Hardware-in-the-Loop Simulation 101 Introduction to HIL ... - ASAM
Hardware-in-the-Loop Simulation 101 Introduction to HIL ... - ASAM
Hardware-in-the-Loop Simulation 101 Introduction to HIL ... - ASAM
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<strong>Hardware</strong>-<strong>in</strong>-<strong>the</strong>-<strong>Loop</strong> <strong>Simulation</strong> <strong>101</strong><br />
<strong>Introduction</strong> <strong>to</strong> <strong>HIL</strong> Test<strong>in</strong>g<br />
Nicholas Keel<br />
Product Manager – NI VeriStand
Booth # 13000<br />
Your Au<strong>to</strong>motive Test<strong>in</strong>g and <strong>Simulation</strong> Partner<br />
In-Vehicle Test and<br />
Logg<strong>in</strong>g<br />
Rapid Control<br />
Pro<strong>to</strong>typ<strong>in</strong>g<br />
<strong>Hardware</strong>-<strong>in</strong>-<strong>the</strong>-<strong>Loop</strong><br />
<strong>Simulation</strong><br />
Au<strong>to</strong>motive<br />
End of L<strong>in</strong>e Test<br />
Test Cell Measurement<br />
& Control<br />
Au<strong>to</strong>motive<br />
Infota<strong>in</strong>ment Test
Software is Grow<strong>in</strong>g<br />
BMW 7 Series: 70 ECUs<br />
Lexus 460: 100 ECUs
Embedded Control System Test<strong>in</strong>g Challenges<br />
• Increas<strong>in</strong>g application complexity<br />
• Increas<strong>in</strong>g reliability requirements<br />
• Decreas<strong>in</strong>g time-<strong>to</strong>-market<br />
• Reduce development cost<br />
Test<br />
Challenges<br />
Test<br />
Resources
Embedded Control Systems<br />
Disturbance<br />
(load)<br />
Desired<br />
Speed<br />
Mo<strong>to</strong>r<br />
Controller<br />
Mo<strong>to</strong>r<br />
Command<br />
DC Mo<strong>to</strong>r<br />
Mo<strong>to</strong>r<br />
Speed
Test<strong>in</strong>g Embedded Control Systems<br />
System Level Test<strong>in</strong>g<br />
Test System<br />
Test Profile<br />
Logg<strong>in</strong>g/<br />
Analysis<br />
Disturbance<br />
Desired<br />
Speed<br />
Mo<strong>to</strong>r<br />
Controller<br />
Mo<strong>to</strong>r<br />
Command<br />
DC Mo<strong>to</strong>r<br />
Mo<strong>to</strong>r<br />
Speed
Test<strong>in</strong>g Embedded Control Systems<br />
System Level Test<strong>in</strong>g<br />
• What if <strong>the</strong> “DC Mo<strong>to</strong>r” is not available yet<br />
• What if test failures could damage <strong>the</strong> ”DC Mo<strong>to</strong>r”<br />
• What if <strong>the</strong> ”DC Mo<strong>to</strong>r” is very expensive (capital,<br />
ma<strong>in</strong>tenance, operation, facilities)<br />
• What if ”DC Mo<strong>to</strong>r” conditions<br />
are not repeatable<br />
Disturbance<br />
• What if <strong>the</strong>re are numerous<br />
variations of <strong>the</strong> ”DC Mo<strong>to</strong>r”<br />
Mo<strong>to</strong>r<br />
Command<br />
DC Mo<strong>to</strong>r<br />
Measured<br />
Speed
Test<strong>in</strong>g Embedded Control Systems<br />
Component Level Test<strong>in</strong>g<br />
Test System<br />
Test Profile<br />
Logg<strong>in</strong>g/<br />
Analysis<br />
Desired<br />
Speed<br />
Mo<strong>to</strong>r<br />
Controller<br />
Mo<strong>to</strong>r<br />
Command<br />
Mo<strong>to</strong>r<br />
Speed
Component Level Test<strong>in</strong>g Challenges<br />
Test Profile<br />
Test System<br />
Logg<strong>in</strong>g/<br />
Analysis<br />
Mo<strong>to</strong>r<br />
Speed <br />
Disturbance<br />
Desired<br />
Speed<br />
Mo<strong>to</strong>r<br />
Controller<br />
Mo<strong>to</strong>r<br />
Command<br />
Mo<strong>to</strong>r<br />
Speed
HARDWARE-IN-THE-LOOP TESTING
Virtual Reality for your UUT<br />
What does your UUT know about<br />
<strong>the</strong> world around it<br />
UUT<br />
Voltage<br />
Desired<br />
Speed<br />
Mo<strong>to</strong>r<br />
Mo<strong>to</strong>r<br />
Command<br />
Current<br />
TCP<br />
Controller<br />
PWM<br />
Impedance<br />
ENCODER<br />
Measured<br />
Speed<br />
Tim<strong>in</strong>g
Test<strong>in</strong>g Embedded Control Systems<br />
Virtual System Level Test<strong>in</strong>g<br />
Test System<br />
MODEL<br />
Test Profile<br />
Logg<strong>in</strong>g/<br />
Analysis<br />
Desired<br />
Speed<br />
Mo<strong>to</strong>r<br />
Controller<br />
Mo<strong>to</strong>r<br />
Command<br />
Measured<br />
Speed<br />
Stimulus =<br />
MODEL(test profile, UUT response)
What is a Model<br />
k<br />
m<br />
c
System Model<strong>in</strong>g Tools<br />
NI LabVIEW<br />
ITI <strong>Simulation</strong>X<br />
MapleSoft MapleSim<br />
C / C++<br />
The MathWorks, Inc. Simul<strong>in</strong>k ® Software<br />
Esterel SCADE<br />
LMS AmeSim<br />
NI MATRIXx SystemBuild<br />
Simul<strong>in</strong>k® is a registered trademark of The MathWorks, Inc. All o<strong>the</strong>r trademarks are <strong>the</strong><br />
property of <strong>the</strong>ir respective owners.
Reduce Cost & Risk with <strong>HIL</strong> Test<strong>in</strong>g<br />
• Increase reliability and quality<br />
• Better test coverage<br />
• Test repeatability<br />
• Develop more efficiently<br />
• Shorten validation process<br />
• Identify design issues earlier<br />
• Lower cost <strong>to</strong> <strong>in</strong>novate
Process Au<strong>to</strong>mation Creates <strong>HIL</strong> Test System for Aircraft<br />
Arres<strong>to</strong>r Control System us<strong>in</strong>g NI VeriStand<br />
Field Test<strong>in</strong>g (per day) $50k<br />
Previous validation program<br />
(20 days)<br />
Current validation plan with<br />
<strong>HIL</strong> test<strong>in</strong>g (5 days)<br />
$1,000k<br />
$250k<br />
<strong>HIL</strong> Test System Cost $50k<br />
Total Sav<strong>in</strong>g us<strong>in</strong>g <strong>HIL</strong><br />
Test<strong>in</strong>g with Field Test<strong>in</strong>g<br />
$700k<br />
“NI VeriStand’s out-of-<strong>the</strong>-box capabilities made it practical for us <strong>to</strong> develop<br />
a <strong>HIL</strong> test system reduc<strong>in</strong>g our <strong>to</strong>tal test<strong>in</strong>g cost”<br />
– Greg Sussman, Process Au<strong>to</strong>mation
Want <strong>to</strong> learn more...<br />
• Why eng<strong>in</strong>eers choose NI for <strong>the</strong>ir <strong>HIL</strong> test<strong>in</strong>g<br />
• How <strong>to</strong> build a <strong>HIL</strong> test system<br />
• Read about our cus<strong>to</strong>mer successes<br />
• Learn about us<strong>in</strong>g NI VeriStand for <strong>HIL</strong> test<strong>in</strong>g applications<br />
www.ni.com/hil<br />
www.ni.com/veristand
Booth # 13000<br />
Your Au<strong>to</strong>motive Test<strong>in</strong>g and <strong>Simulation</strong> Partner<br />
In-Vehicle Test and<br />
Logg<strong>in</strong>g<br />
Rapid Control<br />
Pro<strong>to</strong>typ<strong>in</strong>g<br />
<strong>Hardware</strong>-<strong>in</strong>-<strong>the</strong>-<strong>Loop</strong><br />
<strong>Simulation</strong><br />
Au<strong>to</strong>motive<br />
End of L<strong>in</strong>e Test<br />
Test Cell Measurement<br />
& Control<br />
Au<strong>to</strong>motive<br />
Infota<strong>in</strong>ment Test
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