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F.GrabskiApplications of semi-Markov processes <strong>in</strong> reliability - RTA # 3-4, 2007, December - Special IssueSuppose that an <strong>in</strong>itial state is λ0. Hence the <strong>in</strong>itialdistribution is p ( 0) = [1 0]and the Laplacetransform of the unconditional reliability function~ ~is R ( s ) = R 0( s ) . Now the equation (20) takes theform of⎡⎢⎢ 1⎢⎢ α⎢ β 11⎢−⎢⎣( s + + 11 1 ) αβ λFor⎡⎢ 1⎢ s + λ0= ⎢⎢ 1⎢⎢⎣s + λ1−( s + λ0αβ00−α( s + β0+ λ0))( s + ββ11−( s + λ ) ( s + β1βα01α011+ λα11+ λ )α00 )⎤⎥ ⎡R~ ⎤⎥ 0( s)⎢ ⎥⎥ ⎢ ⎥⎥ ⎢ ⎥⎥ ⎢ ⎥⎥ ⎣ R~1( s)⎦⎥⎦⎤⎥⎥⎥⎥⎥⎥⎦α = , α = 3, β = 0.2 , β = 0.5, λ = 0, λ 0.2 ,021 010 1=we have1 0.04 0.04 ⎡ 1 0.125 ⎤− +22 ⎢ −3⎥~ s s(s+0.2) ( s+0.2) 0.2 ( 0.2)( 0.7)0()⎣s+s+s+R s =⎦0.04 0.1251−2 3( s+0.2) ( s+0.7)Us<strong>in</strong>g the MATHEMATICA computer program weobta<strong>in</strong> the reliability function as the <strong>in</strong>verse Laplacetransform.R(t)= 1.33023exp( −0.0614293t)+ exp( −0.02t)(1.34007⋅10−14+ 9.9198 ⋅10−15t)− 2 exp( −0.843935t)[0.0189459cos(0.171789t)+ 0.00695828s<strong>in</strong>( 0.171789 t)]− 2 exp( −0.37535t)[0.146168cos(0.224699t)+ 0.128174s<strong>in</strong>(0.224699 t)]Figure 6 shows the reliability function.10.80.60.40.220 40 60 80 100Figure 6. The reliability function from example 2The correspond<strong>in</strong>g density functionf ( t)= −R'(t)is shown <strong>in</strong> Figure 70.040.030.020.0120 40 60 80 100Figure 7. The density function from example 28. ConclusionThe semi-Markov processes theory is convenient fordescription of the reliability systems evolutionthrough the time. The probabilistic characteristics ofsemi-Markov processes are <strong>in</strong>terpreted as thereliability coefficients of the systems. If A representsthe subset of fail<strong>in</strong>g states and i is an <strong>in</strong>itial state, therandom variable ΘiAdesignat<strong>in</strong>g the first passagetime from the state i to the states subset A, denotesthe time to failure of the system. Theorems of semi-Markov processes theory allows us to f<strong>in</strong>d thereliability characteristic, like the distribution of thetime to failure, the reliability function, the mean timeto failure, the availability coefficient of the systemand many others. We should remember that semi-Markov process might be applied as a model of thereal system reliability evolution, only if the basicproperties of the semi-Markov process def<strong>in</strong>ition aresatisfied by the real system.References[1] Barlow, R. E. & Proshan, F. (1975). Statisticaltheory of reliability and life test<strong>in</strong>g. Holt, Re<strong>in</strong>hartand W<strong>in</strong>ston Inc. New York.[2] Brodi, S. M. & Pogosian, I. A. (1973). Embeddedstochastic processes <strong>in</strong> queu<strong>in</strong>g theory. Kiev,Naukova Dumka.- 74 -

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