Infrared Detector Arrays
Infrared Detector Arrays
Infrared Detector Arrays
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23 .26 IMAGING DETECTORS<br />
the maximum detector-limited peak D * in the absence of excess bias-induced noise (both<br />
l / f and shot noise) is<br />
D * pk q<br />
2 – R 0 A <br />
(14)<br />
kT hc<br />
The R 0 A product of a detector thus describes detector quality even though other<br />
parameters may actually be more relevant for FPA operation .<br />
Percentage of BLIP<br />
Whereas D * compares the performance of dissimilar detectors , FPA designers often need<br />
to quantify an FPA’s performance relative to the theoretical limit at a specific operating<br />
background . Percentage of BLIP , B L I P , is one such parameter and is simply the ratio of<br />
photon noise to composite FPA noise<br />
N<br />
B L I P 2 1/2<br />
PHOTON<br />
<br />
N 2 PHOTON N 2 FPA<br />
(15)<br />
NE T<br />
the NE T of a detector represents the temperature change , for incident radiation , that<br />
gives an output signal equal to the rms noise level . While normally thought of as a system<br />
parameter , detector NE T and system NE T are the same except for system losses<br />
(conservation of radiance) . NE T is defined :<br />
NE T n T<br />
V s<br />
Q<br />
T<br />
n<br />
Q V s<br />
(16)<br />
where n is the rms noise and V s is the signal measured for the temperature dif ference<br />
T . It can be shown that<br />
NE T ( τ o C T BLIP<br />
4 N c ) 1 (16 a )<br />
where τ o is the optics transmission , C T is the thermal contrast from Fig . 1 , and N c is the<br />
number of photogenerated carriers integrated for one integration time , t i n t :<br />
N c A d e t t i n t Q B (16 b )<br />
The distinction between an integration time , and the FPA’s frame time must be noted . It is<br />
often impossible at high backgrounds to handle the large amount of carriers generated<br />
over frame times compatible with standard video frame rates . The impact on system D * is<br />
often not included in the FPA specifications provided by FPA manufacturers . This practice<br />
is appropriate for the user to assess relative detector quality , but must be coupled with