Agilent 85070E Dielectric Probe Kit 200 MHz to 50 GHz

Calibration Refresh Reduces Drift Errors 1The new automated ElectronicCalibration Refresh feature recalibratesthe system automatically, in seconds,just before each measurement is made.This virtually eliminates cable instabilityand system drift errors. Processes cannow be monitored over long timeperiods, including tests that vary MUTtemperature and pressure over time.How it works:The Agilent Electronic Calibrationmodule (ECal) microwave ports areconnected in line between the probeand the network analyzer test portcable. The ECal module communicationport is connected either to the PC orPNA Series network analyzer runningthe 85070E software. The softwareguides the user through a normal“three standard” calibration, (usuallyopen, short, water), performed at theend of the probe. This calibration isthen transferred to the ECal module.The ECal module remains in lineand a complete ECal calibration isautomatically performed before eachmeasurement. Errors due to test portcable movement are removed by thenew calibration.ECal module connected in lineWater with and without Electronic Calibration RefreshThis measurement shows the effectsof system drift and cable instabilityon a dielectric measurement of waterand the improvement with Electroniccalibration refresh. Both measurementswere made 24 hours after the originalcalibration. The lighter colored, noisier,trace was made before the ElectronicCalibration refresh was turned on.The darker, smoother, trace shows theimprovement made after the ElectronicCalibration refresh was turned on.For systems without an ECal module,a simpler, "one standard" refreshcalibration feature is also available,which can reduce the effects ofsystem drift over time or temperature.After the initial "three standard" probecalibration is performed, the calibrationcan be refreshed at any time with theconnection of a single standard. Anyone of the three calibration standardscan be defined as the refresh standard.1. Not compatible with FieldFox RF analyzers4

New Options Allow You to Configure Kit to Meet Your NeedsNow three probe designs to choose fromPerformance ProbeCombines rugged, high temperature,and frequency performance in aslim design.This probe features rugged,high temperature and frequencyperformance in a slim design, perfectfor your most demanding applications.The probe is sealed on both the probetip and the connector end, which makeit our most rugged probe. The probewithstands a wide –40 ºC to +200 ºCtemperature range, which allowsmeasurements versus frequencyand temperature.The probe can be autoclaved, so itis perfect for applications in the food,medical, and chemical industrieswhere sterilization is a must. Theslim design allows it to fit easily infermentation tanks, chemical reactionchambers, or other equipment withsmall apertures.The small diameter also allows it tobe used with smallest sample sizesof all Agilent’s probes. It is useful formeasuring liquid, semi-solid, as wellas flat surfaced solid materials. ThePerformance Form Probe Kit comescomplete with a calibration short.Frequency range 500 MHz to 50 GHz.2.4mm male connectorPerformance Probe Kit150Borosilicateglass seal1.6 9.52.4 mm maleconnectorHermetically sealed on both ends(all dimensions in mm)Stainless steelT316L bodyNickel platedtungsten centerconductorStainless steelT304L tip5

High temperature probeSurvives corrosive chemicals andhigh temperaturesFrequency range: 200 MHz to 20 GHz.3.5 mm male connector.Rugged in design, this probe featuresa hermetic glass-to-metal seal, whichmakes it resistant to corrosive orabrasive chemicals. The probewithstands a wide –40 ºC to +200 ºCtemperature range, which allowsmeasurements versus frequency andtemperature. The large flange makesit easier to measure flat surfaced solidmaterials, in addition to liquids andsemi-solids. The 3.5 mm aperturehas a larger sensing volume thanour other probes.High Temperature Probe Kit17.4Hole10.2 min.9.0 Mounting flangemax thickness15.5StainlesssteelInconel3.5 mmconnector46.7(1.84)16.8Grip nutM10X1.0 threadAll Dimensions in mm (inches)Glass19.0(0.75)Slim Form ProbeSmaller diameter fits into tight spaces.Frequency range 500 MHz to 50 GHz.2.4 mm male connector.This probe features a slim design, whichallows it to fit easily in fermentationtanks, chemical reaction chambers, orother equipment with small apertures.The slim design also allows it to beused with smaller sample sizes. Bestused for liquids and soft semi-solids.For castable solids, the probe iseconomical enough to be cast into thematerial and left in place. Because ofthe consumable nature of this design,these probes are offered in sets ofthree. The Slim Form probe kit comeswith a sealed Slim Form holder thatadapts 2.2 mm outer diameter to 10 mminner diameter bracket included in thekit as well as commercially available“Midi” sized adapters and bushings.Slim Form Probe measurement to 50 GHzø 2.2 mmFinish, Nickel 100 µ inches200 mm2.4 mm Maleconnector6

Three Cables to Choose FromAccessories20 GHz Flexible CableCable to choose when tempertatureperformance is not critical. SMA femaleconnectors connect to High Temperatureprobe. When connecting to Slim Formprobe, an additional adapter may beneeded (see configuration guide).50 GHz Flexible CableCable to choose for high frequencyapplications. 2.4 mm female connectorsconnect directly to Slim FormPerformance probes.20 GHz High Temperature CableUse with High Temperature orPerformance probes for hightemperature applications from –40 °Cto +200 °C. SMA female connectorsconnect directly to High Temperatureprobe. Adapter included in kitconnects High Temperature Cableto Performance probe.Probe StandThe probe stand has a 13 x 7 inchporcelain base and 24 inch high by0.5 inch diameter metal support. Thisstand works with mounting bracketand ECal holder included in thestandard kit. It is highly recommendedto stabilize measurement setup.Software Menu ItemsFileSave or recall measurement setups orprevious measurement results. Printcopies of the measurement results ina tabular or graphical format.EditCopy the measurement results to theclipboard. Either graph or the tabularlisting can be copied. This allows yourmeasurement results to be pastedinto other applications.ViewSelect the section you want to view.Selections include the toolbar, statusbar, table of the measurement data,and chart of the measurement data.CalibrationSelect the frequency range, numberof points, linear or log sweep.Guided calibration sequence; choiceof calibration materials or userspecified;refresh calibration forsingle standard or ECal; recalibrationversus temperature; automatic refreshon or off.MeasureTrigger a measurement.ChartSelect the format to be displayed onthe chart. Choices include er’, er’’,loss tangent, and Cole-Cole. SetGraticule scale factors or “autoscale”.Select from linear, semi-log, or log-logrepresentations.TableChoose between a tabular formattingof real and imaginary or real and losstangentDisplayDisplay current measurement data;save/display up to 3 memory traces;compare data to reference trace withtrace math. Turn the marker on or off.PreferencesSelect your preference of fonts, colors,and annotations used to plot and listthe measurement data.HelpOn-line help including the productmanual.ToolbarProvides single click access to themost important menu items.7

Performance CharacteristicsSpecifications describe the warrantedperformance over the temperaturerange 0 to 55 °C. Supplementalcharacteristics are intended to provideinformation useful in applying theinstrument, by giving typical butnon-warranted performance parameters.These are denoted as “typical,”“nominal,” or “approximate.”Probe Characteristics TablePerformance Probe Slim Form Probe High Temperature ProbeFrequency Range 500 MHz to 50 GHz 500 MHz to 50GHz 200 MHz to 20 GHz with network analyzer(nominal) Maximum limited by MUT properties Maximum limited by MUT properties(285-j125)GHz (285-j125)GHz 10 MHz to 3 GHz with E4991A Impedance 0.05 tangent > 0.05 tangent > 0.05Not recommended for low loss Not recommended for low loss Not recommended for low loss(loss tangent < 0.5) materials (loss tangent < 0.5) materials (loss tangent < 0.5) materialswith e’ > 5 with e’ > 5 with er’ > 5Accuracy (typical) 1 Dielectric constant, e r’ = e r’ Dielectric constant, e r’ = e r’ Dielectric constant, e r’ = e r’±0.05|e r*|. e r”= e r”±0.05|e r*| ±0.05|e r*|. e r”= e r”±0.05|e r*| ±0.05|e r*|. e r”= e r”±0.05|e r*|1. Practical frequency range, accuracy and resolution depend on properties of the MUT. Value indicates typical accuracy at 23 ±3 °C, not includingeffects of probe contact and cable flexure.2. If the material is not homogeneous, the result is an average value weighted by the intensity of the E-field, which is highest at the center conductorof the probe tip.3. Sample must be as flat as the probe face, which is lapped to ±100 µ inches.4. Measurement repeatability for granular materials is dependent on density variation.8

Configuration GuideChoose one of oursuggested configurationsHigh Temperature Configuration85070E:• Performance Probe Kit, Option 050,or High-Temperature Probe Kit,Option 020• High Temperature Cable, Option 002• Probe Stand, Option 001• USB Security Key, Option UL8Economy Configuration85070E• Slim Form Probe Kit, Option 030• 20 GHz Flexible Cable, Option 022• USB Security Key, Option UL8Rugged High Frequency Configuration85070E:• Performance Probe, Option 050• Probe Stand, Option 001• USB Security Key, Option UL8High Temperature Probe Kit (Option 020)Slim Form Probe Kit (Option 030) Performance Probe Kit (Option 050)9

Configuration Guide - continuedOr, customize your ownProbes – Choose one or allAdditional available partsDielectric Probe Kit, 85070EIncludes:• Dielectric Probe Softwareapplication on CD-Rom• 1 mounting bracket to connect probesto Option 001 Probe Stand or similarstand• 1 10 mm holder to connectperformance probe or slim formholder to mounting bracket• 1 3 mm hex key for 10 mm holderand Ecal holder screws• 1 ECal holder to connect ECalmodule to mounting bracket• 1 Type-N male to 3.5 mm maleadapter, 1250-1743• 1 3.5 mm male to 2.4 mm femaleadapter 11901D• 1 foam lined walnut box.Performance Dielectric Probe Kit,Option 050Includes:• 1 Performance Dielectric Probe• 1 Calibration Short• 1 Conductive Elastomer DiskHigh-Temperature Dielectric ProbeKit, Option 020Includes:• 1 High Temperature Probe• 1 Calibration ShortSlim Form Probe Kit, Option 030Includes:• 3 Slim Form probes• 1 connector saver• 1 Calibration short• 1 10 mm dia sealed probe holder.• 6 O-ringsSlim Form probe replenishment Kit,Option 033Contains 3 extra Slim Form ProbesCables -(Optional, choose any or all)• High Temperature Cable, Option 002• 20 GHz Flexible Cable, Option 022• 50 GHz Flexible Cable, Option 032Accessory -(Optional, highly recommended)• Probe Stand, Option 001Security Key -• USB Hardware Key, Option UL8• 8710-2036 High-TemperatureDielectric Probe• 85070-60003 Shorting block andclamp for high temperature probe• 85070-60004 Short for Slim FormProbes• 85070-60007 Slim Form Probe holder• 85070-60008 ECal Holder• 85070-60009 Set of three Slim FormProbes• 85070-60010 Performance Probe• 85070-60012 Short for PerformanceProbe• 85070-60011 10mm Holder forPerformance Probe and Slim FormProbe• 8120-6286 High Temperature Cable• 8120-6192 20GHz Flexible Cable• 8121-1290 50GHz Flexible Cable• 9301-1298 Probe Stand• 1250-3449 Connector Saver for• Slim Form Probe• 85070-20036 Conductive ElastomerDisk85070E Dielectric Probe KitUpgradesSoftware only upgrade to the E versionfor customers who own the85070D or earlier version.• 85070EU Software Upgrade KitProbe hardware only upgrade kits arenow available to customers who ownthe 85070E or 85070EU. These kitscontain the probe, short and any othersmall accessories included in thestandard probe option.• 85070E-021 High Temperature ProbeUpgrade Kit• 85070E-031 Slim Form ProbeUpgrade Kit• 85070E-051 Performance ProbeUpgrade Kit10

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