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Disorder-Enhanced Imaging with Spatially Controlled Light

Disorder-Enhanced Imaging with Spatially Controlled Light

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<strong>Disorder</strong>ed zinc oxide layers 45<br />

strongly position dependent, it is better to adopt an effective refractive index to<br />

characterize the material.<br />

The effective refractive index n e of a strongly scattering material can be found<br />

by measuring the angular resolved transmission of light.[15] In the diffusion approximation,<br />

the angular resolved transmission probability P (µ e ) is equal to[16]<br />

( ) 2 (<br />

P (µ e ) ne 1 + R<br />

=<br />

µ e n 0 1 − R + 3 )<br />

2 µ [1 − R(µ)] , (3.3)<br />

where µ = cos θ and µ e = cos θ e are the projections of the incident angle θ and<br />

the transmitted angle θ e perpendicular to the sample surface. The specific and<br />

angle averaged reflectivity at the surface, R(µ) and R, are directly calculated<br />

from the Fresnel coefficients. These reflectivities solely depend on the refractive<br />

index contrast n e /n 0 between the interior and the exterior of the sample and<br />

the polarization. An experimentally acquired P (µ e ) for a fixed polarization can<br />

therefore be used to determine the refractive index contrast.<br />

We use a broadband angle-dependent light scattering setup equivalent to the<br />

apparatus that is described in Ref. [17]. The setup is placed in transmission<br />

mode to measure the angular resolved transmission through our ZnO samples.<br />

The sample is illuminated by a supercontinuum light source, which enables a measurement<br />

of the effective refractive index over a wavelength range from 500 nm<br />

up to 900 nm.<br />

The experimental results are shown in Fig. 3.3. In panel a we see the spectrally<br />

resolved transmission as function of the outgoing angle θ e . This data is<br />

the p-polarized transmission averaged over 6 measurements on different sample<br />

positions. We plotted P (µ e )/µ e for a wavelength of 532 nm in panel b. By fitting<br />

this data <strong>with</strong> the refractive index contrast as the only free parameter, we find<br />

n e = 1.34. We repeated this procedure for all measured wavelengths to determine<br />

the spectral dependence of n e , which is shown in panel c. The gray area denotes<br />

the error that we estimated by comparing the fits to the data for different values<br />

of the refractive index.<br />

Transport mean free path<br />

In heterogeneous structures light is scattered as it propagates. The average distance<br />

light travels before it completely looses direction is defined as the transport<br />

mean free path l. In our samples that consist of isotropic scatterers, the transport<br />

mean free path is equal to the scattering mean free path. The amount of<br />

unscattered transmitted light reduces as e −L/l , where L is the layer thickness.<br />

Therefore, a sample <strong>with</strong> a thickness of at least a few times the mean free path<br />

is optically thick and opaque.<br />

The transport mean free path can be obtained from a measurement of the<br />

total diffusive transmission T as function of the layer thickness L. The total<br />

transmission is inversely proportional to[18]<br />

1<br />

T = L + z e1 + z e2<br />

l + z e1<br />

, (3.4)

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