Douglas Casanova
Douglas Casanova
Douglas Casanova
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COTS Use Issues for DoD Systems‣ Quality (commercial vs. mil)‣ Physics of failure‣ Plasma residue‣ Mechanical weakness‣ Hot carrier damage‣ Gate oxide failure‣ Interconnect current density faults‣ Electromigration‣ Lead-free impacts‣ Reliability‣ Tin whisker failures‣ Solder cracks - configuration control‣ Lack of availability (DMS) of traditionalSnPb finished components‣ Commercial industry is going lead-free‣ Initial versus un-announced changes‣ Design / Process / Packaging materials