2012 - Zemax

New in Zemax 12: The IE Version
Our most feature-packed version ever with exclusive,
breakthrough capabilities!
We have a whole new edition, Zemax 12 IE, that lets you work directly with SolidWorks parts, Radiant Source
Models and much more. Get full details.
New Major Feat ures in Zemax 12 IE:
PartLink for SolidWorks
Built- In Radiant Source Model Library and Ray Generator
ReverseRadiance Reverse Ray Tracing
Source Illumination Maps
Script Objects and Script Object Editor
Advanced Path Analysis
Complete listing of all new features in all editions of Zemax 12
New General Feat ures: SE EE IE
Gaussian Quadrature selection of wavelengths on wavelength dialog.
Gaussian Quadrature default merit functions operate with annular obscured pupils.
Features that support BMP and JPG format image files support PNG format files as
well.
The Schott glass catalog has been updated by the vendor

The CVI Melles Griot lens catalog has been updated by the vendor
The Hoya glass catalog has been updated by the vendor
The Optimax test plate list has been updated by the vendor
A Source Illumination Map feature projects one or more RSMX/IESNA/Eulumdat
sources onto a distant plane and displays a true color image of the illumination
pattern formed
New RSMX/IESNA/Eulumdat RSM viewers
RSMX/IESNA/Eulumdat Directivity plots
Spectrum Plots display the relative intensity vs. wavelength for a defined spectral
distribution.
Radiant Source Model viewer lets you see the actual source image from any angle
in full color
CIE 1931/1976 Color Chart feature
New Sequent ial Surf ace Types: SE EE IE
New binary optic 4 surface added to provide up to 20 different radial zones, each of
which supports the capability of the Binary Optic 2 surface.
Q- type (Forbes) aspherics now support conic terms.
A new sequential Slide Surface has been added. This surface imports a PNG, BMP
or JPG file and uses the variable transmission to attenuate the beam. The feature
can be used to model reticles or arbitrary apodization filter.
New Analysis Feat ures: SE EE IE
The Geometric Encircled Energy feature is multithreaded for faster computation
speed.
The Sag Table feature reports additional data on the maximum slope deviation, and
RMS slope and sag deviations as well. This data is important for the
manufacturability of aspheric surfaces.
The Image Simulation feature supports a "Use Relative Illumination" checkbox which
optionally disables the consideration of RI. Previously, RI was always considered.
The polarization pupil map text listing now lists the orientation angle of the
polarization ellipse.
The diffraction encircled energy plot now supports user defined image deltas when
using the FFT PSF.
A glass Dispersion vs. Wavelength plot has been added.
A Light Source Analysis feature is now under the Image Simulation group of features
that created an image based upon tracing a list of rays in .DAT or .SDF files. This
adds the capability to use Source File data with purely sequential optical systems.

A new CAD file Part Viewer has been added so that CAD objects may be viewed
prior to loading.
New NSC Feat ures: SE EE IE
Diffraction grating objects now split rays by order for both reflected and transmitted
light.
Objects may now ignore rays 'upon launch', which is very helpful for eliminating
geometry errors when rays originate close to a geometry object.
New 'named filters' allows filters to be given meaningful names and stored.
New ~ and $ path filters with # wild card added.
Layout plots use path filters, and the spacebar can be used to change filters.
Odd asphere lenses may now be converted from sequential to NSC mode using
Tools. Convert to NSC.
New PartLink for SolidWorks lets you load and modify SolidWorks part files from
within the Zemax environment.
Built- in Radiant Source Model library and Ray Generator
ReverseRadiance traces rays from a screen back to the Radiant Source Model
to compute screen intensity variance.
A new "Advanced Path Analysis" feature groups rays from a ZRD file according to
the path the rays took through the system. Rays that took the same path, in terms of
the order in which different objects were interacted with, are summed so the total flux
in each path can be determined. This feature also may automatically generate path
filters so the groups of rays may be studied separately.
A new 'script object' and associated Script Object Editor, has been added to allow
parametric objects to be built from operations on primitive objects.
New ZPL Feat ures: SE EE IE
MODIFY SETTINGS now supports all options on the Relative Illumination feature.
MODIFY SETTINGS now supports all options on the Polarization Pupil Map.
New Ext ension Feat ures: SE EE IE
MODIFY SETTINGS now supports all options on the Polarization Pupil Map.
MODIFY SETTINGS now supports all options on the Relative Illumination feature.
REMOVE VARIABLES removes all variables.
Set NSC Solve and Get NSC Solve set and get solve and variable data on NSC
editor values.
New Opt imizat ion Feat ures: SE EE IE

Gaussian Quadrature default merit functions are now supported for obscured pupils.
SDRV has been added to return first and second derivatives of the surface sag in the
tangential and sagittal directions. This is very helpful in controlling aspheric surfaces
during optimization
BFSD has been expanded to support RMS sag deviation and slope deviation data.
This is very helpful in controlling aspheric surfaces during optimization
GENC and GENF now optionally suppresses scaling by the diffraction limit.
CODA has been extended to report the major axis, mir axis, and angle of the
polarization ellipse.
UDOP now supports a user definable timeout setting, to allow complex calculations
more time to complete.
Bugs Fixed:
The NSC Source Gaussian was not correctly accounting for initial phase if the Position parameter was nonzero.
The NSC Source Ellipse was not generating the correct angular distribution when using the Gx and Gy
factors, and the angles were large (Gx or Gy on the order of 2 or less).
Decentered Zernike terms on the grid sag surface were t correctly used in compute the local surface
normal. This bug could cause incorrect ray tracing results.
The text listing of the surface sag plot was inverted top to bottom.
A small change was made to the image sampling spacing in the Huygens PSF and MTF computations to
improve accuracy.