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MIRacle ATR – Fast and Easy IR Sampling - PIKE Technologies

MIRacle ATR – Fast and Easy IR Sampling - PIKE Technologies

MIRacle ATR – Fast and Easy IR Sampling - PIKE Technologies

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P R O D U C T D A T A S H E E T<strong>M<strong>IR</strong>acle</strong> <strong>ATR</strong> –<strong>Fast</strong> <strong>and</strong> <strong>Easy</strong> <strong>IR</strong> <strong>Sampling</strong>The <strong>PIKE</strong> <strong>M<strong>IR</strong>acle</strong> is a universal <strong>ATR</strong> sampling accessory foranalysis of solids, liquids, pastes, gels, <strong>and</strong> intractable materials.In its most popular configuration it is a single reflection <strong>ATR</strong>accessory with high <strong>IR</strong> throughput which makes it ideal forsample identification <strong>and</strong> QA/QC applications. Advanced optionsinclude three reflection <strong>ATR</strong> crystal plates to optimize for lowerconcentration components. Easily changeable crystal plate designprovides analysis of a broad spectrum of sample types whileensuring constant sampling pathlength.Single <strong>and</strong> three reflection <strong>ATR</strong> crystals are available tooptimize general qualitative or quantitative analysis of minorcomponents.F E A T U R E S O F T H E M I R A C L E• Highest <strong>IR</strong> throughput – saving you time <strong>and</strong> improving youranalysis quality• Complete flexibility – add options to your <strong>M<strong>IR</strong>acle</strong> as yoursampling needs change• Highest value – for today’s competitive analytical <strong>and</strong>research needs• Fully configurable – ZnSe, diamond, Ge <strong>and</strong> Si <strong>M<strong>IR</strong>acle</strong>crystal plates• Pinned-in-place, changeable crystal plates – for fast <strong>and</strong>easy sampling optimization• Highest purity, type IIa diamond crystal – will not scratch<strong>and</strong> is chemically inert to acidic or caustic materials• Optional specular reflectance plate – for measurement ofcoatings on reflective surfaces• Choice of pressure clamps – high-pressure, digitalhigh-pressure <strong>and</strong> micrometric sample clamps• <strong>Sampling</strong> options – heating, temperature control, <strong>and</strong> flowthrough plateThick Polymer Sample, using <strong>M<strong>IR</strong>acle</strong> with ZnSe Crystal <strong>and</strong>High-Pressure Clamp – No Sample Preparation.<strong>M<strong>IR</strong>acle</strong> Optical DesignIn the patented <strong>M<strong>IR</strong>acle</strong> optical design the <strong>ATR</strong> crystal focuses the <strong>IR</strong>beam <strong>and</strong> also provides the <strong>ATR</strong> sampling interface. This technologydelivers much higher throughput than competitive products,saves considerable time <strong>and</strong> produces higher quality spectra.<strong>M<strong>IR</strong>acle</strong> – High Throughput <strong>and</strong> Efficient Optical Design<strong>M<strong>IR</strong>acle</strong> – Highest <strong>IR</strong> Throughput <strong>ATR</strong>


<strong>M<strong>IR</strong>acle</strong> Crystal OptionsThe <strong>M<strong>IR</strong>acle</strong> <strong>ATR</strong> accessory is available with 4 different crystaltypes (ZnSe, diamond, Ge, <strong>and</strong> Si) <strong>and</strong> with unique versions ofthese crystal materials.Crystal plates are pinned in place <strong>and</strong> easily changeablewithin seconds with no alignment required. With this flexibility,you can change the crystal type to exactly match your samplingrequirements. For example, diamond is ideal for brittle samplesbecause it will not scratch, whereas, Ge is ideal for carbon-filledsamples because of its high refractive index <strong>and</strong> lower depthof penetration. Three reflection crystal plates provide increasedsensitivity for minor components in liquid or non-rigid materials.An optional liquids retainer <strong>and</strong>volatiles cover set is compatible with allcrystal plates, eliminating the need topurchase flat <strong>and</strong> trough crystal plates.A high-pressure clamp is required foruse with the liquids retainer <strong>and</strong> thevolatiles cover.Liquids Retainer <strong>and</strong>Volatiles Cover set“Faux” Black Pearl with <strong>M<strong>IR</strong>acle</strong> using Diamond <strong>ATR</strong> CrystalBlack Rubber Samples are best run using Ge <strong>ATR</strong> Crystal<strong>M<strong>IR</strong>acle</strong> <strong>ATR</strong> Crystal PlatesTable 1 shows <strong>M<strong>IR</strong>acle</strong> <strong>ATR</strong> crystal characteristics includingrefractive index, spectral range cutoff, pH range <strong>and</strong> hardness forsingle reflection <strong>ATR</strong> crystal plates. Still have questions? Please callas we are pleased to discuss your sampling requirements.Table 1: <strong>M<strong>IR</strong>acle</strong> Crystal Plate SpecificationsRefractive Depth of<strong>M<strong>IR</strong>acle</strong> Hardness Cutoff cm -1 , Index @ Penetration pH RangeCrystal Plate Application kg/mm 2 Spectral Range 1000 cm -1 @ 45°, µ of SampleDiamond/ZnSe Ideal for hard samples, acids or alkaline 5700 525 2.4 2.00 1–14Ge General purpose <strong>and</strong> carbon filled or rubber 550 575 4.0 0.66 1–14Si Excellent for far-<strong>IR</strong> spectral measurement 1150 8900–1500, 475–40 3.4 0.85 1–12ZnSe General purpose <strong>ATR</strong> crystal 120 520 2.4 2.00 5–9<strong>M<strong>IR</strong>acle</strong> Crystal plates are covered by <strong>PIKE</strong> <strong>Technologies</strong> patent numbers 5,965,889 <strong>and</strong> 6,128,075 or are manufactured under license of 5,200,609,5,552,604 <strong>and</strong> 5,703,366.


<strong>M<strong>IR</strong>acle</strong> Pressure Clamp Options<strong>M<strong>IR</strong>acle</strong> pressure clamps are pinned in place <strong>and</strong> easily changeablewithin seconds. A high-pressure clamp is recommended for mostapplications <strong>and</strong> is available in basic <strong>and</strong> digital configurations.The digital version includes a high-pressure clamp <strong>and</strong> the DigitalForce Adapter (DFA) that attaches directly to the clamping assembly.The DFA’s embedded load cell exhibits high linearity, reproducibility,<strong>and</strong> exceptional accuracy. The magnitude of applied force is displayedon an external easy-to-read LCD readout. The digital clampis ideal for applications that require controlled <strong>and</strong> reproduciblepressure. All clamps include tips for hard, soft <strong>and</strong> pellet-shapedsamples. High-pressure clamps are calibrated to deliver over10,000 psi of pressure when used with the single reflectioncrystal plates.Ability to deliver high pressure is very important for achievingspectral quality. In the example below, we demonstrate spectraldifferences for a porous polymer sample measured with themicrometer clamp <strong>and</strong> the high-pressure clamp. Clearly thespectrum obtained using the high-pressure clamp is requiredfor a high quality result.<strong>M<strong>IR</strong>acle</strong> high-pressure clamps utilize a slip-clutch mechanismto prevent excessive pressure from being applied to the crystal.<strong>M<strong>IR</strong>acle</strong> Pressure Clamps arePinned in Place <strong>and</strong> Easily Upgraded<strong>M<strong>IR</strong>acle</strong> Digital ClampIdeal for controlled pressureMax lbs Crystal<strong>M<strong>IR</strong>acle</strong> Clamp Pressures Pressure Diameter, mm PSIHigh-Pressure Clamps 401.8 10,1416.0 913Micrometer Pressure Clamp 81.8 2,0286.0 183Note: All clamps except Micrometer are high-pressure<strong>M<strong>IR</strong>acle</strong> ConfinedSpace Clamp –For instruments withlimited sampling area<strong>M<strong>IR</strong>acle</strong> High-PressureClamp – Ideal forroutine sampling<strong>M<strong>IR</strong>acle</strong> MicrometerClamp – For lowpressure applicationsPorous Polymer Sample Measured Using High <strong>and</strong> Low-Pressure Clamp<strong>M<strong>IR</strong>acle</strong> <strong>Sampling</strong> OptionsThe <strong>M<strong>IR</strong>acle</strong> can be configured with optional resistively heatedcrystal plates using a <strong>PIKE</strong> temperature control module. Digital<strong>and</strong> digital with PC control versions are available. The PC controlmodule includes TempPRO software which provides a graphicaluser interface for temperature control <strong>and</strong> kinetic measurements.<strong>M<strong>IR</strong>acle</strong> <strong>ATR</strong> SummaryThe <strong>M<strong>IR</strong>acle</strong> <strong>ATR</strong> accessory is a high performance FT<strong>IR</strong> samplingtool for solid, liquid, or polymer samples. Easily changeable crystalplates provide optimized spectral data for unique sample types.With options for single or three reflection crystal plates, severalpressure clamp styles <strong>and</strong> heating or cooling, the <strong>M<strong>IR</strong>acle</strong> is ableto address a wide range of FT<strong>IR</strong> sampling applications.<strong>M<strong>IR</strong>acle</strong> with Optional HeatedCrystal Plate <strong>and</strong> <strong>PIKE</strong>Temperature Control ModuleTempPRO software for graphical setup <strong>and</strong> control ofkinetic measurements

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