Presentation on System-Level Design and Verification using ADS ...
Presentation on System-Level Design and Verification using ADS ...
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Agilent EEsof EDA<br />
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<strong>System</strong>-<strong>Level</strong> <strong>Design</strong> & Verificati<strong>on</strong> Using<br />
<strong>ADS</strong> Behavioral Modeling
<strong>Design</strong> & Verificati<strong>on</strong> Flow<br />
<strong>System</strong><br />
Definiti<strong>on</strong><br />
EM<br />
Circuit/RFIC<br />
<strong>Design</strong><br />
Baseb<strong>and</strong><br />
Tape Out<br />
<strong>System</strong><br />
Integrati<strong>on</strong><br />
<strong>System</strong><br />
Verificati<strong>on</strong><br />
Asia EEsof Spring Technology Forum Page 2
End-to-End <strong>System</strong> Verificati<strong>on</strong><br />
Reducing Integrati<strong>on</strong> Risks from <strong>Design</strong> to the End Product<br />
Wireless Pre-<br />
C<strong>on</strong>figured Templates<br />
EM<br />
Tape Out<br />
<strong>System</strong><br />
Definiti<strong>on</strong><br />
Circuit/RFIC<br />
<strong>Design</strong><br />
<strong>System</strong><br />
Integrati<strong>on</strong><br />
<strong>System</strong><br />
Verificati<strong>on</strong><br />
Baseb<strong>and</strong><br />
Verify HW <strong>System</strong><br />
Performance as<br />
So<strong>on</strong> As Possible<br />
<strong>System</strong><br />
<strong>Design</strong><br />
Co-Simulati<strong>on</strong> <strong>and</strong><br />
Modeling Technology<br />
Predictive<br />
Measurement<br />
Algorithms<br />
• RF/Baseb<strong>and</strong> integrati<strong>on</strong> can be a major bottleneck !!<br />
• Verify as so<strong>on</strong> as possible in both simulati<strong>on</strong> <strong>and</strong> test<br />
• C<strong>on</strong>sistent measurement algorithms from definiti<strong>on</strong> to<br />
verificati<strong>on</strong> testing for more predictive design<br />
• <strong>System</strong> metrics- EVM, BER, BLER (as opposed to CW<br />
measurements)<br />
• <strong>System</strong>-level verificati<strong>on</strong> begins before entire system is<br />
available<br />
• Create measurement-based simulati<strong>on</strong> models to re-iterate<br />
design in simulati<strong>on</strong>, if needed<br />
Asia EEsof Spring Technology Forum Page 3
<strong>ADS</strong> Top-Down <strong>Design</strong> Flow<br />
Bottom-Up Verificati<strong>on</strong><br />
<strong>System</strong>-<strong>Level</strong><br />
Circuit-<strong>Level</strong><br />
Transistor-<strong>Level</strong><br />
Hardware-<strong>Level</strong><br />
Asia EEsof Spring Technology Forum Page 4
Co-Simulati<strong>on</strong> with Agilent Ptolemy<br />
Asia EEsof Spring Technology Forum Page 5
<strong>ADS</strong> <strong>System</strong>-<strong>Level</strong> Modeling<br />
Amplifier<br />
from Schematic <strong>Design</strong><br />
OR<br />
from Measurements<br />
Behavioral Model<br />
Populated from<br />
Simulati<strong>on</strong>s or<br />
Measurements<br />
Amplifier HW<br />
Asia EEsof Spring Technology Forum Page 6
Benefits of <strong>System</strong>-<strong>Level</strong> Modeling<br />
<strong>Design</strong> Flow Timeline<br />
<strong>System</strong><br />
Definiti<strong>on</strong><br />
Circuit/RFIC<br />
<strong>Design</strong><br />
<strong>System</strong><br />
Integrati<strong>on</strong><br />
<strong>System</strong><br />
Verificati<strong>on</strong><br />
<strong>Design</strong> Specs Partiti<strong>on</strong>ed<br />
Circuits are<br />
<strong>Design</strong>ed<br />
Circuits Works OK in<br />
<strong>System</strong> Simulati<strong>on</strong><br />
Remaining HW Becomes Available<br />
<strong>and</strong> <strong>System</strong>-<strong>Level</strong> Testing Finally<br />
Begins…Integrati<strong>on</strong> Problem<br />
Found…Re-work <strong>Design</strong> in<br />
Simulati<strong>on</strong> or <strong>on</strong> the Testbench?<br />
4 m<strong>on</strong>ths later?.. 6 m<strong>on</strong>ths later?<br />
Comp<strong>on</strong>ent DUT HW<br />
Becomes Available<br />
This Paper Will Show How to Identify Potential <strong>System</strong> Integrati<strong>on</strong> Issues Earlier<br />
in the <strong>Design</strong> Cycle <strong>and</strong> How to Create Behavioral Models from Hardware to Re-Work<br />
<strong>Design</strong>s in Simulati<strong>on</strong><br />
Asia EEsof Spring Technology Forum Page 7
Applying <strong>System</strong>-<strong>Level</strong> Modeling<br />
in a <strong>Design</strong> Flow<br />
<strong>Design</strong> Flow Timeline<br />
<strong>System</strong><br />
Definiti<strong>on</strong><br />
Circuit/RFIC<br />
<strong>Design</strong><br />
<strong>System</strong><br />
Integrati<strong>on</strong><br />
<strong>System</strong><br />
Verificati<strong>on</strong><br />
Re-Work<br />
<strong>Design</strong> in<br />
Simulati<strong>on</strong><br />
OR<br />
Evaluate<br />
IP Re-Use of<br />
Existing HW<br />
Speed Simulati<strong>on</strong> by<br />
Encapsulating IP in<br />
Data Model<br />
Behavioral<br />
Model from<br />
Simulati<strong>on</strong><br />
Verify End-to-End<br />
<strong>System</strong>-<strong>Level</strong><br />
Performance with<br />
Comp<strong>on</strong>ent HW<br />
Behavioral<br />
Model from<br />
Measurements<br />
Provide Simulati<strong>on</strong><br />
Models to Others<br />
Amplifier Circuit <strong>Design</strong><br />
Create Simulati<strong>on</strong> Model from DUT Hardware to Re-work <strong>System</strong> <strong>Design</strong> in Simulati<strong>on</strong><br />
Amplifier<br />
DUT HW<br />
Asia EEsof Spring Technology Forum Page 8
Where <strong>System</strong>-<strong>Level</strong> Modeling Fits In…<br />
<strong>System</strong> Modeling:<br />
Comp<strong>on</strong>ent Model, not<br />
Device Model<br />
Created from Simulati<strong>on</strong><br />
Schematic or<br />
Measurements<br />
Use to Improve<br />
Simulati<strong>on</strong> Speed After<br />
Circuit <strong>Design</strong> is<br />
Complete<br />
Use to Re-Work <strong>Design</strong>s<br />
In Simulati<strong>on</strong> After Fab<br />
Use to Provide Simulati<strong>on</strong><br />
Models of Final HW to<br />
Others<br />
Asia EEsof Spring Technology Forum Page 9
Case Study:<br />
Transmitter <strong>Design</strong> Example
<strong>System</strong> Definiti<strong>on</strong>:<br />
Put Together Top <strong>Level</strong> <strong>Design</strong><br />
EM<br />
<strong>System</strong><br />
Definiti<strong>on</strong><br />
Circuit/RFIC<br />
<strong>Design</strong><br />
• Interpret <strong>System</strong> <strong>Design</strong> Specificati<strong>on</strong>s<br />
• Put Together Top-<strong>Level</strong> <strong>Design</strong> with<br />
Parameterized Behavioral Elements<br />
Tape Out<br />
<strong>System</strong><br />
Integrati<strong>on</strong><br />
Baseb<strong>and</strong><br />
• Partiti<strong>on</strong> <strong>Design</strong> Requirements for Circuits<br />
<strong>System</strong><br />
Verificati<strong>on</strong><br />
Asia EEsof Spring Technology Forum Page 11
<strong>Design</strong> Specificati<strong>on</strong>s for<br />
Example Transmitter <strong>Design</strong><br />
WCDMA:<br />
• Output Power= +24 dBm min. at 1950 MHz<br />
• ACLR = 33 dB or better at +/- 5 MHz Offset<br />
• ACLR =43 dB or better at +/- 10 MHz Offset<br />
• EVM= 17.5% or Less<br />
Asia EEsof Spring Technology Forum Page 12
Put Together Top-<strong>Level</strong> <strong>Design</strong> with RF<br />
Parametric Behavioral Models<br />
Specify LO Phase Noise vs. Frequency Offset<br />
Specify Amplifier Gain,<br />
P1dB, TOI…<br />
Asia EEsof Spring Technology Forum Page 13
Perform Simulati<strong>on</strong> <strong>and</strong> Verify ACLR <strong>Design</strong><br />
Performance<br />
Meets +24 dBm Output<br />
Power Specificati<strong>on</strong><br />
Meets ACLR Specificati<strong>on</strong>s<br />
at 5 & 10 MHz Offsets<br />
Asia EEsof Spring Technology Forum Page 14
Perform Simulati<strong>on</strong> <strong>and</strong> Verify EVM <strong>Design</strong><br />
Performance<br />
EVM at Output of 1 st Behavioral Amplifier, Behavioral Pre-Amplifier,<br />
<strong>and</strong> Final Output- meets 17.5% Specificati<strong>on</strong><br />
Top-<strong>Level</strong> <strong>Design</strong> Meets <strong>System</strong>-<strong>Level</strong> <strong>Design</strong> Specificati<strong>on</strong>s<br />
Asia EEsof Spring Technology Forum Page 15
Circuit/RFIC <strong>Design</strong>:<br />
RF Circuit <strong>and</strong> Baseb<strong>and</strong> <strong>Design</strong>s<br />
<strong>System</strong><br />
Definiti<strong>on</strong><br />
• <strong>Design</strong> Transistor-<strong>Level</strong> Circuits or Re-Use<br />
Existing Circuit <strong>Design</strong>s<br />
EM<br />
Tape Out<br />
Circuit/RFIC<br />
<strong>Design</strong><br />
<strong>System</strong><br />
Integrati<strong>on</strong><br />
Baseb<strong>and</strong><br />
• <strong>Design</strong> Fixed-Point or Floating-Point<br />
Baseb<strong>and</strong> Secti<strong>on</strong>s<br />
• Verify that Top-<strong>Level</strong> <strong>Design</strong> Still Meets<br />
Specificati<strong>on</strong>s with Circuit <strong>and</strong> Baseb<strong>and</strong> <strong>Design</strong>s<br />
<strong>System</strong><br />
Verificati<strong>on</strong><br />
• Use Automatic Verificati<strong>on</strong> Modeling (AVM) to<br />
Enhance <strong>System</strong> Simulati<strong>on</strong> Speed<br />
Asia EEsof Spring Technology Forum Page 16
Insert Circuit <strong>Design</strong>s <strong>and</strong> Fixed Point FIR<br />
11-Bit Fixed-Point FIR<br />
IF Amplifier Circuit <strong>Design</strong><br />
RF Pre-Amplifier Circuit <strong>Design</strong><br />
Asia EEsof Spring Technology Forum Page 17
Verify ACLR <strong>Design</strong> Performance<br />
Meets +24 dBm Output<br />
Power Specificati<strong>on</strong><br />
Meets ACLR Specificati<strong>on</strong>s<br />
at 5 & 10 MHz Offsets<br />
Asia EEsof Spring Technology Forum Page 18
Verify EVM <strong>Design</strong> Performance<br />
EVM at Signal Source Output is<br />
Degraded by the Fixed-Point FIR<br />
Effects of 11-Bit<br />
Fixed-Point FIR<br />
EVM at Output of 1 st Circuit Amplifier,<br />
Circuit Pre-Amplifier,<br />
<strong>and</strong> Final Output- meets 17.5% Specificati<strong>on</strong><br />
Top-<strong>Level</strong> <strong>Design</strong> Still Meets Specificati<strong>on</strong>s with RF Circuits<br />
<strong>and</strong> Fixed-Point Baseb<strong>and</strong> <strong>Design</strong><br />
…Now Use AVM to Enhance <strong>System</strong> Simulati<strong>on</strong> Speed<br />
Asia EEsof Spring Technology Forum Page 19
Automatic Verificati<strong>on</strong> Modeling (AVM)<br />
New simulati<strong>on</strong> technology based <strong>on</strong> static n<strong>on</strong>-linear behavior of<br />
circuits<br />
Intended for fast co-simulati<strong>on</strong> from Agilent Ptolemy- not for use in A/RF<br />
schematic window al<strong>on</strong>e<br />
Automatic characterizati<strong>on</strong> when Agilent Ptolemy simulati<strong>on</strong> is launched<br />
Re-use previous characterizati<strong>on</strong> data for additi<strong>on</strong>al speed improvements<br />
Asia EEsof Spring Technology Forum Page 20
Use AVM to Enhance Simulati<strong>on</strong> Speed<br />
(fast co-simulati<strong>on</strong>)<br />
Q<br />
I<br />
Mod<br />
FIR<br />
RF_ModFIR<br />
R1<br />
PowerAmp_sub_evm<br />
X5<br />
EnvOutShort<br />
O1<br />
Characterizati<strong>on</strong> (time=0)<br />
Port<br />
P1<br />
Num=1<br />
Normal Co-simulati<strong>on</strong><br />
BJT_NPN<br />
BJT3<br />
Envelope<br />
BJT_NPN<br />
BJT2<br />
BJT_NPN<br />
BJT1 BJT_NPN<br />
BJT4<br />
Port<br />
P2<br />
Num=2<br />
Port<br />
P1<br />
Num=1<br />
V_1T<strong>on</strong>e<br />
SRC1<br />
HB<br />
BJ T_NPN<br />
BJ T3<br />
BJT_NPN<br />
BJT2<br />
BJ T_NPN<br />
BJ T1 BJ T_NPN<br />
BJ T4<br />
Port<br />
P2<br />
Num=2<br />
Fast Cosim<br />
Validati<strong>on</strong><br />
Vout = F(|Vin+Nin|)*exp(j*H*Ph(Vin+Nin))<br />
Ma g<br />
.DS<br />
1<br />
Ph 2<br />
Port V_Noise<br />
P1<br />
SRC1<br />
Fast Cosim<br />
_FIR<br />
Xopt<br />
_NL<br />
X1<br />
Port<br />
P2<br />
Asia EEsof Spring Technology Forum Page 21
Setup Circuit Envelope C<strong>on</strong>troller for AVM<br />
Asia EEsof Spring Technology Forum Page 22
Comparis<strong>on</strong>: Circuit Co-Sim <strong>and</strong> AVM<br />
Good Agreement Between AVM Simulati<strong>on</strong> Results <strong>and</strong> Circuit<br />
Co-Simulati<strong>on</strong>…Use AVM for Further <strong>System</strong>-<strong>Level</strong> Simulati<strong>on</strong>s<br />
Asia EEsof Spring Technology Forum Page 23
<strong>System</strong> Integrati<strong>on</strong>:<br />
RF Behavioral Model, Verilog HDL, Verilog-A<br />
<strong>System</strong><br />
Definiti<strong>on</strong><br />
• Circuit <strong>Design</strong>s are Complete- Encapsulate IP in<br />
Behavioral Model to Share Model with Colleagues<br />
EM<br />
Circuit/RFIC<br />
<strong>Design</strong><br />
• Integrate Verilog HDL FIR Root-Raised-Cosine Filter<br />
Tape Out<br />
<strong>System</strong><br />
Integrati<strong>on</strong><br />
Baseb<strong>and</strong><br />
• Integrate Verilog-A Mixer Circuit <strong>Design</strong><br />
<strong>System</strong><br />
Verificati<strong>on</strong><br />
Asia EEsof Spring Technology Forum Page 24
Extracting the AmplifierP2D Model from<br />
the Pre-Amplifier Circuit <strong>Design</strong><br />
Specify Frequency Sweep<br />
Characteristics<br />
Specify Power Sweep<br />
Characteristics<br />
Asia EEsof Spring Technology Forum Page 25
Example of AmplifierP2D Model<br />
Small Signal Two-Port<br />
S-Parameter Data<br />
Amplifie rP 2D<br />
AMP 1<br />
Freq=850 Mhz<br />
P2DFile="amp.p2d"<br />
Power-Dependent<br />
S-Parameter Data<br />
At Each Frequency<br />
Asia EEsof Spring Technology Forum Page 26
Compare Gain & Phase of Extracted<br />
Behavioral Model to Circuit <strong>Design</strong><br />
Asia EEsof Spring Technology Forum Page 27
Replace Circuit <strong>Design</strong> with Behavioral Model to<br />
Verify Modulated Performance<br />
Asia EEsof Spring Technology Forum Page 28
Circuit & AVM Co-Sim, <strong>and</strong> Behavioral Model<br />
Behavioral Model Accurately Represents Circuit <strong>Design</strong> Performance<br />
… Can Now Provide a Simulati<strong>on</strong> Model to Colleagues<br />
Asia EEsof Spring Technology Forum Page 29
Replace Fixed-Point FIR Filter with Verilog HDL Code<br />
to Co-Simulate with NCSim<br />
Verilog HDL<br />
Filter <strong>Design</strong><br />
Asia EEsof Spring Technology Forum Page 30
Replace Behavioral Mixer with Verilog-A<br />
Mixer Subnetwork<br />
Verilog-A<br />
Mixer <strong>Design</strong><br />
Asia EEsof Spring Technology Forum Page 31
ACLR Performance of Final <strong>Design</strong> with Verilog HDL<br />
Filter <strong>and</strong> Verilog-A Mixer <strong>Design</strong><br />
Meets +24 dBm Output<br />
Power Specificati<strong>on</strong><br />
Meets ACLR Specificati<strong>on</strong>s<br />
at 5 & 10 MHz Offsets<br />
Note: Simulati<strong>on</strong> used <strong>on</strong>e HDL filter co-simulati<strong>on</strong> <strong>and</strong> <strong>on</strong>e fixed-point behavioral filter<br />
Asia EEsof Spring Technology Forum Page 32
EVM Performance of Final <strong>Design</strong> with Verilog HDL<br />
Filter <strong>and</strong> Verilog-A Mixer <strong>Design</strong><br />
EVM at Output of 1 st Circuit Amplifier, Circuit Pre-Amplifier,<br />
<strong>and</strong> Final Output- meets 17.5% Specificati<strong>on</strong><br />
<strong>System</strong> <strong>Design</strong> Still Meets Specificati<strong>on</strong>s with Verilog HDL Digital<br />
Filter <strong>and</strong> Verilog-A Mixer <strong>Design</strong>…Integrati<strong>on</strong> Complete<br />
Note: Simulati<strong>on</strong> used <strong>on</strong>e HDL filter co-simulati<strong>on</strong> <strong>and</strong> <strong>on</strong>e fixed-point behavioral filter<br />
Asia EEsof Spring Technology Forum Page 33
<strong>System</strong> Verificati<strong>on</strong>:<br />
Start <strong>System</strong>-<strong>Level</strong> Testing with Comp<strong>on</strong>ent Hardware<br />
<strong>System</strong><br />
Definiti<strong>on</strong><br />
• Comp<strong>on</strong>ent Hardware Available, but Remaining<br />
Hardware is Still Missing<br />
EM<br />
Tape Out<br />
Circuit/RFIC<br />
<strong>Design</strong><br />
<strong>System</strong><br />
Integrati<strong>on</strong><br />
Baseb<strong>and</strong><br />
• Use Hardware DUT-in-the-Simulati<strong>on</strong> Path to<br />
Test Comp<strong>on</strong>ent at a <strong>System</strong>-<strong>Level</strong><br />
• If Integrati<strong>on</strong> Problem is Identified, then Create<br />
a Simulati<strong>on</strong> Model from Hardware DUT to Modify<br />
<strong>System</strong> <strong>Design</strong> in Simulati<strong>on</strong><br />
<strong>System</strong><br />
Verificati<strong>on</strong><br />
Asia EEsof Spring Technology Forum Page 34
Begin <strong>System</strong>-<strong>Level</strong> Verificati<strong>on</strong> Testing <strong>on</strong><br />
Hardware Amplifier Comp<strong>on</strong>ent<br />
Amplifier DUT<br />
ESG Sig. Gen.<br />
Signal Analyzers<br />
HW Avail.<br />
for Test<br />
<strong>Design</strong> Modeled in <strong>ADS</strong><br />
Find <strong>and</strong> Fix Issues Early in the <strong>Design</strong> Process-Reduce <strong>System</strong><br />
Integrati<strong>on</strong> Risk<br />
Asia EEsof Spring Technology Forum Page 35
Insert HW DUT in the Simulati<strong>on</strong> Path:<br />
Download to ESG Signal Generator<br />
Download Simulated I <strong>and</strong> Q to<br />
E4438C ESG Arbitrary Waveform Generator<br />
Asia EEsof Spring Technology Forum Page 36
Picture of C<strong>on</strong>nected Soluti<strong>on</strong>s Test Setup<br />
Power Meter,<br />
DC Supply<br />
E4440A PSA<br />
E4438C ESG<br />
89640 VSA<br />
Laptop with <strong>ADS</strong> 2003C<br />
E8358A PNA<br />
Asia EEsof Spring Technology Forum Page 37
Picture of Test Signal Downloaded from <strong>ADS</strong> to ESG<br />
(input to DUT)<br />
Spectral Re-growth from<br />
Verilog-A Mixer <strong>and</strong> IF<br />
Amplifier Circuit <strong>Design</strong><br />
Effects of 11-Bit<br />
Fixed-Point FIR<br />
Note that this is a system-level test signal which reflects the<br />
simulated design impairments at the input of the DUT<br />
Asia EEsof Spring Technology Forum Page 38
Measured vs. Simulated Results at<br />
Amplifier Output<br />
Measured<br />
Simulated<br />
Main Ch. Power 13.22 dBm 14.67 dBm<br />
% EVM 4.54 % 4.32 %<br />
ACLR, +10 MHz 44.57 dB 44.44 dB<br />
ACLR, +5 MHz 33.63 dB 34.43 dB<br />
ACLR, -5 MHz 33.4 dB 34.26 dB<br />
ACLR, -10 MHz 43.8 dB 44.33 dB<br />
DUT Comp<strong>on</strong>ent Meets Specificati<strong>on</strong>s, but Has Less Gain Than<br />
Expected…What is the Impact to the Overall <strong>System</strong> Performance?<br />
Asia EEsof Spring Technology Forum Page 39
Access Impact <strong>on</strong> <strong>System</strong> Performance:<br />
Read DUT Output from VSA into Simulati<strong>on</strong><br />
to Run End-to-End <strong>System</strong> Analysis<br />
Read Measured DUT Signal<br />
from 89640 VSA into <strong>ADS</strong><br />
Asia EEsof Spring Technology Forum Page 40
New Predicted <strong>System</strong> Performance with<br />
HW DUT in the Simulati<strong>on</strong> Path<br />
Original New Predicted w/<br />
Simulated DUT-in-Simulati<strong>on</strong>-Path<br />
Main Ch. Power 24.87 dBm 23.71 dBm<br />
% EVM 4.54 % 4.71 %<br />
ACLR, +10 MHz 44.67 dB 44.54 dB<br />
ACLR, +5 MHz 33.41 dB 32.66 dB<br />
ACLR, -5 MHz 33.21 dB 32.47 dB<br />
ACLR, -10 MHz 44.57 dB 44.24 dB<br />
<strong>System</strong> Integrati<strong>on</strong> Problem Found…<strong>System</strong> Will Not Meet<br />
Specificati<strong>on</strong>s With Comp<strong>on</strong>ent Hardware<br />
…Create Simulati<strong>on</strong> Model From DUT Hardware to Re-Work <strong>System</strong><br />
<strong>Design</strong> in Simulati<strong>on</strong><br />
Asia EEsof Spring Technology Forum Page 41
Create Simulati<strong>on</strong> Model of Amplifier DUT<br />
to Re-Work <strong>Design</strong> in Simulati<strong>on</strong><br />
Select PNA.<br />
Enter power range.<br />
Select measurement.<br />
Select Amplifier Model.<br />
Click ‘Measure.’<br />
Asia EEsof Spring Technology Forum Page 42
C<strong>on</strong>nected Soluti<strong>on</strong>sTest Setup <strong>and</strong><br />
Characterizati<strong>on</strong> Parameters<br />
PNA Measurement Parameters<br />
• Center Frequency = 1.95 GHz<br />
• Frequency Span = 40 MHz<br />
• 201 Frequency Points<br />
• RF Power Swept from –15 dBm to<br />
+ 7 dBm in 1 dB Steps<br />
• Port 1 Power Set to -5 dBm for Calibrati<strong>on</strong><br />
• E8358A PNA (300 kHz- 9 GHz) Used<br />
Asia EEsof Spring Technology Forum Page 43
Compare Simulated vs. Measured ACLR for<br />
Meas-Based Amplifier Model<br />
• <strong>ADS</strong> Signal Downloaded to E4438C ESG<br />
• ESG Amplitude Calibrated for Cable Loss<br />
• Measured vs. Simulated Results Compared<br />
at Various RF Power <strong>Level</strong>s<br />
• ACLR Measurements Made with E4440A PSA (top)<br />
• EVM Measurements Made with 89640 VSA (left)<br />
Asia EEsof Spring Technology Forum Page 44
Compare Sim. vs. Meas. Main Channel Power <strong>and</strong> EVM<br />
for Meas-Based Amplifier Model<br />
• <strong>ADS</strong> Signal Downloaded to E4438C ESG<br />
• ESG Amplitude Calibrated for Cable Loss<br />
• Measured vs. Simulated Results Compared<br />
at Various RF Power <strong>Level</strong>s<br />
• Power Measurements Made with E4440A PSA (top)<br />
• EVM Measurements Made with 89640 VSA (left)<br />
Asia EEsof Spring Technology Forum Page 45
Include the Effects of Residual EVM<br />
<strong>on</strong> Meas-Based Model Evaluati<strong>on</strong><br />
Downloading the <strong>ADS</strong> Signal to the E4438C results in a residual EVM of approximately 1.22% @ 0<br />
dBm, Measured with the 89640 VSA<br />
RSS’ing the 1.22% residual EVM with the model simulati<strong>on</strong> results show improved agreement<br />
between simulated <strong>and</strong> measured results (e.g. EVM_RSS= sqrt(EVM_simulated^2 + 1.22^2) to<br />
reflect test equipment characteristics<br />
Asia EEsof Spring Technology Forum Page 46
Meas-Based Model Reflects<br />
HW DUT in the Simulati<strong>on</strong> Path<br />
Predicted w/<br />
DUT-in-Simulati<strong>on</strong>-Path<br />
Meas-Based<br />
Model<br />
Main Ch. Power 23.71 dBm 23.62 dBm<br />
% EVM 4.71 % 4.59%<br />
ACLR, +10 MHz 44.54 dB 44.75 dB<br />
ACLR, +5 MHz 32.66 dB 32.94 dB<br />
ACLR, -5 MHz 32.47 dB 32.72 dB<br />
ACLR, -10 MHz 44.24 dB 44.66 dB<br />
Simulati<strong>on</strong> Model Created from DUT Hardware Agrees with<br />
DUT-in-the-Simulati<strong>on</strong> Path Results. Use Model to Re-Work <strong>System</strong><br />
<strong>Design</strong> in Simulati<strong>on</strong><br />
Asia EEsof Spring Technology Forum Page 47
Use the Meas-Based Model to Re-Iterate<br />
the <strong>System</strong> <strong>Design</strong> to Meet Specificati<strong>on</strong>s<br />
Modified Verilog-A Mixer Subnetwork<br />
And PA Requirements to Re-Iterate <strong>System</strong> <strong>Design</strong><br />
Model Created from DUT<br />
Comp<strong>on</strong>ent Hardware<br />
Asia EEsof Spring Technology Forum Page 48
Rapid <strong>Design</strong> Iterati<strong>on</strong>: Final <strong>System</strong> <strong>Design</strong> ACLR<br />
Performance Meets Specificati<strong>on</strong>s<br />
Meets +24 dBm Output<br />
Power Specificati<strong>on</strong><br />
Meets ACLR Specificati<strong>on</strong>s<br />
at 5 & 10 MHz Offsets<br />
Asia EEsof Spring Technology Forum Page 49
Final <strong>System</strong> <strong>Design</strong> EVM Performance<br />
Also Now Meets Specificati<strong>on</strong>s<br />
EVM at Output of 1 st Circuit Amplifier, Circuit Pre-Amplifier,<br />
<strong>and</strong> Final Output- meets 17.5% Specificati<strong>on</strong><br />
<strong>System</strong> <strong>Design</strong> was Re-Iterated Immediately After the First Comp<strong>on</strong>ent<br />
DUT Became Available for Testing <strong>and</strong> Integrati<strong>on</strong> Problem Was<br />
Discovered…Helps to Save Time <strong>and</strong> $$$<br />
Asia EEsof Spring Technology Forum Page 50
Summary<br />
• Behavioral modeling, measurement-based modeling, <strong>and</strong><br />
Verilog-A, can be used for model creati<strong>on</strong> <strong>and</strong> IP transport<br />
• C<strong>on</strong>sistent ACLR <strong>and</strong> EVM simulati<strong>on</strong> results were observed<br />
between circuit co-simulati<strong>on</strong>, AVM fast co-simulati<strong>on</strong>, <strong>and</strong><br />
behavioral modeling<br />
• C<strong>on</strong>nected Soluti<strong>on</strong>s DUT-in-the-simulati<strong>on</strong>-path allows<br />
system-level verificati<strong>on</strong> testing to begin earlier to identify<br />
potential system integrati<strong>on</strong> issues with comp<strong>on</strong>ent hardware<br />
• Measurement-based modeling enables models to be created<br />
from DUT hardware to re-work system designs in simulati<strong>on</strong><br />
if integrati<strong>on</strong> issues are found<br />
Asia EEsof Spring Technology Forum Page 51
Appendix
Ag ile nt T e c hno log ie s<br />
Ag ile n t T e c h nolog ie s<br />
Ag ile nt T e c hno log ie s<br />
Agilent Technologies<br />
Other RF Data-Based Behavioral Models<br />
Lo a d P ull<br />
Setup<br />
• Simulati<strong>on</strong> C<strong>on</strong>trol<br />
Comp<strong>on</strong>ents that Create<br />
Structured Data Sets To<br />
Describe Circuit Behavior<br />
• Data Set is used by a Unique<br />
Comp<strong>on</strong>ent to implement<br />
Model Behavior<br />
LoadPullSetup<br />
X5<br />
Freq=1 GHz<br />
Order=10<br />
Pin_Start=-50 _dBm<br />
Pin_Stop=-20 _dBm<br />
Pin_Step=10 _dB<br />
GamAng_Start=-180 _degrees<br />
GamAng_Stop=180 _degrees<br />
GamAng_Step=20 _degrees<br />
GamMag_Start=0.1<br />
GamMag_Stop=0.9<br />
GamMag_Step=0.1<br />
in<br />
in<br />
H1H2<br />
Setup<br />
Am p H1H2_S e tu p<br />
X6<br />
F re q =1.0 G Hz<br />
Order=10<br />
Pin_Start=-50.0 _dBm<br />
Pin_Stop=-20.0 _dBm<br />
Pin_Step=10.0 _dB<br />
out<br />
P2D<br />
Setup<br />
out<br />
Am p lifie rP 2 D _ S e tu p<br />
X1<br />
Filename="p2dfile.p2d"<br />
Order=10<br />
F re q _S ta rt=1.0 G Hz<br />
Freq_Stop=2.0 GHz<br />
Freq_Step=0.1 GHz<br />
Pin_Start=-50.0 _dBm<br />
Pin_Stop=-20.0 _dBm<br />
Pin_Step=10.0 _dB<br />
AmpLoadPull<br />
AMP 2<br />
Da ta s e t="d a ta s e t.d s "<br />
In s tru m e n tID = "X1 "<br />
Am p H1H2<br />
AMP 3<br />
Da ta s e t="d a ta s e t.d s "<br />
G1expr="Vout[1]/Vin[1]"<br />
G2expr="Vout[2]/Vin[1]"<br />
Am p lifie rP 2 D<br />
AMP 1<br />
F re q =1.0 G Hz<br />
P2DFile="p2dfile.p2d"<br />
I<br />
Q<br />
RF<br />
IQ M o d ula to r<br />
Setup<br />
IQ_Mod_Setup<br />
X2<br />
F re q =1.0 G Hz<br />
Order=10<br />
Pin_Start=-40 _dBm<br />
Pin_Stop=10 _dBm<br />
Pin_Step=2 _dB<br />
IQ_Mod_Data<br />
X4<br />
Da ta s e t="d a ta s e t.d s "<br />
F re q =1.0 G Hz<br />
In s tru m e n tID = "X1 "<br />
Asia EEsof Spring Technology Forum Page 53
IQ Modulator Measurement-Based Modeling<br />
Test Setup<br />
Ref: Joel Dunsmore, Greg Jue, <strong>and</strong> John Kikuchi,<br />
Agilent Technologies,<br />
A Measurement-base Behavioral Model for I/Q RF<br />
Modulators, Microwave Journal, December 2002.<br />
Measurement-Based Model Shows Good<br />
Agreement between Simulated <strong>and</strong> Measured<br />
EVM Comparis<strong>on</strong>s<br />
8<br />
EVM (%)<br />
6<br />
4<br />
2<br />
Simulated<br />
Measured<br />
IQ Simulati<strong>on</strong><br />
Model File<br />
0<br />
0.14<br />
0.18<br />
0.22<br />
0.26<br />
0.30<br />
0.34<br />
IQ Input Voltage (V)<br />
0.38<br />
This is a custom applicati<strong>on</strong> of C<strong>on</strong>nected Soluti<strong>on</strong>s, <strong>and</strong> shows it’s flexibility in<br />
applicati<strong>on</strong>s such as creating measurement-based simulati<strong>on</strong> models<br />
Asia EEsof Spring Technology Forum Page 54
Additi<strong>on</strong>al Literature<br />
Applicati<strong>on</strong> Note 1482: Importing <strong>System</strong>C <strong>Design</strong>s into Advanced<br />
<strong>Design</strong> <strong>System</strong><br />
Applicati<strong>on</strong> Note 1394: C<strong>on</strong>nected Simulati<strong>on</strong> <strong>and</strong> Test Soluti<strong>on</strong>s<br />
Using the Advanced <strong>Design</strong> <strong>System</strong>.<br />
Applicati<strong>on</strong> Note 1471: RF/IF-to-Digital C<strong>on</strong>nected Soluti<strong>on</strong>s Bit Error<br />
Rate <strong>using</strong> the Advanced <strong>Design</strong> <strong>System</strong>.<br />
Asia EEsof Spring Technology Forum Page 55
Demo: <strong>ADS</strong> Simulati<strong>on</strong> with 89600 VSA SW<br />
(click <strong>on</strong> each VSA display in slide show mode)<br />
Asia EEsof Spring Technology Forum Page 56
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