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A HIGH EFFICIENCY<br />

CLASS-F POWER AMPLIFIER<br />

DESIGN TECHNIQUE<br />

In this article, a medium power pseudomorphic HEMT device is used in the<br />

design <strong>of</strong> a high efficiency class-F power amplifier (PA) operating at 900 MHz.<br />

The purpose <strong>of</strong> this article is to describe the design procedure <strong>of</strong> a class-F PA with<br />

a very low drain bias voltage (V ds ). The realized PA achieves a peak power-added<br />

efficiency (PAE) <strong>of</strong> 71.4 percent with a 22 dBm output power (P out ) and a 14 dB<br />

power gain (G p ) (2.3 dB compression) at V ds = 3 V and 8 dBm input power (P in ).<br />

A PAE <strong>of</strong> above 60 percent is attained over a frequency range <strong>of</strong> 850 to 970 MHz<br />

(13 percent BW).<br />

High efficiency microwave amplifiers<br />

with low supply voltages are required<br />

for mobile telecommunications services,<br />

such as GSM or DCS1800 systems. Theoretically,<br />

class-F power amplifiers (PA) can<br />

achieve 100 percent drain efficiency by maximally<br />

flattening the voltage and current waveforms<br />

<strong>of</strong> the active device. 1 By increasing the<br />

efficiency <strong>of</strong> the microwave amplifier, the dissipated<br />

power is reduced while the output<br />

power is increased. Therefore, a reduction in<br />

size and weight <strong>of</strong> portable wireless transmitters<br />

is achieved, as well as prolonged battery<br />

life.<br />

Many amplifier modes <strong>of</strong> operations are<br />

available to designers in their quest to improve<br />

efficiency, such as class-F, 2–4 single-ended<br />

class-B, 5 push-pull class-B 6 and harmonic<br />

reaction. 7–8 Although they have different theoretical<br />

backgrounds, the basic principle involved<br />

in increasing their efficiency is the<br />

same, that is minimizing the power dissipation<br />

across the active devices. Here, the class-F operation<br />

is preferred as it <strong>of</strong>fers the possibility<br />

<strong>of</strong> controlling the impedances at a finite num-<br />

ber <strong>of</strong> harmonics. 1 It also provides a high efficiency<br />

and has a simple circuit construction. 9<br />

Though many papers have been published on<br />

class-F PAs, a detailed design procedure is still<br />

needed to aid in practical construction. The<br />

purpose <strong>of</strong> this article is to present a design<br />

procedure for a class-F PA with an example<br />

given at 900 MHz.<br />

DESIGN PARAMETERS AND PROCEDURE<br />

In low bias voltage operation, the knee<br />

voltage in the active device will affect the<br />

PAE. Therefore, the knee voltage is one <strong>of</strong> the<br />

design considerations and leads to the selection<br />

<strong>of</strong> a pseudomorphic high electron mobility<br />

transistor (PHEMT), since the knee voltage<br />

<strong>of</strong> HEMTs is lower than that <strong>of</strong> GaAs<br />

MESFETs. 10 Also, the device manufacturer<br />

S.F. OOI, S. GAO, A. SAMBELL,<br />

D. SMITH AND P. BUTTERWORTH<br />

University <strong>of</strong> Northumbria<br />

Newcastle upon Tyne, UK<br />

Reprinted with permission <strong>of</strong> MICROWAVE JOURNAL ® from the November 2004 issue.<br />

©<br />

2004 Horizon House Publications, Inc.


TABLE I<br />

RF PARAMETERS OBTAINED<br />

FROM DC SIMULATION<br />

USING THE ADS SIMULATOR<br />

V dsmin (V) 0.7<br />

V dsmax (V) 5.5<br />

I dss @ V ds = 3V, V gs = 0V (A) 0.12<br />

I dmax @ V ds = 3V, V gs = 0.6V (A) 0.25<br />

V p @ V ds = 3V (V) –0.8<br />

Gm max @ V ds = 3V, V gs = 0V (S) 0.24<br />

supplies a large-signal device model<br />

for this active device, which allows<br />

better initial models to be built. The<br />

typically stated small-signal S-parameters<br />

and static IV curves are only<br />

applicable for small-signal levels and<br />

therefore do not provide accurate<br />

modeling <strong>of</strong> the device behavior as a<br />

PA. 11 A large-signal device model is<br />

necessary for the accurate simulation<br />

<strong>of</strong> PAs using the harmonic balance<br />

method.<br />

The important design parameters<br />

in PAs are power-added efficiency<br />

(PAE), drain efficiency (η d ) and power<br />

gain (G p ). PAE is defined as the<br />

ratio <strong>of</strong> the additional RF power provided<br />

by the amplifier to the DC<br />

power: 12<br />

PAE P out<br />

–<br />

=<br />

P<br />

P<br />

where P in is the RF input power.<br />

PAE can also be rewritten as<br />

⎛ 1 ⎞<br />

PAE = ηd<br />

1 – () 2<br />

⎝<br />

⎜ Gp<br />

⎠<br />

⎟<br />

where η d is the drain efficiency defined<br />

by<br />

Pout<br />

η d<br />

= () 3<br />

P<br />

V gs0 (t)<br />

V gs cos(ωt )<br />

dc<br />

dc<br />

V gs (t)<br />

in<br />

TECHNICAL FEATURE<br />

I d (t)<br />

I g (t)<br />

V ds (t)<br />

() 1<br />

V ds0 (t)<br />

▲ Fig. 1 The substitute generator technique.<br />

V ds1 cos(ωt + θ 1 )<br />

V ds2 cos(2ωt + θ 2 )<br />

V ds3 cos(3ωt + θ 3 )<br />

and G p is the power gain defined by<br />

The amplifier must also be evaluated<br />

for its stability condition using<br />

large signal S-parameters (LSSP)<br />

over a wide band <strong>of</strong> frequencies. This<br />

measurement gives the distance from<br />

the center <strong>of</strong> the Smith chart to the<br />

nearest output (load) stability circle.<br />

This stability factor is given by 13<br />

µ=<br />

G<br />

p<br />

Pout<br />

= () 4<br />

P<br />

1 – S<br />

2<br />

11<br />

S – S ∆ + S S<br />

22 11 12 21<br />

() 5<br />

where ∆ is the determinant <strong>of</strong> the<br />

scattering matrix.<br />

If µ > 1, the device is unconditionally<br />

stable. This single parameter can<br />

replace the dual Rollet (K > 1) and<br />

auxiliary conditions for determining<br />

unconditional stability. It is noticed<br />

that the active device alone is unstable<br />

over almost the entire frequency<br />

range (low frequency to f max ) due to<br />

its high transconductance. Therefore,<br />

a stabilizing circuit is required to<br />

make sure the circuit is unconditionally<br />

stable from low frequency to f max .<br />

The design starts with DC simulation,<br />

when some useful active device<br />

RF parameters are obtained, as<br />

shown in Table 1. The simulation has<br />

been carried out using the Advanced<br />

<strong>Design</strong> System (ADS) s<strong>of</strong>tware tool.<br />

An extensive large-signal harmonic<br />

balance analysis, based on the “Substitute<br />

Generator Technique,” 14 has<br />

been used to optimize the source and<br />

load impedance at the fundamental<br />

frequency, as well as the load impedances<br />

at the third harmonic, required<br />

for class-F operation. In this method,<br />

two independent generators are used<br />

to force the voltage waveforms (magnitude<br />

and phase)<br />

at the gate and<br />

drain ports <strong>of</strong> the<br />

active device, as<br />

shown in Figure 1.<br />

The phase angles <strong>of</strong><br />

the drain voltage at<br />

the fundamental<br />

frequency (θ 1 ) and<br />

the third harmonic<br />

(θ 3 ) are tuned to<br />

obtain the maximum<br />

PAE, while<br />

the magnitude and<br />

in<br />

phase angle <strong>of</strong> the drain voltage at<br />

the second harmonic are fixed at<br />

zero.<br />

The phase angles <strong>of</strong> the drain voltage<br />

at the fundamental frequency<br />

(θ 1 ) and the third harmonic (θ 3 ) are<br />

tuned to obtain the maximum PAE,<br />

while the magnitude and phase angle<br />

<strong>of</strong> the drain voltage at the second<br />

harmonic are fixed at zero. To obtain<br />

a near square drain voltage, the magnitude<br />

<strong>of</strong> the drain voltage at the<br />

third harmonic should be 1/6 <strong>of</strong> the<br />

magnitude <strong>of</strong> the drain voltage at the<br />

fundamental frequency 14<br />

1<br />

Vds3 = Vds<br />

1<br />

() 6<br />

6<br />

The choice <strong>of</strong> bias circuit is based<br />

on the desired class <strong>of</strong> operation and<br />

power supply requirements <strong>of</strong> the<br />

PA. To fulfill the requirement <strong>of</strong> a<br />

mobile handset, a low drain bias voltage,<br />

V ds = 3 V, is applied in this PA<br />

circuit. Meanwhile, in class-F operation,<br />

the active device is biased in<br />

deep class-AB for a quiescent drain<br />

current value <strong>of</strong> 0.15 I dss ; the gain<br />

problems associated with small signals,<br />

therefore, can be partially overcome.<br />

In addition, a low quiescent<br />

drain current causes a small mean<br />

value <strong>of</strong> I d0 to reduce the dissipation<br />

in the active device. 15 It is advisable<br />

not to bias at class-B because the<br />

small-signal and power gain performance<br />

<strong>of</strong> the amplifiers is drastically<br />

degraded at or very near pinch-<strong>of</strong>f. 5<br />

95 Ω quarter wavelength microstrip<br />

lines are used to isolate the DC voltage<br />

supplies from the RF signals at<br />

the gate and drain. Further RF shorts<br />

are achieved using bypass capacitors<br />

that can provide suitably low impedances<br />

over the desired frequency<br />

range. In this case three bypass capacitors<br />

have been selected, <strong>of</strong> value<br />

C1 = 27 nF, C2 = 100 pF and C3 =<br />

100 pF, as shown in Figure 2. To satisfy<br />

the bypass capacitor application<br />

requirements, the series resonant frequency<br />

(f SR ) and the magnitude <strong>of</strong><br />

the impedance should be evaluated<br />

throughout the desired frequency<br />

range. 16 Figure 3 shows impedance<br />

versus frequency for the three different<br />

values <strong>of</strong> the bypass capacitors<br />

(C1, C2, C3) used in this design.<br />

From this figure it is seen that the f SR<br />

occurs at or close to the desired “bypass<br />

frequency;” therefore, the low<br />

impedance at f SR makes these capaci-


TECHNICAL FEATURE<br />

INPUT<br />

V gs<br />

C3 C2 C1<br />

Lg = 51 mm<br />

C4<br />

≈λ/4<br />

R1<br />

R2<br />

C1<br />

≈λ/4<br />

PHEMT<br />

C5<br />

tors suitable for bypassing applications<br />

from a few megahertz up to approximately<br />

a gigahertz. The input<br />

and output ports are DC blocked by<br />

using C4 = 100 pF and C5 = 10 pF series<br />

capacitors, respectively.<br />

The matching networks are the<br />

crucial parts <strong>of</strong> PAs. An important<br />

consideration in designing PAs using<br />

packaged FET devices is to accurately<br />

determine the package parasitic elements,<br />

which affect the load and<br />

source impedances. The device’s C ds<br />

and all drain and source package parasitic<br />

elements must be included as a<br />

part <strong>of</strong> the total output matching circuit.<br />

11,17–18 Generally, the input<br />

matching circuit transforms the gate<br />

impedance <strong>of</strong> the active device to the<br />

50 Ω source for high power gain,<br />

while the output matching circuit<br />

transforms the drain impedance <strong>of</strong><br />

the active device to a 50 Ω load for<br />

maximum RF output power. For<br />

class-F operation, the output matching<br />

network also acts as a tuning circuit<br />

for the third harmonic. Therefore,<br />

the output matching network<br />

becomes an even more challenging<br />

task. The output matching circuit has<br />

a bandpass topology, which consists<br />

<strong>of</strong> three microstrip lines. The quarter<br />

wavelength short-circuited stub at the<br />

fundamental frequency, which is a<br />

part <strong>of</strong> the drain bias circuit, presents<br />

a low impedance to reflect the second<br />

harmonic back into the drain<br />

while it has no influence on the fundamental<br />

and third harmonic impedances.<br />

Due to the package reactance<br />

at the drain, the second harmonic<br />

load impedance (1.36-j18)Ω has been<br />

optimized to improve performance.<br />

This gives rise to a 2.5 percent improvement<br />

in PAE when compared<br />

with a shorted second harmonic load<br />

impedance (0.001 Ω). To produce a<br />

nearly square wave at the drain, an<br />

open-circuited stub and a series microstrip<br />

line are used to create the<br />

C2<br />

L d = 56 mm<br />

▲ Fig. 2 Circuit diagram <strong>of</strong> the power amplifier.<br />

C3<br />

V ds<br />

OUTPUT<br />

• 2*C1 = 27 pF<br />

• 2*C2 = 100 pF<br />

• 2*C3 = 100 nF<br />

• R1 = 33 Ω<br />

• R2 = 30 Ω<br />

• C4 = 100 pF<br />

• C5 = 10 pF<br />

ALL GRM21 (0805) EXCEPT C3<br />

desired high impedance at the third<br />

harmonic. The output matching network<br />

also includes a 10 pF DC block<br />

capacitor (C5). Table 2 shows the<br />

load impedances with different harmonic<br />

termination at the second and<br />

third harmonics. The simulation results<br />

show that there is an improvement<br />

in PAE <strong>of</strong> more than 5 percent<br />

with the optimum load impedances<br />

(This case) in comparison to the one<br />

with the short circuit at the second<br />

and third harmonics (Case 1), while a<br />

13 percent PAE improvement is obtained<br />

when compared with a 50 Ω<br />

load impedance at the second and<br />

third harmonics (Case 2).<br />

Figure 4 shows the simulated<br />

loadline and associated drain voltage/current<br />

waveforms. These are obtained<br />

using the optimum load impedance<br />

condition for the fundamental<br />

frequency coupled with output<br />

harmonic tuning at the second and<br />

third harmonics. Since the overlapping<br />

area between voltage and current<br />

waveforms is small, it can be deduced<br />

that the power dissipation in<br />

the active device will be small, while<br />

the PAE increases.<br />

The device input is matched to 50<br />

Ω via a classical approach, a three-element<br />

T-network, consisting <strong>of</strong> a<br />

short-circuited stub and two series<br />

microstrip lines. The stabilizing resistors<br />

R1 = 33 Ω and R2 = 30 Ω decrease<br />

the Q <strong>of</strong> the network and<br />

therefore provide a wider bandwidth<br />

<strong>of</strong> input matching. These matching<br />

networks are fabricated using distributed<br />

elements to reduce the insertion<br />

loss. In general, it is advisable to minimize<br />

the number <strong>of</strong> elements, to reduce<br />

power loss, circuit complexity<br />

and parts cost.<br />

It is also very important to include<br />

all component parasitic elements in<br />

the design. Not many component<br />

manufacturers provide the exact parasitic<br />

value <strong>of</strong> passive components<br />

IMPEDANCE (Ω)<br />

20<br />

10<br />

0<br />

0.1<br />

C1 C2 C3<br />

0.3 0.5 0.7 0.9 1.1<br />

FREQUENCY (GHz)<br />

1.3<br />

▲ Fig. 3 Impedance vs. frequency for three<br />

bypass capacitors.<br />

TABLE II<br />

OUTPUT IMPEDANCES WITH DIFFERENT<br />

HARMONIC TERMINATIONS<br />

Z@f o (Ω) Z@2f o (Ω) Z@3f o (Ω)<br />

Case 1 28–j1.5 0.001 0.001<br />

Case 2 28–j1.5 50 50<br />

This case 28–j1.5 1.36–j18 61.9+j158<br />

DRAIN CURRENT (A)<br />

(a)<br />

DRAIN CURRENT (A)<br />

(b)<br />

0.45<br />

0.40<br />

0.35<br />

0.30<br />

0.25<br />

0.20<br />

0.15<br />

0.10<br />

0.05<br />

0<br />

−0.05<br />

0<br />

0.25<br />

0.20<br />

0.15<br />

0.10<br />

0.05<br />

0<br />

LOADLINE<br />

1 2 3 4 5 6 7 8 9 10<br />

DRAIN-SOURCE VOLTAGE (V)<br />

0.2<br />

0.6 1.0 1.4<br />

TIME (ns)<br />

7<br />

6<br />

5<br />

4<br />

3<br />

3<br />

2<br />

1<br />

0<br />

1.8 2.2<br />

DRAIN VOLTAGE (V)<br />

▲ Fig. 4 Simulated loadline (a) and drain<br />

current and voltage waveforms (b) required<br />

for maximum PAE <strong>of</strong> a class-F power<br />

amplifier.<br />

such as vias, SMT capacitors and<br />

SMT resistors, so a fixture is designed<br />

to extract their S-parameters using a<br />

network analyzer.<br />

To add to the stability, a 33 Ω resistor<br />

(R1) is placed in series with a<br />

quarter wavelength shorted stub at<br />

the gate bias network, while another<br />

30 Ω resistor (R2) is placed near the<br />

gate port, as shown in the circuit diagram.<br />

This network greatly enhances


µ<br />

6<br />

5<br />

4<br />

3<br />

2<br />

1<br />

0 1 2 3 4 5 6 7 8 9 10<br />

FREQUENCY (GHz)<br />

▲ Fig. 5 Stability factor vs. frequency.<br />

▲ Fig. 6 The fabricated class-F power<br />

amplifier operating at 900 MHz.<br />

the PA’s stability, which means the PA<br />

circuit becomes stable over the whole<br />

frequency range (2 MHz to 10 GHz),<br />

as shown in Figure 5. The advantages<br />

<strong>of</strong> this network come at a price;<br />

the stabilizing resistors degrade the<br />

performance <strong>of</strong> the circuit at all frequencies,<br />

therefore an appropriate<br />

amount <strong>of</strong> minimum loss resistors<br />

that lead to a borderline stability<br />

where µ reaches 1 are recommended<br />

at the input to the active device. 19 It<br />

is good practice to avoid adding any<br />

stabilizing resistors in the output network<br />

because the amplifier efficiency<br />

will drop drastically with any loss in<br />

the output network.<br />

MEASUREMENT RESULTS<br />

The complete amplifier circuit is<br />

constructed on PCB, RT Duroid 5870<br />

with a dielectric constant <strong>of</strong> 2.33, a<br />

thickness = 1.575 mm and tanδ =<br />

0.0012. The bias networks, active device<br />

and matching networks are confined<br />

within the PCB board (dimension<br />

85 by 50 mm). A photograph <strong>of</strong><br />

the complete PA module is shown in<br />

Figure 6. Three via holes are added<br />

at the active device source to provide<br />

low inductance to ground. The zener<br />

diodes in the drain and gate bias networks<br />

are used to provide additional<br />

protection against transients, reverse<br />

biasing and overvoltage. 20<br />

A measured peak PAE <strong>of</strong> 71.4 percent<br />

with P out = 22 dBm and G p = 14<br />

dB (2.3 dB compression) is achieved<br />

TECHNICAL FEATURE<br />

Pout (dBm), Gp (dB)<br />

30<br />

25<br />

20<br />

15<br />

10<br />

5<br />

0<br />

−15<br />

−10<br />

−5 0<br />

P in (dBm)<br />

80<br />

70<br />

60<br />

50<br />

40<br />

30<br />

20<br />

10<br />

0<br />

10<br />

▲ Fig. 7 Measured PAE, G p and P out as a<br />

function <strong>of</strong> P in .<br />

Gp (dB), Pout (dBm)<br />

27.5<br />

25.0<br />

22.5<br />

20.0<br />

17.5<br />

15.0<br />

12.5<br />

10.0<br />

700<br />

750 800 850<br />

80<br />

70<br />

60<br />

50<br />

40<br />

30<br />

20<br />

10<br />

0<br />

900 950 1000<br />

FREQUENCY (MHz)<br />

▲ Fig. 8 Measured PAE, G p and P out as a<br />

function <strong>of</strong> frequency for P in = 7.5 dBm.<br />

at a low drain voltage V ds = 3 V and<br />

P in = 8 dBm. The measured PAE,<br />

P out and G p performances versus P in<br />

and frequency are shown in Figures<br />

7 and 8, respectively. A PAE above<br />

60 percent is achieved over a frequency<br />

range <strong>of</strong> 850 to 970 MHz (13<br />

percent BW).<br />

CONCLUSION<br />

The design methodology and selection<br />

criterion for a high efficiency<br />

PA operating in the GSM band is<br />

presented in this article. A PAE <strong>of</strong><br />

more than 71 percent with P out = 22<br />

dBm and G p = 14 dB has been obtained<br />

at a very low drain voltage <strong>of</strong> 3<br />

V. From the measurement results, it<br />

can be concluded that efficient PAs<br />

can be obtained through the appropriate<br />

choice <strong>of</strong> active device, operation<br />

mode and optimum load impedance<br />

terminations at the fundamental<br />

frequency, second and third harmonics.<br />

Practical design considerations<br />

such as device (active and passive)<br />

and package parasitic elements also<br />

must be taken into account. This PA<br />

module shows its potential for use in<br />

mobile communication devices since<br />

it is able to achieve a high efficiency<br />

at a very low drain voltage. ■<br />

ACKNOWLEDGMENT<br />

This project is funded by EPSRC,<br />

UK, under grant no. GR/S42538/01.<br />

5<br />

PAE (%)<br />

PAE (%)<br />

Donation <strong>of</strong> the Advanced <strong>Design</strong> Systems<br />

(ADS) s<strong>of</strong>tware tool from Agilent<br />

Technologies is also acknowledged.<br />

References<br />

1. F.H. Raab, “<strong>Class</strong>-F <strong>Power</strong> <strong>Amplifier</strong>s with<br />

Maximally Flat Waveforms,” IEEE Transactions<br />

on Microwave Theory and Techniques,<br />

Vol. 45, No. 11, November 1997,<br />

pp. 2007–2012.<br />

2. C. Duvanaud, S. Dietsche, G. Pataut and J.<br />

Obregon, “High Efficient <strong>Class</strong>-F GaAs<br />

FET <strong>Amplifier</strong>s Operating with Very <strong>Low</strong><br />

Bias Voltages for Use in Mobile Telephones<br />

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and Guided Wave Letters, Vol. 3, No. 8,<br />

August 1993, pp. 268–270.<br />

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IEEE Transactions on Microwave<br />

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December 1986, pp. 1318–1326.<br />

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International Microwave Symposium Digest,<br />

Vol. 1, June 1993, pp. 277–280.<br />

7. T. Nojima, S. Nishiki and K. Chiba, “High<br />

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23, No. 10, May 1987, pp. 512–513.<br />

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pp. 963–966.<br />

9. T.L. Lin, T.H. Liu and Y.H. Kao, “Fabrication<br />

<strong>of</strong> High Efficiency <strong>Power</strong> <strong>Amplifier</strong><br />

Module for Cellular Mobile Phone,” Proceedings<br />

<strong>of</strong> National Science Council, ROC<br />

(A), Physical Science and Engineering, Vol.<br />

20, No. 6, November 1996, pp. 651–659.<br />

10. Y. Takayama, “Considerations for High Efficiency<br />

Operation <strong>of</strong> Microwave Transistor<br />

<strong>Power</strong> <strong>Amplifier</strong>s,” IEICE Transactions<br />

on Electronics, Vol. E80-C, No. 6, June<br />

1997, pp. 726–733.<br />

11. A. Sweet, “MESFET <strong>Power</strong> <strong>Amplifier</strong> <strong>Design</strong>:<br />

Small Signal Approach,” <strong>Design</strong> Seminar,<br />

Agilent Technologies, 2001.<br />

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Circuits, Artech House Inc., Norwood,<br />

MA, 2003.<br />

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Criterion for Linear Two-port Stability<br />

<strong>Using</strong> a Single Geometrically Derived<br />

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<strong>Class</strong>-F HBT <strong>Amplifier</strong>s,” IEEE MTT-S International<br />

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FET <strong>Power</strong> <strong>Amplifier</strong> with Very <strong>Low</strong><br />

Drain Bias for Mobile Communication,”<br />

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TECHNICAL FEATURE<br />

Shirt Fun Ooi received her BEng (Hons)<br />

degree in communication and electronic<br />

engineering from the University <strong>of</strong><br />

Northumbria, UK, in 2003. She is currently<br />

pursuing her PhD degree in microwave<br />

engineering, focusing on RF power amplifiers,<br />

microstrip antennas and active integrated<br />

antennas.<br />

Steven (Shichang) Gao received his PhD<br />

degree in microwave engineering from<br />

Shanghai University, China, in 1999. In 1994,<br />

he joined the China Research Institute <strong>of</strong><br />

Radiowave Propagation, and then the<br />

microstrip antenna group at Shanghai<br />

University as a PhD research student. He was a<br />

post-doctoral research fellow at National<br />

University <strong>of</strong> Singapore (Singapore), a<br />

research fellow at University <strong>of</strong> Birmingham<br />

(UK) and a visiting scientist at Swiss Federal<br />

Institute <strong>of</strong> Technology at Zurich<br />

(Switzerland). He received the URSI Young<br />

Scientist Award from the International Union<br />

<strong>of</strong> Radio Science in 2002. He is currently a<br />

senior lecturer at the University <strong>of</strong><br />

Northumbria, UK. His current interests include<br />

broadband antennas, active integrated<br />

antennas, RF power amplifiers and numerical<br />

methods. He has published over 50 articles in<br />

referred journals and international<br />

conferences.<br />

Alistair Sambell received his BSc and DPhil<br />

degrees in electronics from York University,<br />

England, UK, in 1987 and 2001, respectively.<br />

His doctoral and subsequent post-doctoral<br />

research focused on novel III-V device<br />

structures and solar cells for space<br />

applications. Working at the University <strong>of</strong><br />

Northumbria since 2001, his current research<br />

interests include the design <strong>of</strong> microwave<br />

antennas for road-tolling and similar<br />

applications. He is currently pr<strong>of</strong>essor and<br />

dean at the university’s school <strong>of</strong> engineering<br />

and technology.<br />

David Smith received his BSc and PhD<br />

degrees in electronics from Newcastle<br />

University, England, UK, in 1974 and 1981,<br />

respectively. His doctoral work focused on the<br />

analysis <strong>of</strong> microwave gas discharges. His main<br />

research areas include microwave antenna<br />

design and measurements. He is currently<br />

reader at the university’s school <strong>of</strong> engineering<br />

and technology.<br />

Peter Butterworth received his MSc and<br />

PhD degrees in microwave engineering from<br />

the University <strong>of</strong> Limoges, France, in 2000 and<br />

2003, respectively. He is currently working as a<br />

research associate in the school <strong>of</strong> engineering,<br />

University <strong>of</strong> Northumbria, UK. His research<br />

interests include modeling, design and<br />

measurements <strong>of</strong> microwave nonlinear circuits.

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