Hitachi Spherical Aberration Corrected STEM

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A wide variety of imaging capabilitiesThe HD-2700 allows bright-field (BF), high-angle annular dark-field (HAADF), secondary electron(SE) imaging, and electron diffraction, as well as imaging at 200 kV and 120 kV.An example of catalyst nano-particlesBF imaging modeThe BF <strong>STEM</strong> imaging mode allows imagingof structures on the basis of phase contrast similarto a typical transmission electron microscopeimaging.HAADF imaging modeThe HAADF-<strong>STEM</strong> imaging mode collectshigh-angle scattered electrons with an annulardark-field detector.The image contrast is proportional to theatomic number (Z-contrast image), therefore compositiondependence with respect to the imagecontrast is presented.SE imaging modeSecondary electrons generated from the surfaceand inside of specimen by the incident electronbeam are collected utilizing an SE detectorfor high resolution imaging for surfaces and internalstructures.w/o Cs-corrector, w/ Schottky gun, Std. lens5
High sensitivity and fast EDX* chemical analysisThe HD-2700’s X-ray detection geometry permits a solid angle of 0.3 sr or greater, resulting in highsensitivity EDX analysis for small areas (
Page 3 and 4: Ultra-high resolution imaging using
Page 5: High resolution, high contrast imag
Page 9 and 10: Real-time EELS elemental mapping Hi
Page 11 and 12: HAADF-STEM images of a single quant
Page 13 and 14: 360° specimen rotation holder*, au
Page 15 and 16: ■ Installation site conditions* 1

Hitachi Spherical Aberration Corrected STEM

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