Chapter 2 Novelty and Inventive Step - Japan Patent Office
Chapter 2 Novelty and Inventive Step - Japan Patent Office
Chapter 2 Novelty and Inventive Step - Japan Patent Office
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Part II <strong>Chapter</strong> 2 <strong>Novelty</strong> <strong>and</strong> <strong>Inventive</strong> <strong>Step</strong><br />
Example 3<br />
Type: 3<br />
Description in the application concerned<br />
Cited document<br />
【Claim 1】<br />
A laminated film, in which layer A<br />
consisting of thermoplastic resin containing<br />
particles is laminated on layer B consisting of<br />
polyester containing no particle, with the<br />
protrusions of 0.12μm or less in average<br />
height formed in the rate of 1.6 x 10 4 – 1.6 x<br />
10 5 pieces/mm 2 on the surface of layer A <strong>and</strong><br />
with a 0.002 – 0.02μm of the threedimensional<br />
center surface average<br />
roughness SRa.<br />
【Detailed description of the invention】<br />
… The surface roughness was<br />
measured by using a high precision surface<br />
roughness meter ZZ produced by XX<br />
manufacturing Co. Ltd. under the conditions<br />
of cut-off value 0.25mm <strong>and</strong> ZX. The threedimensional<br />
center surface average<br />
roughness SRa (μm) is obtained from the<br />
following expression, where a portion of area<br />
S M is cut off from the rough surface on the<br />
center surface, <strong>and</strong> the axis orthogonal to the<br />
center surface of the portion is expressed by<br />
the Z-axis <strong>and</strong> a value obtained from the<br />
expression is expressed by the unit μm:<br />
LX LY<br />
SRa = ∫ ∫ f ( X , Y ) dxdy<br />
S 0 0<br />
【Title of the invention】<br />
Laminate films<br />
【Detailed description of the invention】<br />
… The center line surface<br />
roughness Ra is measured by using a high<br />
precision surface roughness meter OO<br />
produced by XX manufacturing Co. Ltd. <strong>and</strong><br />
a chart is drawn under the condition of cut-off<br />
value 0.08mm <strong>and</strong> OX, according to JIS<br />
B0601. A portion of measured length L is cut<br />
out from a film surface roughness curve to<br />
the direction of the center line. When the<br />
center line of the portion is expressed as an<br />
X axis, the vertical direction is expressed as<br />
a Y axis, <strong>and</strong> a roughness curve is<br />
expressed as Y = f (X), the value obtained<br />
from the following expression is Ra (μm):<br />
L<br />
Ra = 1 f ( X )dx<br />
L∫0<br />
This measurement is practiced on<br />
four points as the reference length is 1.25mm<br />
<strong>and</strong> Ra is expressed in the average value.<br />
……<br />
【Working example】<br />
1 The polyethylene containing the talc<br />
M<br />
particles in 40 w% with 0.05μm in average<br />
particle diameter <strong>and</strong> the polyethylene<br />
terephthalate containing no particle were coextruded<br />
under the condition of ……,<br />
stretched <strong>and</strong> heat treated to obtain a<br />
biaxially oriented film of 9.8μm. The microprotrusions<br />
of 0.1μm or less were formed at<br />
the rate of 55,000 pieces/mm 2 on the surface<br />
of the polyethylene layer <strong>and</strong> the center line<br />
surface roughness Ra was 0.009μm.<br />
(wherein LX・LY=S M )<br />
……<br />
Explanation<br />
Since the claimed method for evaluation of measured surface roughness is<br />
different from the one described in the cited document, it is impossible to compare them<br />
directly. However, there is no statement in the present description <strong>and</strong> the cited document<br />
that the film surface roughness has directionality or specific distribution; <strong>and</strong> if it provides a<br />
general film without directionality or specific distribution in the surface roughness, it can be<br />
considered that the values of three-dimensional center surface roughness <strong>and</strong> the center<br />
line surface roughness will become almost the same even when the difference in concrete<br />
measurement conditions is taken into consideration. Considering all mentioned above,<br />
when the surface roughness of the film described in the cited document is evaluated by<br />
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