br />

500 Ω<br />

0.0%<br />

10 100 1000 10000 100000<br />

Frequenz [Hz]<br />

peak value!<br />

frequency (Hz)<br />

Example: sinusoidal <strong>current</strong> <strong>of</strong> 1 mA / frequency f; measured with perception/reaction network:<br />

f = 50 Hz => <strong>current</strong> assessment as „1 mA“ (100 %)<br />

f = 1 kHz => <strong>current</strong> assessment as „0,57 mA“ (57 %)<br />

f = 5 kHz => <strong>current</strong> assessment as „0,13 mA“ (13 %)<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 18


TDK-EPC presentation<br />

Suitability <strong>of</strong> Different Measurement Procedures<br />

An RCD shows quite a similar weighting curve up to <strong>the</strong> kHz range …<br />

weighting<br />

Bewertung gegenüber tatsächlichem Strom<br />

120%<br />

100%<br />

80%<br />

60%<br />

40%<br />

20%<br />

0%<br />

10 100 1000 10000 100000<br />

Frequenz (Hz)<br />

frequenzy (Hz)<br />

Abweichung frequencyMessung weighting über curve FI-Nachbildung artificial RCD<br />

Measured characteristic <strong>of</strong> an artificial RCD with measurement output<br />

instead <strong>of</strong> tripping circuit (Siemens 5SM1 930-0)<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 19


TDK-EPC presentation<br />

Suitability <strong>of</strong> Different Measurement Procedures<br />

RCD standardisation for <strong>the</strong> kHz range; DIN V VDE V 0664-210;<br />

RCBO (residual <strong>current</strong> operated circuit-breaker with over<strong>current</strong> protection) type B+<br />

(defined e. g. for DC/AC residual <strong>current</strong>s up to 20 kHz, pulsed DC residual <strong>current</strong>s)<br />

tripping <strong>current</strong> ranges for RCBO type B+ for frequencies up to 20 kHz<br />

frequency<br />

tripping <strong>current</strong><br />

<strong>low</strong>er limit<br />

tripping <strong>current</strong> upper limit<br />

I Δn : standard value <strong>of</strong> rated residual <strong>current</strong><br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 20


TDK-EPC presentation<br />

Suitability <strong>of</strong> Different Measurement Procedures<br />

… but in <strong>the</strong> kHz range <strong>the</strong> different impedances <strong>of</strong> <strong>the</strong> measurement<br />

apparatus have an influence on <strong>the</strong> <strong>leakage</strong> <strong>current</strong>!<br />

supply voltage<br />

Z i small<br />

L1…L3, N<br />

PE<br />

EMC <strong>filter</strong><br />

example:<br />

L = 1 mH<br />

example:<br />

C = 10 nF<br />

power electronic application<br />

position RCD<br />

within installation<br />

Z -> 0<br />

position measurement<br />

network for touch <strong>current</strong><br />

50 Hz: Z -> 2 kΩ<br />

5 kHz: Z -> 600 Ω<br />

Example with figures for L = 1 mH and C = 22 nF:<br />

50 Hz: Z(L) -> 0,3 Ω Z(C) -> 300 kΩ<br />

5 kHz: Z(L) -> 30 Ω Z(C) -> 3 kΩ<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 21


TDK-EPC presentation<br />

Suitability <strong>of</strong> Different Measurement Procedures<br />

Example: two frequency converter setups (single phase / 3 phase, ca. 3 kW),<br />

5 m motor cable, different switching frequencies<br />

operation<br />

mode<br />

Standby<br />

2 kHz / 50 Hz<br />

2 kHz / 0.5 Hz<br />

5 kHz / 50 Hz<br />

5 kHz / 0.5 Hz<br />

8 kHz / 50 Hz<br />

8 kHz / 0.5 Hz<br />

10 kHz / 50 Hz<br />

10 kHz / 0.5 Hz<br />

15 kHz / 50 Hz<br />

15 kHz / 0.5 Hz<br />

single phase system<br />

residual<br />

<strong>current</strong><br />

3.1 mA<br />

3.5 mA<br />

5.3 mA<br />

3.9 mA<br />

5.7 mA<br />

3.7 mA<br />

11.3 mA<br />

3.5 mA<br />

15.4 mA<br />

3.6 mA<br />

4.1 mA<br />

touch<br />

<strong>current</strong><br />

2.6 mA<br />

2.7 mA<br />

3.5 mA<br />

2.7 mA<br />

3.6 mA<br />

2.7 mA<br />

3.8 mA<br />

2.7 mA<br />

3.7 mA<br />

2.7 mA<br />

2.9 mA<br />

3 phase system<br />

residual touch<br />

<strong>current</strong> <strong>current</strong><br />

1.3 mA 1.5 mA<br />

8.8 mA 2.0 mA<br />

12.8 mA 4.0 mA<br />

7.4 mA 1.7 mA<br />

25.5 mA 3.7 mA<br />

4.4 mA 1.7 mA<br />

12.0 mA 3.0 mA<br />

4.2 mA 1.6 mA<br />

7.2 mA 2.5 mA<br />

4.3 mA 1.6 mA<br />

5.0 mA 1.9 mA<br />

Comparison: touch <strong>current</strong> measurement vs. residual-<strong>current</strong>-operated protection device<br />

Validation: Does <strong>the</strong> RCD not trip,<br />

if <strong>the</strong> touch <strong>current</strong> requirement <strong>of</strong> 3.5 mA is met?<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 22


TDK-EPC presentation<br />

Suitability <strong>of</strong> Different Measurement Procedures<br />

Example: two frequency converter setups (single phase / 3 phase, ca. 3 kW),<br />

5 m motor cable, different switching frequencies<br />

Comparison: touch <strong>current</strong> measurement vs. RCD<br />

5<br />

4.5<br />

4<br />

Berührstrom touch <strong>current</strong> [mA]<br />

3.5<br />

3<br />

2.5<br />

2<br />

1.5<br />

1<br />

0.5<br />

0<br />

0 5 10 15 20 25 30<br />

residual Fehlerstrom <strong>current</strong> [mA]<br />

Standby 2 kHz 5 kHz 8 kHz 10 kHz 15 kHz<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 23


TDK-EPC presentation<br />

Summary<br />

• Specification <strong>of</strong> <strong>leakage</strong> <strong>current</strong> requirements:<br />

- definition <strong>of</strong> targets<br />

- choice <strong>of</strong> <strong>the</strong> suitable measurement procedure; maybe more than one<br />

might be necessary.<br />

• Initiators <strong>of</strong> <strong>leakage</strong> <strong>current</strong>s:<br />

- power supply <strong>of</strong> <strong>the</strong> application (power frequency)<br />

- switch-mode voltages generated by <strong>the</strong> application (usually kHz range)<br />

Filter components do not cause <strong>leakage</strong> <strong>current</strong>s but influence <strong>the</strong>m<br />

depending on <strong>the</strong> initiator.<br />

• Matching EMC <strong>filter</strong>s to <strong>leakage</strong> <strong>current</strong> requirements::<br />

- power supply voltage limits capacitance to ground<br />

- higher frequency parts <strong>of</strong> <strong>the</strong> <strong>leakage</strong> <strong>current</strong> require <strong>the</strong>n<br />

big <strong>filter</strong> inductances<br />

- considering <strong>filter</strong> resonances => inductances might have to get even bigger<br />

=> The more restrictive <strong>the</strong> requirements, <strong>the</strong> bigger and <strong>the</strong> more expensive <strong>the</strong><br />

<strong>filter</strong>.<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 24


TDK-EPC presentation<br />

Contact<br />

Christian Paulwitz<br />

EPCOS AG<br />

A Member <strong>of</strong> TDK-EPC Corporation<br />

EMC Laboratory<br />

Wernerwerkstraße 2<br />

D-93049 Regensburg<br />

Germany<br />

Telephone: +49 941 850 6107<br />

Fax: +49 941 850 6110<br />

christian.paulwitz@epcos.com<br />

www.global.tdk.com · www.epcos.com<br />

Bart van den Broek<br />

BMF System Parts BV<br />

Gulberg 43 A<br />

5674 TE Nuenen<br />

The Ne<strong>the</strong>rlands<br />

Telephone: +31(0)40-8512170<br />

Fax: +31(0)40-8512171<br />

info@bmf-systemparts.com<br />

www.bmf-systemparts.com<br />

What‘s a <strong>low</strong> <strong>leakage</strong> <strong>current</strong> <strong>filter</strong> <strong>from</strong> <strong>the</strong> <strong>practical</strong> <strong>point</strong> <strong>of</strong> <strong>view</strong>? • Target conflicts and consequences<br />

© TDK-EPC 2012<br />

MAG D&A LAB • 06/12 • 25


TDK-EPC presentation<br />

www.tdk-epc.com

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