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Metrology Assisted Assembly & Automated Inspection - Leica ...

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Extension of <strong>Leica</strong> T-Mac by non-contact sensorNon-contact probes are already used together withconventional CMMs. These devices use specific triangulationsensors and deliver a trigger pulse if the laserbeam is at focus position to the surface point. This triggerpulse would be used for both 6DoF data collection,and to stop the robot movement in process.Extensions of <strong>Leica</strong> T-Mac by a touch trigger sensorTESA (part of the Hexagon <strong>Metrology</strong> group) currentlymanufactures a series of touch trigger probesdirectly related to this application. Overall the technicalenhancement would be the equivalent to thenon-contact sensor, with the only difference beingthat the trigger pulse is generated by surfacecontact and not optically.Multi-sided Machine Control ProbeInstead of just one working surface with reflectorsand marker LED’s the goal would be that a combinationof different frames (up to 4 frames with 7 LED’sper face) could be interchanged. This would create ascaleable solution with options extending from 1 to4 sides.<strong>Leica</strong> T-Probe / <strong>Leica</strong> T-Mac integrated line ScannerConnecting a line scanning device to create a lowprice solution would be useful for many standardapplications, especially in the direction of automatedsurface scanning. This type of sensor could beconnected to a <strong>Leica</strong> T-Mac, or <strong>Leica</strong> T-Probe like itexists already, or it could be used with a multi sidedMachine Control Probe as described above. The integrationshown below allows the scanning head to berotated +/- 60° around the center position for betterlaser line control.Application Specific Measurement Processes 13

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