01.07.2014 Views

Presentation on System-Level Design and Verification using ADS ...

Presentation on System-Level Design and Verification using ADS ...

Presentation on System-Level Design and Verification using ADS ...

SHOW MORE
SHOW LESS

Create successful ePaper yourself

Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.

Agilent EEsof EDA<br />

This document is owned by Agilent Technologies, but is no l<strong>on</strong>ger kept current <strong>and</strong> may c<strong>on</strong>tain obsolete or<br />

inaccurate references. We regret any inc<strong>on</strong>venience this may cause. For the latest informati<strong>on</strong> <strong>on</strong> Agilent’s<br />

line of EEsof electr<strong>on</strong>ic design automati<strong>on</strong> (EDA) products <strong>and</strong> services, please go to:<br />

www.agilent.com/find/eesof


<strong>System</strong>-<strong>Level</strong> <strong>Design</strong> & Verificati<strong>on</strong> Using<br />

<strong>ADS</strong> Behavioral Modeling


<strong>Design</strong> & Verificati<strong>on</strong> Flow<br />

<strong>System</strong><br />

Definiti<strong>on</strong><br />

EM<br />

Circuit/RFIC<br />

<strong>Design</strong><br />

Baseb<strong>and</strong><br />

Tape Out<br />

<strong>System</strong><br />

Integrati<strong>on</strong><br />

<strong>System</strong><br />

Verificati<strong>on</strong><br />

Asia EEsof Spring Technology Forum Page 2


End-to-End <strong>System</strong> Verificati<strong>on</strong><br />

Reducing Integrati<strong>on</strong> Risks from <strong>Design</strong> to the End Product<br />

Wireless Pre-<br />

C<strong>on</strong>figured Templates<br />

EM<br />

Tape Out<br />

<strong>System</strong><br />

Definiti<strong>on</strong><br />

Circuit/RFIC<br />

<strong>Design</strong><br />

<strong>System</strong><br />

Integrati<strong>on</strong><br />

<strong>System</strong><br />

Verificati<strong>on</strong><br />

Baseb<strong>and</strong><br />

Verify HW <strong>System</strong><br />

Performance as<br />

So<strong>on</strong> As Possible<br />

<strong>System</strong><br />

<strong>Design</strong><br />

Co-Simulati<strong>on</strong> <strong>and</strong><br />

Modeling Technology<br />

Predictive<br />

Measurement<br />

Algorithms<br />

• RF/Baseb<strong>and</strong> integrati<strong>on</strong> can be a major bottleneck !!<br />

• Verify as so<strong>on</strong> as possible in both simulati<strong>on</strong> <strong>and</strong> test<br />

• C<strong>on</strong>sistent measurement algorithms from definiti<strong>on</strong> to<br />

verificati<strong>on</strong> testing for more predictive design<br />

• <strong>System</strong> metrics- EVM, BER, BLER (as opposed to CW<br />

measurements)<br />

• <strong>System</strong>-level verificati<strong>on</strong> begins before entire system is<br />

available<br />

• Create measurement-based simulati<strong>on</strong> models to re-iterate<br />

design in simulati<strong>on</strong>, if needed<br />

Asia EEsof Spring Technology Forum Page 3


<strong>ADS</strong> Top-Down <strong>Design</strong> Flow<br />

Bottom-Up Verificati<strong>on</strong><br />

<strong>System</strong>-<strong>Level</strong><br />

Circuit-<strong>Level</strong><br />

Transistor-<strong>Level</strong><br />

Hardware-<strong>Level</strong><br />

Asia EEsof Spring Technology Forum Page 4


Co-Simulati<strong>on</strong> with Agilent Ptolemy<br />

Asia EEsof Spring Technology Forum Page 5


<strong>ADS</strong> <strong>System</strong>-<strong>Level</strong> Modeling<br />

Amplifier<br />

from Schematic <strong>Design</strong><br />

OR<br />

from Measurements<br />

Behavioral Model<br />

Populated from<br />

Simulati<strong>on</strong>s or<br />

Measurements<br />

Amplifier HW<br />

Asia EEsof Spring Technology Forum Page 6


Benefits of <strong>System</strong>-<strong>Level</strong> Modeling<br />

<strong>Design</strong> Flow Timeline<br />

<strong>System</strong><br />

Definiti<strong>on</strong><br />

Circuit/RFIC<br />

<strong>Design</strong><br />

<strong>System</strong><br />

Integrati<strong>on</strong><br />

<strong>System</strong><br />

Verificati<strong>on</strong><br />

<strong>Design</strong> Specs Partiti<strong>on</strong>ed<br />

Circuits are<br />

<strong>Design</strong>ed<br />

Circuits Works OK in<br />

<strong>System</strong> Simulati<strong>on</strong><br />

Remaining HW Becomes Available<br />

<strong>and</strong> <strong>System</strong>-<strong>Level</strong> Testing Finally<br />

Begins…Integrati<strong>on</strong> Problem<br />

Found…Re-work <strong>Design</strong> in<br />

Simulati<strong>on</strong> or <strong>on</strong> the Testbench?<br />

4 m<strong>on</strong>ths later?.. 6 m<strong>on</strong>ths later?<br />

Comp<strong>on</strong>ent DUT HW<br />

Becomes Available<br />

This Paper Will Show How to Identify Potential <strong>System</strong> Integrati<strong>on</strong> Issues Earlier<br />

in the <strong>Design</strong> Cycle <strong>and</strong> How to Create Behavioral Models from Hardware to Re-Work<br />

<strong>Design</strong>s in Simulati<strong>on</strong><br />

Asia EEsof Spring Technology Forum Page 7


Applying <strong>System</strong>-<strong>Level</strong> Modeling<br />

in a <strong>Design</strong> Flow<br />

<strong>Design</strong> Flow Timeline<br />

<strong>System</strong><br />

Definiti<strong>on</strong><br />

Circuit/RFIC<br />

<strong>Design</strong><br />

<strong>System</strong><br />

Integrati<strong>on</strong><br />

<strong>System</strong><br />

Verificati<strong>on</strong><br />

Re-Work<br />

<strong>Design</strong> in<br />

Simulati<strong>on</strong><br />

OR<br />

Evaluate<br />

IP Re-Use of<br />

Existing HW<br />

Speed Simulati<strong>on</strong> by<br />

Encapsulating IP in<br />

Data Model<br />

Behavioral<br />

Model from<br />

Simulati<strong>on</strong><br />

Verify End-to-End<br />

<strong>System</strong>-<strong>Level</strong><br />

Performance with<br />

Comp<strong>on</strong>ent HW<br />

Behavioral<br />

Model from<br />

Measurements<br />

Provide Simulati<strong>on</strong><br />

Models to Others<br />

Amplifier Circuit <strong>Design</strong><br />

Create Simulati<strong>on</strong> Model from DUT Hardware to Re-work <strong>System</strong> <strong>Design</strong> in Simulati<strong>on</strong><br />

Amplifier<br />

DUT HW<br />

Asia EEsof Spring Technology Forum Page 8


Where <strong>System</strong>-<strong>Level</strong> Modeling Fits In…<br />

<strong>System</strong> Modeling:<br />

Comp<strong>on</strong>ent Model, not<br />

Device Model<br />

Created from Simulati<strong>on</strong><br />

Schematic or<br />

Measurements<br />

Use to Improve<br />

Simulati<strong>on</strong> Speed After<br />

Circuit <strong>Design</strong> is<br />

Complete<br />

Use to Re-Work <strong>Design</strong>s<br />

In Simulati<strong>on</strong> After Fab<br />

Use to Provide Simulati<strong>on</strong><br />

Models of Final HW to<br />

Others<br />

Asia EEsof Spring Technology Forum Page 9


Case Study:<br />

Transmitter <strong>Design</strong> Example


<strong>System</strong> Definiti<strong>on</strong>:<br />

Put Together Top <strong>Level</strong> <strong>Design</strong><br />

EM<br />

<strong>System</strong><br />

Definiti<strong>on</strong><br />

Circuit/RFIC<br />

<strong>Design</strong><br />

• Interpret <strong>System</strong> <strong>Design</strong> Specificati<strong>on</strong>s<br />

• Put Together Top-<strong>Level</strong> <strong>Design</strong> with<br />

Parameterized Behavioral Elements<br />

Tape Out<br />

<strong>System</strong><br />

Integrati<strong>on</strong><br />

Baseb<strong>and</strong><br />

• Partiti<strong>on</strong> <strong>Design</strong> Requirements for Circuits<br />

<strong>System</strong><br />

Verificati<strong>on</strong><br />

Asia EEsof Spring Technology Forum Page 11


<strong>Design</strong> Specificati<strong>on</strong>s for<br />

Example Transmitter <strong>Design</strong><br />

WCDMA:<br />

• Output Power= +24 dBm min. at 1950 MHz<br />

• ACLR = 33 dB or better at +/- 5 MHz Offset<br />

• ACLR =43 dB or better at +/- 10 MHz Offset<br />

• EVM= 17.5% or Less<br />

Asia EEsof Spring Technology Forum Page 12


Put Together Top-<strong>Level</strong> <strong>Design</strong> with RF<br />

Parametric Behavioral Models<br />

Specify LO Phase Noise vs. Frequency Offset<br />

Specify Amplifier Gain,<br />

P1dB, TOI…<br />

Asia EEsof Spring Technology Forum Page 13


Perform Simulati<strong>on</strong> <strong>and</strong> Verify ACLR <strong>Design</strong><br />

Performance<br />

Meets +24 dBm Output<br />

Power Specificati<strong>on</strong><br />

Meets ACLR Specificati<strong>on</strong>s<br />

at 5 & 10 MHz Offsets<br />

Asia EEsof Spring Technology Forum Page 14


Perform Simulati<strong>on</strong> <strong>and</strong> Verify EVM <strong>Design</strong><br />

Performance<br />

EVM at Output of 1 st Behavioral Amplifier, Behavioral Pre-Amplifier,<br />

<strong>and</strong> Final Output- meets 17.5% Specificati<strong>on</strong><br />

Top-<strong>Level</strong> <strong>Design</strong> Meets <strong>System</strong>-<strong>Level</strong> <strong>Design</strong> Specificati<strong>on</strong>s<br />

Asia EEsof Spring Technology Forum Page 15


Circuit/RFIC <strong>Design</strong>:<br />

RF Circuit <strong>and</strong> Baseb<strong>and</strong> <strong>Design</strong>s<br />

<strong>System</strong><br />

Definiti<strong>on</strong><br />

• <strong>Design</strong> Transistor-<strong>Level</strong> Circuits or Re-Use<br />

Existing Circuit <strong>Design</strong>s<br />

EM<br />

Tape Out<br />

Circuit/RFIC<br />

<strong>Design</strong><br />

<strong>System</strong><br />

Integrati<strong>on</strong><br />

Baseb<strong>and</strong><br />

• <strong>Design</strong> Fixed-Point or Floating-Point<br />

Baseb<strong>and</strong> Secti<strong>on</strong>s<br />

• Verify that Top-<strong>Level</strong> <strong>Design</strong> Still Meets<br />

Specificati<strong>on</strong>s with Circuit <strong>and</strong> Baseb<strong>and</strong> <strong>Design</strong>s<br />

<strong>System</strong><br />

Verificati<strong>on</strong><br />

• Use Automatic Verificati<strong>on</strong> Modeling (AVM) to<br />

Enhance <strong>System</strong> Simulati<strong>on</strong> Speed<br />

Asia EEsof Spring Technology Forum Page 16


Insert Circuit <strong>Design</strong>s <strong>and</strong> Fixed Point FIR<br />

11-Bit Fixed-Point FIR<br />

IF Amplifier Circuit <strong>Design</strong><br />

RF Pre-Amplifier Circuit <strong>Design</strong><br />

Asia EEsof Spring Technology Forum Page 17


Verify ACLR <strong>Design</strong> Performance<br />

Meets +24 dBm Output<br />

Power Specificati<strong>on</strong><br />

Meets ACLR Specificati<strong>on</strong>s<br />

at 5 & 10 MHz Offsets<br />

Asia EEsof Spring Technology Forum Page 18


Verify EVM <strong>Design</strong> Performance<br />

EVM at Signal Source Output is<br />

Degraded by the Fixed-Point FIR<br />

Effects of 11-Bit<br />

Fixed-Point FIR<br />

EVM at Output of 1 st Circuit Amplifier,<br />

Circuit Pre-Amplifier,<br />

<strong>and</strong> Final Output- meets 17.5% Specificati<strong>on</strong><br />

Top-<strong>Level</strong> <strong>Design</strong> Still Meets Specificati<strong>on</strong>s with RF Circuits<br />

<strong>and</strong> Fixed-Point Baseb<strong>and</strong> <strong>Design</strong><br />

…Now Use AVM to Enhance <strong>System</strong> Simulati<strong>on</strong> Speed<br />

Asia EEsof Spring Technology Forum Page 19


Automatic Verificati<strong>on</strong> Modeling (AVM)<br />

New simulati<strong>on</strong> technology based <strong>on</strong> static n<strong>on</strong>-linear behavior of<br />

circuits<br />

Intended for fast co-simulati<strong>on</strong> from Agilent Ptolemy- not for use in A/RF<br />

schematic window al<strong>on</strong>e<br />

Automatic characterizati<strong>on</strong> when Agilent Ptolemy simulati<strong>on</strong> is launched<br />

Re-use previous characterizati<strong>on</strong> data for additi<strong>on</strong>al speed improvements<br />

Asia EEsof Spring Technology Forum Page 20


Use AVM to Enhance Simulati<strong>on</strong> Speed<br />

(fast co-simulati<strong>on</strong>)<br />

Q<br />

I<br />

Mod<br />

FIR<br />

RF_ModFIR<br />

R1<br />

PowerAmp_sub_evm<br />

X5<br />

EnvOutShort<br />

O1<br />

Characterizati<strong>on</strong> (time=0)<br />

Port<br />

P1<br />

Num=1<br />

Normal Co-simulati<strong>on</strong><br />

BJT_NPN<br />

BJT3<br />

Envelope<br />

BJT_NPN<br />

BJT2<br />

BJT_NPN<br />

BJT1 BJT_NPN<br />

BJT4<br />

Port<br />

P2<br />

Num=2<br />

Port<br />

P1<br />

Num=1<br />

V_1T<strong>on</strong>e<br />

SRC1<br />

HB<br />

BJ T_NPN<br />

BJ T3<br />

BJT_NPN<br />

BJT2<br />

BJ T_NPN<br />

BJ T1 BJ T_NPN<br />

BJ T4<br />

Port<br />

P2<br />

Num=2<br />

Fast Cosim<br />

Validati<strong>on</strong><br />

Vout = F(|Vin+Nin|)*exp(j*H*Ph(Vin+Nin))<br />

Ma g<br />

.DS<br />

1<br />

Ph 2<br />

Port V_Noise<br />

P1<br />

SRC1<br />

Fast Cosim<br />

_FIR<br />

Xopt<br />

_NL<br />

X1<br />

Port<br />

P2<br />

Asia EEsof Spring Technology Forum Page 21


Setup Circuit Envelope C<strong>on</strong>troller for AVM<br />

Asia EEsof Spring Technology Forum Page 22


Comparis<strong>on</strong>: Circuit Co-Sim <strong>and</strong> AVM<br />

Good Agreement Between AVM Simulati<strong>on</strong> Results <strong>and</strong> Circuit<br />

Co-Simulati<strong>on</strong>…Use AVM for Further <strong>System</strong>-<strong>Level</strong> Simulati<strong>on</strong>s<br />

Asia EEsof Spring Technology Forum Page 23


<strong>System</strong> Integrati<strong>on</strong>:<br />

RF Behavioral Model, Verilog HDL, Verilog-A<br />

<strong>System</strong><br />

Definiti<strong>on</strong><br />

• Circuit <strong>Design</strong>s are Complete- Encapsulate IP in<br />

Behavioral Model to Share Model with Colleagues<br />

EM<br />

Circuit/RFIC<br />

<strong>Design</strong><br />

• Integrate Verilog HDL FIR Root-Raised-Cosine Filter<br />

Tape Out<br />

<strong>System</strong><br />

Integrati<strong>on</strong><br />

Baseb<strong>and</strong><br />

• Integrate Verilog-A Mixer Circuit <strong>Design</strong><br />

<strong>System</strong><br />

Verificati<strong>on</strong><br />

Asia EEsof Spring Technology Forum Page 24


Extracting the AmplifierP2D Model from<br />

the Pre-Amplifier Circuit <strong>Design</strong><br />

Specify Frequency Sweep<br />

Characteristics<br />

Specify Power Sweep<br />

Characteristics<br />

Asia EEsof Spring Technology Forum Page 25


Example of AmplifierP2D Model<br />

Small Signal Two-Port<br />

S-Parameter Data<br />

Amplifie rP 2D<br />

AMP 1<br />

Freq=850 Mhz<br />

P2DFile="amp.p2d"<br />

Power-Dependent<br />

S-Parameter Data<br />

At Each Frequency<br />

Asia EEsof Spring Technology Forum Page 26


Compare Gain & Phase of Extracted<br />

Behavioral Model to Circuit <strong>Design</strong><br />

Asia EEsof Spring Technology Forum Page 27


Replace Circuit <strong>Design</strong> with Behavioral Model to<br />

Verify Modulated Performance<br />

Asia EEsof Spring Technology Forum Page 28


Circuit & AVM Co-Sim, <strong>and</strong> Behavioral Model<br />

Behavioral Model Accurately Represents Circuit <strong>Design</strong> Performance<br />

… Can Now Provide a Simulati<strong>on</strong> Model to Colleagues<br />

Asia EEsof Spring Technology Forum Page 29


Replace Fixed-Point FIR Filter with Verilog HDL Code<br />

to Co-Simulate with NCSim<br />

Verilog HDL<br />

Filter <strong>Design</strong><br />

Asia EEsof Spring Technology Forum Page 30


Replace Behavioral Mixer with Verilog-A<br />

Mixer Subnetwork<br />

Verilog-A<br />

Mixer <strong>Design</strong><br />

Asia EEsof Spring Technology Forum Page 31


ACLR Performance of Final <strong>Design</strong> with Verilog HDL<br />

Filter <strong>and</strong> Verilog-A Mixer <strong>Design</strong><br />

Meets +24 dBm Output<br />

Power Specificati<strong>on</strong><br />

Meets ACLR Specificati<strong>on</strong>s<br />

at 5 & 10 MHz Offsets<br />

Note: Simulati<strong>on</strong> used <strong>on</strong>e HDL filter co-simulati<strong>on</strong> <strong>and</strong> <strong>on</strong>e fixed-point behavioral filter<br />

Asia EEsof Spring Technology Forum Page 32


EVM Performance of Final <strong>Design</strong> with Verilog HDL<br />

Filter <strong>and</strong> Verilog-A Mixer <strong>Design</strong><br />

EVM at Output of 1 st Circuit Amplifier, Circuit Pre-Amplifier,<br />

<strong>and</strong> Final Output- meets 17.5% Specificati<strong>on</strong><br />

<strong>System</strong> <strong>Design</strong> Still Meets Specificati<strong>on</strong>s with Verilog HDL Digital<br />

Filter <strong>and</strong> Verilog-A Mixer <strong>Design</strong>…Integrati<strong>on</strong> Complete<br />

Note: Simulati<strong>on</strong> used <strong>on</strong>e HDL filter co-simulati<strong>on</strong> <strong>and</strong> <strong>on</strong>e fixed-point behavioral filter<br />

Asia EEsof Spring Technology Forum Page 33


<strong>System</strong> Verificati<strong>on</strong>:<br />

Start <strong>System</strong>-<strong>Level</strong> Testing with Comp<strong>on</strong>ent Hardware<br />

<strong>System</strong><br />

Definiti<strong>on</strong><br />

• Comp<strong>on</strong>ent Hardware Available, but Remaining<br />

Hardware is Still Missing<br />

EM<br />

Tape Out<br />

Circuit/RFIC<br />

<strong>Design</strong><br />

<strong>System</strong><br />

Integrati<strong>on</strong><br />

Baseb<strong>and</strong><br />

• Use Hardware DUT-in-the-Simulati<strong>on</strong> Path to<br />

Test Comp<strong>on</strong>ent at a <strong>System</strong>-<strong>Level</strong><br />

• If Integrati<strong>on</strong> Problem is Identified, then Create<br />

a Simulati<strong>on</strong> Model from Hardware DUT to Modify<br />

<strong>System</strong> <strong>Design</strong> in Simulati<strong>on</strong><br />

<strong>System</strong><br />

Verificati<strong>on</strong><br />

Asia EEsof Spring Technology Forum Page 34


Begin <strong>System</strong>-<strong>Level</strong> Verificati<strong>on</strong> Testing <strong>on</strong><br />

Hardware Amplifier Comp<strong>on</strong>ent<br />

Amplifier DUT<br />

ESG Sig. Gen.<br />

Signal Analyzers<br />

HW Avail.<br />

for Test<br />

<strong>Design</strong> Modeled in <strong>ADS</strong><br />

Find <strong>and</strong> Fix Issues Early in the <strong>Design</strong> Process-Reduce <strong>System</strong><br />

Integrati<strong>on</strong> Risk<br />

Asia EEsof Spring Technology Forum Page 35


Insert HW DUT in the Simulati<strong>on</strong> Path:<br />

Download to ESG Signal Generator<br />

Download Simulated I <strong>and</strong> Q to<br />

E4438C ESG Arbitrary Waveform Generator<br />

Asia EEsof Spring Technology Forum Page 36


Picture of C<strong>on</strong>nected Soluti<strong>on</strong>s Test Setup<br />

Power Meter,<br />

DC Supply<br />

E4440A PSA<br />

E4438C ESG<br />

89640 VSA<br />

Laptop with <strong>ADS</strong> 2003C<br />

E8358A PNA<br />

Asia EEsof Spring Technology Forum Page 37


Picture of Test Signal Downloaded from <strong>ADS</strong> to ESG<br />

(input to DUT)<br />

Spectral Re-growth from<br />

Verilog-A Mixer <strong>and</strong> IF<br />

Amplifier Circuit <strong>Design</strong><br />

Effects of 11-Bit<br />

Fixed-Point FIR<br />

Note that this is a system-level test signal which reflects the<br />

simulated design impairments at the input of the DUT<br />

Asia EEsof Spring Technology Forum Page 38


Measured vs. Simulated Results at<br />

Amplifier Output<br />

Measured<br />

Simulated<br />

Main Ch. Power 13.22 dBm 14.67 dBm<br />

% EVM 4.54 % 4.32 %<br />

ACLR, +10 MHz 44.57 dB 44.44 dB<br />

ACLR, +5 MHz 33.63 dB 34.43 dB<br />

ACLR, -5 MHz 33.4 dB 34.26 dB<br />

ACLR, -10 MHz 43.8 dB 44.33 dB<br />

DUT Comp<strong>on</strong>ent Meets Specificati<strong>on</strong>s, but Has Less Gain Than<br />

Expected…What is the Impact to the Overall <strong>System</strong> Performance?<br />

Asia EEsof Spring Technology Forum Page 39


Access Impact <strong>on</strong> <strong>System</strong> Performance:<br />

Read DUT Output from VSA into Simulati<strong>on</strong><br />

to Run End-to-End <strong>System</strong> Analysis<br />

Read Measured DUT Signal<br />

from 89640 VSA into <strong>ADS</strong><br />

Asia EEsof Spring Technology Forum Page 40


New Predicted <strong>System</strong> Performance with<br />

HW DUT in the Simulati<strong>on</strong> Path<br />

Original New Predicted w/<br />

Simulated DUT-in-Simulati<strong>on</strong>-Path<br />

Main Ch. Power 24.87 dBm 23.71 dBm<br />

% EVM 4.54 % 4.71 %<br />

ACLR, +10 MHz 44.67 dB 44.54 dB<br />

ACLR, +5 MHz 33.41 dB 32.66 dB<br />

ACLR, -5 MHz 33.21 dB 32.47 dB<br />

ACLR, -10 MHz 44.57 dB 44.24 dB<br />

<strong>System</strong> Integrati<strong>on</strong> Problem Found…<strong>System</strong> Will Not Meet<br />

Specificati<strong>on</strong>s With Comp<strong>on</strong>ent Hardware<br />

…Create Simulati<strong>on</strong> Model From DUT Hardware to Re-Work <strong>System</strong><br />

<strong>Design</strong> in Simulati<strong>on</strong><br />

Asia EEsof Spring Technology Forum Page 41


Create Simulati<strong>on</strong> Model of Amplifier DUT<br />

to Re-Work <strong>Design</strong> in Simulati<strong>on</strong><br />

Select PNA.<br />

Enter power range.<br />

Select measurement.<br />

Select Amplifier Model.<br />

Click ‘Measure.’<br />

Asia EEsof Spring Technology Forum Page 42


C<strong>on</strong>nected Soluti<strong>on</strong>sTest Setup <strong>and</strong><br />

Characterizati<strong>on</strong> Parameters<br />

PNA Measurement Parameters<br />

• Center Frequency = 1.95 GHz<br />

• Frequency Span = 40 MHz<br />

• 201 Frequency Points<br />

• RF Power Swept from –15 dBm to<br />

+ 7 dBm in 1 dB Steps<br />

• Port 1 Power Set to -5 dBm for Calibrati<strong>on</strong><br />

• E8358A PNA (300 kHz- 9 GHz) Used<br />

Asia EEsof Spring Technology Forum Page 43


Compare Simulated vs. Measured ACLR for<br />

Meas-Based Amplifier Model<br />

• <strong>ADS</strong> Signal Downloaded to E4438C ESG<br />

• ESG Amplitude Calibrated for Cable Loss<br />

• Measured vs. Simulated Results Compared<br />

at Various RF Power <strong>Level</strong>s<br />

• ACLR Measurements Made with E4440A PSA (top)<br />

• EVM Measurements Made with 89640 VSA (left)<br />

Asia EEsof Spring Technology Forum Page 44


Compare Sim. vs. Meas. Main Channel Power <strong>and</strong> EVM<br />

for Meas-Based Amplifier Model<br />

• <strong>ADS</strong> Signal Downloaded to E4438C ESG<br />

• ESG Amplitude Calibrated for Cable Loss<br />

• Measured vs. Simulated Results Compared<br />

at Various RF Power <strong>Level</strong>s<br />

• Power Measurements Made with E4440A PSA (top)<br />

• EVM Measurements Made with 89640 VSA (left)<br />

Asia EEsof Spring Technology Forum Page 45


Include the Effects of Residual EVM<br />

<strong>on</strong> Meas-Based Model Evaluati<strong>on</strong><br />

Downloading the <strong>ADS</strong> Signal to the E4438C results in a residual EVM of approximately 1.22% @ 0<br />

dBm, Measured with the 89640 VSA<br />

RSS’ing the 1.22% residual EVM with the model simulati<strong>on</strong> results show improved agreement<br />

between simulated <strong>and</strong> measured results (e.g. EVM_RSS= sqrt(EVM_simulated^2 + 1.22^2) to<br />

reflect test equipment characteristics<br />

Asia EEsof Spring Technology Forum Page 46


Meas-Based Model Reflects<br />

HW DUT in the Simulati<strong>on</strong> Path<br />

Predicted w/<br />

DUT-in-Simulati<strong>on</strong>-Path<br />

Meas-Based<br />

Model<br />

Main Ch. Power 23.71 dBm 23.62 dBm<br />

% EVM 4.71 % 4.59%<br />

ACLR, +10 MHz 44.54 dB 44.75 dB<br />

ACLR, +5 MHz 32.66 dB 32.94 dB<br />

ACLR, -5 MHz 32.47 dB 32.72 dB<br />

ACLR, -10 MHz 44.24 dB 44.66 dB<br />

Simulati<strong>on</strong> Model Created from DUT Hardware Agrees with<br />

DUT-in-the-Simulati<strong>on</strong> Path Results. Use Model to Re-Work <strong>System</strong><br />

<strong>Design</strong> in Simulati<strong>on</strong><br />

Asia EEsof Spring Technology Forum Page 47


Use the Meas-Based Model to Re-Iterate<br />

the <strong>System</strong> <strong>Design</strong> to Meet Specificati<strong>on</strong>s<br />

Modified Verilog-A Mixer Subnetwork<br />

And PA Requirements to Re-Iterate <strong>System</strong> <strong>Design</strong><br />

Model Created from DUT<br />

Comp<strong>on</strong>ent Hardware<br />

Asia EEsof Spring Technology Forum Page 48


Rapid <strong>Design</strong> Iterati<strong>on</strong>: Final <strong>System</strong> <strong>Design</strong> ACLR<br />

Performance Meets Specificati<strong>on</strong>s<br />

Meets +24 dBm Output<br />

Power Specificati<strong>on</strong><br />

Meets ACLR Specificati<strong>on</strong>s<br />

at 5 & 10 MHz Offsets<br />

Asia EEsof Spring Technology Forum Page 49


Final <strong>System</strong> <strong>Design</strong> EVM Performance<br />

Also Now Meets Specificati<strong>on</strong>s<br />

EVM at Output of 1 st Circuit Amplifier, Circuit Pre-Amplifier,<br />

<strong>and</strong> Final Output- meets 17.5% Specificati<strong>on</strong><br />

<strong>System</strong> <strong>Design</strong> was Re-Iterated Immediately After the First Comp<strong>on</strong>ent<br />

DUT Became Available for Testing <strong>and</strong> Integrati<strong>on</strong> Problem Was<br />

Discovered…Helps to Save Time <strong>and</strong> $$$<br />

Asia EEsof Spring Technology Forum Page 50


Summary<br />

• Behavioral modeling, measurement-based modeling, <strong>and</strong><br />

Verilog-A, can be used for model creati<strong>on</strong> <strong>and</strong> IP transport<br />

• C<strong>on</strong>sistent ACLR <strong>and</strong> EVM simulati<strong>on</strong> results were observed<br />

between circuit co-simulati<strong>on</strong>, AVM fast co-simulati<strong>on</strong>, <strong>and</strong><br />

behavioral modeling<br />

• C<strong>on</strong>nected Soluti<strong>on</strong>s DUT-in-the-simulati<strong>on</strong>-path allows<br />

system-level verificati<strong>on</strong> testing to begin earlier to identify<br />

potential system integrati<strong>on</strong> issues with comp<strong>on</strong>ent hardware<br />

• Measurement-based modeling enables models to be created<br />

from DUT hardware to re-work system designs in simulati<strong>on</strong><br />

if integrati<strong>on</strong> issues are found<br />

Asia EEsof Spring Technology Forum Page 51


Appendix


Ag ile nt T e c hno log ie s<br />

Ag ile n t T e c h nolog ie s<br />

Ag ile nt T e c hno log ie s<br />

Agilent Technologies<br />

Other RF Data-Based Behavioral Models<br />

Lo a d P ull<br />

Setup<br />

• Simulati<strong>on</strong> C<strong>on</strong>trol<br />

Comp<strong>on</strong>ents that Create<br />

Structured Data Sets To<br />

Describe Circuit Behavior<br />

• Data Set is used by a Unique<br />

Comp<strong>on</strong>ent to implement<br />

Model Behavior<br />

LoadPullSetup<br />

X5<br />

Freq=1 GHz<br />

Order=10<br />

Pin_Start=-50 _dBm<br />

Pin_Stop=-20 _dBm<br />

Pin_Step=10 _dB<br />

GamAng_Start=-180 _degrees<br />

GamAng_Stop=180 _degrees<br />

GamAng_Step=20 _degrees<br />

GamMag_Start=0.1<br />

GamMag_Stop=0.9<br />

GamMag_Step=0.1<br />

in<br />

in<br />

H1H2<br />

Setup<br />

Am p H1H2_S e tu p<br />

X6<br />

F re q =1.0 G Hz<br />

Order=10<br />

Pin_Start=-50.0 _dBm<br />

Pin_Stop=-20.0 _dBm<br />

Pin_Step=10.0 _dB<br />

out<br />

P2D<br />

Setup<br />

out<br />

Am p lifie rP 2 D _ S e tu p<br />

X1<br />

Filename="p2dfile.p2d"<br />

Order=10<br />

F re q _S ta rt=1.0 G Hz<br />

Freq_Stop=2.0 GHz<br />

Freq_Step=0.1 GHz<br />

Pin_Start=-50.0 _dBm<br />

Pin_Stop=-20.0 _dBm<br />

Pin_Step=10.0 _dB<br />

AmpLoadPull<br />

AMP 2<br />

Da ta s e t="d a ta s e t.d s "<br />

In s tru m e n tID = "X1 "<br />

Am p H1H2<br />

AMP 3<br />

Da ta s e t="d a ta s e t.d s "<br />

G1expr="Vout[1]/Vin[1]"<br />

G2expr="Vout[2]/Vin[1]"<br />

Am p lifie rP 2 D<br />

AMP 1<br />

F re q =1.0 G Hz<br />

P2DFile="p2dfile.p2d"<br />

I<br />

Q<br />

RF<br />

IQ M o d ula to r<br />

Setup<br />

IQ_Mod_Setup<br />

X2<br />

F re q =1.0 G Hz<br />

Order=10<br />

Pin_Start=-40 _dBm<br />

Pin_Stop=10 _dBm<br />

Pin_Step=2 _dB<br />

IQ_Mod_Data<br />

X4<br />

Da ta s e t="d a ta s e t.d s "<br />

F re q =1.0 G Hz<br />

In s tru m e n tID = "X1 "<br />

Asia EEsof Spring Technology Forum Page 53


IQ Modulator Measurement-Based Modeling<br />

Test Setup<br />

Ref: Joel Dunsmore, Greg Jue, <strong>and</strong> John Kikuchi,<br />

Agilent Technologies,<br />

A Measurement-base Behavioral Model for I/Q RF<br />

Modulators, Microwave Journal, December 2002.<br />

Measurement-Based Model Shows Good<br />

Agreement between Simulated <strong>and</strong> Measured<br />

EVM Comparis<strong>on</strong>s<br />

8<br />

EVM (%)<br />

6<br />

4<br />

2<br />

Simulated<br />

Measured<br />

IQ Simulati<strong>on</strong><br />

Model File<br />

0<br />

0.14<br />

0.18<br />

0.22<br />

0.26<br />

0.30<br />

0.34<br />

IQ Input Voltage (V)<br />

0.38<br />

This is a custom applicati<strong>on</strong> of C<strong>on</strong>nected Soluti<strong>on</strong>s, <strong>and</strong> shows it’s flexibility in<br />

applicati<strong>on</strong>s such as creating measurement-based simulati<strong>on</strong> models<br />

Asia EEsof Spring Technology Forum Page 54


Additi<strong>on</strong>al Literature<br />

Applicati<strong>on</strong> Note 1482: Importing <strong>System</strong>C <strong>Design</strong>s into Advanced<br />

<strong>Design</strong> <strong>System</strong><br />

Applicati<strong>on</strong> Note 1394: C<strong>on</strong>nected Simulati<strong>on</strong> <strong>and</strong> Test Soluti<strong>on</strong>s<br />

Using the Advanced <strong>Design</strong> <strong>System</strong>.<br />

Applicati<strong>on</strong> Note 1471: RF/IF-to-Digital C<strong>on</strong>nected Soluti<strong>on</strong>s Bit Error<br />

Rate <strong>using</strong> the Advanced <strong>Design</strong> <strong>System</strong>.<br />

Asia EEsof Spring Technology Forum Page 55


Demo: <strong>ADS</strong> Simulati<strong>on</strong> with 89600 VSA SW<br />

(click <strong>on</strong> each VSA display in slide show mode)<br />

Asia EEsof Spring Technology Forum Page 56


For more informati<strong>on</strong> about<br />

Agilent EEsof EDA, visit:<br />

www.agilent.com/find/eesof<br />

Agilent Email Updates<br />

www.agilent.com/find/emailupdates<br />

Get the latest informati<strong>on</strong> <strong>on</strong> the<br />

products <strong>and</strong> applicati<strong>on</strong>s you select.<br />

Agilent Direct<br />

www.agilent.com/find/agilentdirect<br />

Quickly choose <strong>and</strong> use your test<br />

equipment soluti<strong>on</strong>s with c<strong>on</strong>fidence.<br />

www.agilent.com<br />

For more informati<strong>on</strong> <strong>on</strong> Agilent Technologies’<br />

products, applicati<strong>on</strong>s or services, please<br />

c<strong>on</strong>tact your local Agilent office. The<br />

complete list is available at:<br />

www.agilent.com/find/c<strong>on</strong>tactus<br />

Americas<br />

Canada (877) 894-4414<br />

Latin America 305 269 7500<br />

United States (800) 829-4444<br />

Asia Pacific<br />

Australia 1 800 629 485<br />

China 800 810 0189<br />

H<strong>on</strong>g K<strong>on</strong>g 800 938 693<br />

India 1 800 112 929<br />

Japan 0120 (421) 345<br />

Korea 080 769 0800<br />

Malaysia 1 800 888 848<br />

Singapore 1 800 375 8100<br />

Taiwan 0800 047 866<br />

Thail<strong>and</strong> 1 800 226 008<br />

Europe & Middle East<br />

Austria 0820 87 44 11<br />

Belgium 32 (0) 2 404 93 40<br />

Denmark 45 70 13 15 15<br />

Finl<strong>and</strong> 358 (0) 10 855 2100<br />

France 0825 010 700*<br />

*0.125 €/minute<br />

Germany 01805 24 6333**<br />

**0.14 €/minute<br />

Irel<strong>and</strong> 1890 924 204<br />

Israel 972-3-9288-504/544<br />

Italy 39 02 92 60 8484<br />

Netherl<strong>and</strong>s 31 (0) 20 547 2111<br />

Spain 34 (91) 631 3300<br />

Sweden 0200-88 22 55<br />

Switzerl<strong>and</strong> 0800 80 53 53<br />

United Kingdom 44 (0) 118 9276201<br />

Other European Countries:<br />

www.agilent.com/find/c<strong>on</strong>tactus<br />

Revised: March 27, 2008<br />

Product specificati<strong>on</strong>s <strong>and</strong> descripti<strong>on</strong>s<br />

in this document subject to change<br />

without notice.<br />

© Agilent Technologies, Inc. 2008

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!