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Chapter 2 Novelty and Inventive Step - Japan Patent Office

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Part II <strong>Chapter</strong> 2 <strong>Novelty</strong> <strong>and</strong> <strong>Inventive</strong> <strong>Step</strong><br />

Example 3<br />

Type: 3<br />

Description in the application concerned<br />

Cited document<br />

【Claim 1】<br />

A laminated film, in which layer A<br />

consisting of thermoplastic resin containing<br />

particles is laminated on layer B consisting of<br />

polyester containing no particle, with the<br />

protrusions of 0.12μm or less in average<br />

height formed in the rate of 1.6 x 10 4 – 1.6 x<br />

10 5 pieces/mm 2 on the surface of layer A <strong>and</strong><br />

with a 0.002 – 0.02μm of the threedimensional<br />

center surface average<br />

roughness SRa.<br />

【Detailed description of the invention】<br />

… The surface roughness was<br />

measured by using a high precision surface<br />

roughness meter ZZ produced by XX<br />

manufacturing Co. Ltd. under the conditions<br />

of cut-off value 0.25mm <strong>and</strong> ZX. The threedimensional<br />

center surface average<br />

roughness SRa (μm) is obtained from the<br />

following expression, where a portion of area<br />

S M is cut off from the rough surface on the<br />

center surface, <strong>and</strong> the axis orthogonal to the<br />

center surface of the portion is expressed by<br />

the Z-axis <strong>and</strong> a value obtained from the<br />

expression is expressed by the unit μm:<br />

LX LY<br />

SRa = ∫ ∫ f ( X , Y ) dxdy<br />

S 0 0<br />

【Title of the invention】<br />

Laminate films<br />

【Detailed description of the invention】<br />

… The center line surface<br />

roughness Ra is measured by using a high<br />

precision surface roughness meter OO<br />

produced by XX manufacturing Co. Ltd. <strong>and</strong><br />

a chart is drawn under the condition of cut-off<br />

value 0.08mm <strong>and</strong> OX, according to JIS<br />

B0601. A portion of measured length L is cut<br />

out from a film surface roughness curve to<br />

the direction of the center line. When the<br />

center line of the portion is expressed as an<br />

X axis, the vertical direction is expressed as<br />

a Y axis, <strong>and</strong> a roughness curve is<br />

expressed as Y = f (X), the value obtained<br />

from the following expression is Ra (μm):<br />

L<br />

Ra = 1 f ( X )dx<br />

L∫0<br />

This measurement is practiced on<br />

four points as the reference length is 1.25mm<br />

<strong>and</strong> Ra is expressed in the average value.<br />

……<br />

【Working example】<br />

1 The polyethylene containing the talc<br />

M<br />

particles in 40 w% with 0.05μm in average<br />

particle diameter <strong>and</strong> the polyethylene<br />

terephthalate containing no particle were coextruded<br />

under the condition of ……,<br />

stretched <strong>and</strong> heat treated to obtain a<br />

biaxially oriented film of 9.8μm. The microprotrusions<br />

of 0.1μm or less were formed at<br />

the rate of 55,000 pieces/mm 2 on the surface<br />

of the polyethylene layer <strong>and</strong> the center line<br />

surface roughness Ra was 0.009μm.<br />

(wherein LX・LY=S M )<br />

……<br />

Explanation<br />

Since the claimed method for evaluation of measured surface roughness is<br />

different from the one described in the cited document, it is impossible to compare them<br />

directly. However, there is no statement in the present description <strong>and</strong> the cited document<br />

that the film surface roughness has directionality or specific distribution; <strong>and</strong> if it provides a<br />

general film without directionality or specific distribution in the surface roughness, it can be<br />

considered that the values of three-dimensional center surface roughness <strong>and</strong> the center<br />

line surface roughness will become almost the same even when the difference in concrete<br />

measurement conditions is taken into consideration. Considering all mentioned above,<br />

when the surface roughness of the film described in the cited document is evaluated by<br />

33

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