Angular momentum resolved EELS by energy filtered nanobeam ...

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A. Alkauskas et al. Ultramicroscopy 110 (2010) 1081–1086 0.917 eV TEM image spectrum, Sputtered Ag 19.06.2012 Workshop on EELS in materials sciences, Uppsala (S) 10
Energy filter used as a filter (EFTEM) Sample Cross over (chromatic object plane) Image or diff. pattern on the SEA (achromatic object plane) Filter Achromatic image plane Chromatic image plane (spectrum, energy selecting slit) Filtered image or diffraction patern 19.06.2012 Workshop on EELS in materials sciences, Uppsala (S) 11
Page 1 and 2: Simon D. Schneider, Cécile Hébert
Page 3 and 4: ¨ ¨ ¨ ¨ Angular resolved EELS M
Page 5 and 6: Bulk silver prepared by twin jet el
Page 7 and 8: Evolution of the loss function in t
Page 9: ¨ Challenges: ¡ Energy resolution
Page 13 and 14: Energy dispersion is image-couled i
Page 15 and 16: TEM mode NBD mode TEM OLA3 SAA4 0.9
Page 17 and 18: 0 G G/2 Sputtered Ag, 50 nm thick 1
Page 19 and 20: CCD camera Imaging plates Sputtered
Page 21 and 22: 19.06.2012 Workshop on EELS in mate
Page 23 and 24: B. Schaffer et al., Ultramicroscopy
Page 25: Thank you for your attention! 19.06

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