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Download Event Guide - SAE

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Special <strong>Event</strong>s and Networking Opportunities<br />

WEDNESDAY<br />

May 22<br />

Networking Time with Exhibitors<br />

Exhibition Hall C<br />

4:10 – 5:00 p.m.<br />

Networking Reception and Award<br />

Ceremony<br />

Exhibition Hall C<br />

Includes awards presentations (see page 48 for details)<br />

5:00 – 6:30 p.m.<br />

Awards to be presented:<br />

• Ralph K. Hillquist Honorary <strong>SAE</strong> Scholarship<br />

• Forest R. McFarland Award<br />

• Student Paper Competition<br />

• Student Poster Competition<br />

• Science Fair “Best of Show”<br />

Networking Reception after<br />

Structure Borne NVH Workshop<br />

Sponsored by<br />

Structure Borne NVH Workshop<br />

Ballroom D<br />

6:30 – 8:00 p.m.<br />

Please join us for the 10th Anniversary of the Structure Borne NVH workshop.<br />

Since the beginning, the workshop has stressed the fundamentals of source–path–<br />

receiver principles. A theoretical foundation covers the basics of low-frequency<br />

NVH (to 100 Hz where NVH is felt) and mid-frequency (to 500 Hz were NVH is<br />

heard). The application topic will discuss the causes of NVH variability and corresponding<br />

new methods of simulation to assure robustness.<br />

Organizers and Presenters: Alan E. Duncan, Automotive Analytics Inc.;<br />

Gregory Goetchius, Tesla Motors Inc.; Jianmin Guan, Altair Engineering Inc.<br />

The History and Future of Fourier<br />

Analysis Workshop<br />

Ballroom C<br />

6:30 – 8:00 p.m.<br />

Frequency analysis is often referred to as Fourier analysis but is that really true?<br />

The foundation is based on stationary and “Fourier signals.” What happens if that<br />

is not the case? Modern FFT signal analyzers use very sparse sampling that is<br />

correct according to Shannon but what will happen when using time domain analysis.<br />

Many of the myths and frequent questions will be answered using a “user<br />

perspective” and rules of thumb will be given together with good methods to avoid<br />

large errors. After attending this session, a much better understanding in regards to<br />

pitfalls and proper methodology will be the outcome.<br />

Organized by: Thomas Lagö, TechFuzion<br />

22<br />

<strong>SAE</strong> 2013 Noise and Vibration Conference and Exhibition

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