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Exposure of Photoresists - MicroChemicals

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Development rate (µm/min)<br />

Development rate (µm/min)<br />

16<br />

14<br />

12<br />

10<br />

8<br />

6<br />

4<br />

2<br />

0<br />

16<br />

14<br />

12<br />

10<br />

8<br />

6<br />

4<br />

2<br />

0<br />

AZ ® 1512 HS (1.2 µm)<br />

in AZ ® 826 MIF<br />

0 5 10 15 20 25 30 35 40<br />

<strong>Exposure</strong> time (seconds)<br />

AZ ® 1518 (1.8 µm) in<br />

AZ ® 826 MIF<br />

0 5 10 15 20 25 30 35 40<br />

<strong>Exposure</strong> time (seconds)<br />

The Photo Reaction<br />

Positive and Image Reversal Resists<br />

The photo active compound <strong>of</strong> AZ ® and TI<br />

photoresists belongs to the group <strong>of</strong><br />

diazonaphtho-quinone-sulphonates (DNQ).<br />

Their presence in photoresists reduces the alkaline<br />

solubility by more than one order <strong>of</strong><br />

magnitude (Meyerh<strong>of</strong>er-plot right-hand).<br />

During exposure, the DNQ transforms into a<br />

carboxylic acid, accompanied by the release<br />

<strong>of</strong> nitrogen and the absorption <strong>of</strong> water<br />

(schema overleaf). Thus, the alkaline solubility<br />

increases by several orders <strong>of</strong> magnitude<br />

and is finally more than one order <strong>of</strong> magnitude<br />

higher as compared to pure Novolak.<br />

<strong>MicroChemicals</strong> GmbH - <strong>Exposure</strong> <strong>of</strong> <strong>Photoresists</strong><br />

<strong>Photoresists</strong>, developers, remover, adhesion promoters, etchants, and solvents ...<br />

Phone: +49 731 36080-409 www.microchemicals.eu e-Mail: sales@microchemicals.eu<br />

-4-<br />

Development rate (µm/min)<br />

Development rate (µm/min)<br />

Development rate (µm/min)<br />

20<br />

18<br />

16<br />

14<br />

12<br />

10<br />

8<br />

6<br />

4<br />

2<br />

0<br />

0 5 10 15 20 25 30 35 40<br />

<strong>Exposure</strong> time (seconds)<br />

3,0<br />

2,5<br />

2,0<br />

1,5<br />

1,0<br />

0,5<br />

0,0<br />

0 5 10 15 20 25 30 35 40<br />

<strong>Exposure</strong> time (seconds)<br />

3,5<br />

3,0<br />

2,5<br />

2,0<br />

1,5<br />

1,0<br />

0,5<br />

0,0<br />

dissolution rate (nm/s)<br />

AZ ® 6612 (1.2 µm) in<br />

AZ ® 826 MIF<br />

AZ ® 4533 (3.3 µm) in<br />

AZ ® 826 MIF<br />

AZ ® 4562 (6.2 µm) in<br />

AZ ® 826 MIF<br />

0 5 10 15 20 25 30 35 40<br />

<strong>Exposure</strong> time (seconds)<br />

1000<br />

100<br />

10<br />

1<br />

exposed<br />

unexposed<br />

typical<br />

loadings<br />

0.1<br />

0 5 10 15 20 25 30<br />

DNQ-sulfonate concentration (%)

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