Semiconductor Test Solutions - SAS-Origin

Semiconductor Test Solutions
Debug
Characterization
Production

Leading worldwide provider of test
and measurement equipment and
microelectronic solutions
Aerospace | Defense | Cellular and Broadband Communications | Automated Test Equipment
• Founded in 1937
• 2,700 employees worldwide
• 20+ locations worldwide (Americas, EMEA, APAC)
• IPO executed November 2010

Aeroflex Strengths
Established global footprint
Leading and proprietary technology platforms
More than 150 patents
Strengthen and expand proprietary technologies
Broaden applications for existing technologies
Strong profitability track-record
More than 70 years of innovation
Large and growing end-markets
Diverse, blue-chip customer base
Experienced and deep management team
Complementary portfolio of products

Aeroflex ATS Product Portfolio
RF Modular
Instruments(PXI)
AXIe Instrumentation
& Integrated Systems
RF/Mixed Signal ATE
Solutions
In-Circuit ATE
Spectrum Analyzers
Wireless Test
Analog Signal Generator
LTE Test
Land Mobile Test

Challenges with Current Semiconductor Test Model
• Characterization Test
• Current Characterization solutions are Ad-Hoc
• Limits economies of scale(reuse) among internal groups
• New System development consumes valuable engineering resources
• Instrument companies sell pieces, not solutions
• Rack and Stack solutions may have the functionality, but not the integration
• Cabling nightmare, mainframe slot mismanagement, fragile DUT interface
• ATE companies offer Production solutions for Characterization
• Production Testers are overkill (size & price) for Characterization
• Need flexibility and a wide instrument portfolio in a small footprint
Debug
Characterization
Production
• Production Test
• Semi Companies and Test Houses need cost of test roadmap
• Existing semiconductor test solutions are not tracking Moore’s law
• Proprietary ATE is shortening the Horizon
• Shrinking number of companies limits options
• High end focused architectures & roadmaps limit scalability
• Proprietary architectures do not leverage existing ecosystems

The Aeroflex Semiconductor Test Solution – AX Series
• Scalable, Flexible, Broad Application Coverage, and Exceptional Cost of Test
• Based on Industry Standard instruments which are now widely accepted
• PXI/AXIe will dominate the ATE market in 5 years. Functionality, Cost & Flexibility
• 100’s of available instruments and growing. Digital, MXSL and RF subsystems fully integrated
• Simplifies instrument upgrades and factory support requirements
• Many instrument suppliers, breeding healthy competition for the end users
• Maximum investment protection – System will never become obsolete
• SW Test Executive designed to support Characterization & Production
• Production Environment – Constructed for fast Multisite Test Times, Proven against competition
• Characterization Environment – Tool rich environment to test “ 4 corners” quickly
• Small Footprint
• The Aeroflex Commitment
• Superior Price Model with equivalent/better Test Times
• Deep Technical expertise in the RF and Mixed Signal Market – Technical Advisor
• Ownership of the entire test system, regardless of instrument brands or system composition
• World wide organization with commitment to low MTTR and fast regional response time

AX Series Target Markets
• Subsystems Market is growing as legacy add-ons extend ATE longevity
• Consumer SOC and RF IC’s ASP’s are dropping every 6 months
• RF Microcontrollers are one of the fastest growing IC segments

Semiconductor Test Product Portfolio
New RF PXI products:
•Dual vector port module
•Quad source distributor
•Quad multiplexer
WRX RF PXI Subsystem
•2-16 universal vector ports
•6GHz with modulation
•PXI Studio VSA software
•Supports 3 rd party PXI cards
AX520 System
•5 AXIe slots & 20 PXI slots
•DSP12, DD48, & WRX RF
•Supports 3 rd party AXIe & PXI
New AXIe products:
•System cage controller
•DD48 digital pin card
•DPS12 device power supply
AX500 Subsystem:
•Self contained AXIe system
•Up to 192 digital pins
•Up to 48 device power supplies
•Supports 3 rd party AXIe cards
AX1020 & AX1420 Systems
•10/14 AXIe slots & 20 PXI slots
•DSP12, DD48, & WRX RF
•Supports 3 rd party AXIe & PXI

System Architecture – AX520
AXIe Subsystem
Several chassis slot configurations
Proven, ATE quality Instrument Suite
D48 Channel Pin Card, DPS12, +
Ideal for high-speed and/or high power instruments
• Large form factor
• High power backplane
• Improved cooling
Cabling Bulkhead for routing interconnect to Testhead I/f
Tight Synchronization between Chassis
PXI Subsystem
• 100’s of available instruments
• Industry Proven and Accepted in ATE
• Flexible configuration
• Easily portable Char Production

Chassis Synchronization
• High stability OXCO in PXI-6552 used as master clock
• PFI lines are connected between PXI-6552 and CIF’s
• Used as bi-directional triggers
• Low-delay connection to PXI and AXIe backplane trigger buses
• Digital synchronization module (FIS)
• Digital pattern synchronization
• PMU measurements synchronization
• Fail synchronization
• Connections between chassis
• Bi-directional PFI trigger lines (brown)
• High Stability 10MHz reference clock (black)
• Digital synchronization cable (blue)

AXIe Infrastructure

DPS12 (AXIe) Specifications
12-channel device power supply
Power supply features
– 4-quadrant operations
– 1.2A, +25VDC, -22VDC
– 6-wire connections
– 16-bit resolution
– 250kHz AWG per channel
(1uS update)
– 7 Current Ranges (5uA to 1.2A)
– 5 nA measurement accuracy
– Current Clamps and Alarms
– Channel ganging

DD48 (AXIe) Specifications
Dynamic Digital Subsystem
Features
– 48 high speed DIO channels
– 100/200/400 Mbps (800 muxed) data rates
– 32M vector memory
– 3 unique 1G scan chains
– 32 per pin edge sets
– Driver, comparator, and active load
– Per pin PMU

DD48 – Digital Pin Electronics – Block Diagram

Cage Interface (AXIe) Specifications
Cage Interface for AXIe
Features
– 2.5G PCIe data fabric
– Supports up to 16-slot ATCA Chassis
– 32 Control outputs for load board control
– Built in triggering
8 general purpose triggers
4 star-distributed triggers
Trigger distribution to instrument slots
– Analog bus for in-system instrument calibration
– Active fan control
– I2C interface for DUT control
– Optional digital sync module

Consortium
Mission
To facilitate the rapid, coordinated development of
an open standard based on AdvancedTCA®
that creates a robust ecosystem of
components, products and systems for general
purpose instrumentation and semiconductor
test
Why another modular test standard?
Higher performance, more real estate, more power,
more flexibility
Greater scalability
Integrates easily with PXI and LXI
Significant reduction of development and unit costs
Memberships So Far….
Strategic
Advisory
Aeroflex Incorporated
Agilent Technologies
Giga-tronics Incorporated
Test Evolution Corporation
ADLINK Technology, Inc.
Guzik Technical Enterprises
Tyco Electronics
Leverage existing standards from
AdvancedTCA®, PXI®, LXI® and IVI®

Aeroflex AX Series in Production

RF SUBSYSTEM

WRX RF Subsystem
Multi-Port RF Vector Source & Measurement System
RF Functionality
Parallel Measurement Support
Full Source and Measure Capability
Vector Network Analyzer Capability
Full Modulation Support (Optional)
Two-tone Source Support (Optional)
Noise Sourcing
PXI to AXIe Mixed-Signal
Synchronization
Features
PXI Based – Uses Standard
Components
100 MHz to 6 GHz Frequency Range
90MHz Instantaneous Bandwidth
High Accuracy Source and Measure
IF or RF Digitizer Support
2,4,8,16 Port configurations
Fast Settling PXI RF sources
Universal ports support all features
Blind Mate SMA Connector Interface
7/12/2011
19

A Multi-Standard Solution

PXI Studio Measurement Software Structure
Zigbee

AX Series Software Overview
• Integrated test environment for all
stages of testing
• Multi-site architecture
• Full suite of Development and Debug
tools
• Reusable software modules
• Supports binning, handlers, and
probers

Architected For Multi-Site Production
• Test executive manages parallel operations
– Manages multi-threaded processing
– Supports shared and dedicated
instrumentation
– Optimizes resource management
• MVP drivers
– Pin-map based instrument drivers
– Simplifies multi-site programming through pin
abstraction
• Configurable production Interface displays
up to 16 sites

Program Development
• Test Stand and Visual Studio
– Create and edit test functions and
programs
– Run test programs in a debug
environment
– Mature, widely adopted tools
• Structures code for maximum reuse
• Users can choose how to organize
their tests
Setup routines for all initialization and
power-up tasks
Cleanup routines for all closing and
power-down tasks
Trade off between reusability and test
time
– Test functions for each low level
operation (best reuse)
– Test function for the entire test program
(best test time)

Production Environment
• For production operators
– Runs test programs on the
production floor
– Optimized for high-speed, multisite
operation
• Lot info screen
– Users can enter lot info and
select test programs
• Lot summary display
– Users can view summary of
current lot (e.g. yield, bins, failed
tests)
• Configurable hard/soft binning
• Data Logging
– STDF
– Excel and Text

Aeroflex PXI Studio
For use with the Aeroflex 3000 series modules
Application SW combining VSG and VSA
Simplifies integration while
retaining flexibility
Graphical user interface
for benchtop use
C, VB, .NET API interface
for automated analysis

Example: Complex Analysis
A complex, OFDM pulsed system
Eight times faster than typical bench-top equipment

System Configurations
& Examples

Example AX Series Configurations
Bench-top RF Characterization Solution
• 4 Universal 6GHz Bi-Directional Vector Ports
• 12 Device Power Supplies
• Test Head/DUT Interface
• PXI Studio Software
Pricing starts at $185k
Quad Site Zigbee/Bluetooth Config
• 8 Universal 6GHz Bi-Directional Vector
Ports
• 12 Device Power Supplies
• 96 Digital Channels 200MB
• Test Head/DUT Interface
• PXI Studio Software
Pricing starts at $235k

AX-Series – Primary Configurations
Model Number
Configuration
28 AXIe slot Chassis
- 1024 Digital Pins, 24 DPS Channels
20/40 PXI slot Chassis
AX2820 & 2840 PXI MXI board
Test Head with Manipulator Option
PC, rack mounted, 3U, PCIe MXI
Rack with supporting Infrastructure
ATE Software Suite
10 AXIe slots
- 240 Digital Pins, 24 DPS Channels
20/40 PXI slot chassis
AX1020 & 1040 PXI MXI board
Test Head with Manipulator Option
PC, rack mounted, 3U, PCIe MXI
Rack with supporting Infrastructure
ATE Software Suite
5 AXIe slots
- 144 Digital Pins, 12 DPS Channel
20 PXI slots
AX520 & 540 PXI MXI board
Test Head with Manipulator Option
or Benchtop Configuration
PC, desktop, PCIe MXI
ATE Software Suite
AX500
5 AXIe slots
- 144 Digital Pins, 12 DPS Channel
AXIe chassis with mechanical interface
PC, desktop, PCIe MXI
ATE Software Suite

Aeroflex Offers True Value
• A new, but proven semiconductor test solution based on industry standards
A new vendor choice
• Single integrated platform and subsystems for:
Semiconductor and Module level test
Consumer RF and Mixed Signal
Bench top Characterization and High Volume Production
Instrument Upgrades to existing ATE
• Lower Capital cost and High Throughput
• Broad range of available instruments and growing
• Software Test Executive – interactive & efficient by design
Visual Development & Debug Environment
Interactive Tool Set for Production and Characterization
• Seamless path from Characterization to Production
• Proven test company with 30 years of success
World-wide infrastructure to support a growing business