2013 - Zemax
2013 - Zemax
2013 - Zemax
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Release Notes<br />
Our most feature-packed <strong>Zemax</strong> version ever.<br />
Complete listing of all new features in all editions of <strong>Zemax</strong> 13<br />
General Features: IE EE SE<br />
A new capability, LightningTrace, has been added. This patent-pending technology is capable of<br />
modeling illumination systems hundreds of times faster than conventional ray-tracing methods<br />
Non-Sequential ray-tracing is generally 20-30% faster than previous systems. The biggest<br />
performance gains are found with more complex systems.<br />
Optimization: IE EE SE<br />
Sequential MF 'favorite operands' option allows user-defined favorite operands to be added at the<br />
top of a sequential merit function<br />
NSC Merit Function Tool builds merit functions for most common requirements automatically<br />
NSC Bitmap Merit Function allows a bitmap file to be used as an optimization target<br />
NSC Auto Roadway Merit Function builds a merit function to optimize roadway lamps to pass the<br />
CIE 140-2000 specifications<br />
NSRW & NSTW operands added to support the Roadway Merit Function tool<br />
NSLT LightningTrace operand allows LightningTrace results to be used in optimization<br />
XENC & XENF support max distance argument<br />
NSDD & NSDE calculate relative flux (normalized to peak) on each pixel<br />
NSDE computes Color Rendering Index (CRI) & Correlated Color Temperature (CCT) on Detector<br />
Color objects<br />
NSTR threads faster on multi-core machines<br />
IMAE supports wave argument<br />
Surfaces and Objects: IE EE SE<br />
Grid GRIN sequential surface allows 3D refractive index data to be read from an ASCII text file<br />
All PartLink, AssemblyLink, Imported, STL and <strong>Zemax</strong> Part Designer objects are now<br />
grouped under the 'CAD Part' or 'CAD Assembly' naming convention<br />
Creo® Parametric® (formerly Pro/E) parts can be used with <strong>Zemax</strong><br />
Creo Parametric Assemblies can be used with <strong>Zemax</strong><br />
Optical properties assigned by <strong>Zemax</strong> to SolidWorks® and Autodesk® Inventor® Parts &<br />
Assemblies can be saved back to the original CAD file using Edit…Save CAD Assembly/Part on<br />
the Non-Sequential Component Editor Toolbar<br />
CAD Part: Autodesk Inventor now supports multi-configuration files<br />
Jones matrix supported in SE<br />
A new 'data' surface has been added. This is a dummy surface that provides up to 240 extra data<br />
values to a subsequently defined user-defined surface (UDS). The data surface must be placed<br />
immediately before the UDS and up to 20 such surfaces defined sequentially may be used by a<br />
single UDS. The purpose of this surface is to allow a large set of user-definable values to be<br />
parametrically controlled and optimized, such as grids of data points. A new FIXED_DATA4 UDS<br />
DLL structure has also been added to support this capability.<br />
Analyses: IE EE SE<br />
RSMx Viewer supports false color plots to make low-intensity regions easier to see.<br />
Detector color measures spectral power distribution<br />
Source spectrum plot displays CRI of rays on detector<br />
RSM Ray generator supports enhanced settings to provide more detailed control of the rays<br />
generated<br />
ZRD spectral power distribution plots as bar chart<br />
Ray database indicates whether ray underwent waveshift<br />
Polar plot scatter viewer added to show 2D scatter functions<br />
An astigmatic Gaussian POP beam definition has been added<br />
Physical Optics now supports sampling up to 16384 in the 64-bit version of <strong>Zemax</strong><br />
A Zernike vs. field analysis plot allows a specified range of Zernike coefficients to be plotted as a<br />
function of field.
function of field.<br />
Tools: IE EE SE<br />
The Field Dialog can now compute the required number of field points using the equal-areas rule<br />
Thermal analysis is now supported for Q-type aspheres<br />
The Merit Function Editor now supports the ability to insert .MF files anywhere in the merit<br />
function<br />
ZPL and Extensions: IE EE SE<br />
ZPL POP keyword supports user-definable CFG file<br />
ZPL SOLVEBEFORESTOP keyword enables ZPL solves to be placed prior to the stop surface.<br />
ZPL SURP & SETNSCPROPERTY keywords support built-in BSDF scatter function<br />
ZPL NSLT keyword and DDE dataitem NSCLightningTrace added to provide automatic control of<br />
the nnew LightningTrace feature<br />
MODIFYSETTINGS control have been added for:<br />
Surface sag: sampling and surface settings<br />
Image simulation: apply fixed apertures, use RI, and flip image settings<br />
Detector viewer: output image file setting<br />
Huygens MTF: all settings<br />
Huygens MTF vs. Field: all settings<br />
Huygens through focus MTF: all settings<br />
FFT through focus MTF: all settings<br />
Universal plot 1D: all settings<br />
Universal plot 2D: all settings<br />
<strong>Zemax</strong> Part Designer: IE EE SE<br />
Parameterize and constrain sketches supported<br />
New sketch arc tool<br />
Explicit definition of points and curves<br />
Overlay bitmap in sketch mode<br />
Additional input validation<br />
Math functions: SINE, COSI, TANG, ASIN, ACOS, ATAN, SQRT<br />
Bugs Fixed:<br />
GENC could report incorrect results on surfaces with steep angles of incidence<br />
Extremely high-angle rays could find the wrong intercept point on Even-aspheric surfaces<br />
The “Use Relative Illumination” switch in Image Simulation remained active in afocal mode even<br />
though RI cannot be computed for an afocal system<br />
For coherent systems, phase reversal was not accounted for in the ZRD when using Pixel<br />
Interpolation.