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Simulations of Chopper Jitter at the LET Neutron Spectrometer at the ...

Simulations of Chopper Jitter at the LET Neutron Spectrometer at the ...

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<strong>Simul<strong>at</strong>ions</strong> <strong>of</strong> <strong>Chopper</strong> <strong>Jitter</strong> <strong>at</strong> <strong>the</strong> <strong>LET</strong> <strong>Neutron</strong> <strong>Spectrometer</strong> <strong>at</strong> <strong>the</strong> ISIS TS2 8(a) Zero jitter(b) 2 µs jitter(c) 10 µs jitter(d) 20 µs jitterFigure 6. A virtual experiment: Detector output when sc<strong>at</strong>tering <strong>of</strong>f a vanadiumsample <strong>of</strong> radius 1 cm, with both beam choppers running <strong>at</strong> 140 Hz, and with 4different jitter settings.5. Discussion and ConclusionWe have conducted a detailed simul<strong>at</strong>ion <strong>of</strong> <strong>the</strong> <strong>LET</strong> spectrometer. We find th<strong>at</strong> <strong>the</strong>instrument performs in general as expected.As can be seen in fig. 9, jitter values <strong>at</strong> or below 2 µs have less than 1 % effect on<strong>the</strong> instrument resolution, judged from virtual experiments <strong>of</strong> elastic sc<strong>at</strong>tering, with<strong>the</strong> chopper speed set <strong>at</strong> 250 Hz. In comparison, <strong>the</strong> jitter when running <strong>the</strong> actual<strong>LET</strong> resolution choppers <strong>at</strong> <strong>the</strong> same speed, is <strong>at</strong> 0.4 µs. The simul<strong>at</strong>ed degrad<strong>at</strong>ion <strong>of</strong>resolution <strong>at</strong> this jitter is well below <strong>the</strong> st<strong>at</strong>istical uncertainty (0.04 %) <strong>of</strong> <strong>the</strong> simul<strong>at</strong>ionresults.In conclusion, our simul<strong>at</strong>ions show th<strong>at</strong> jitter will have negligible effect on <strong>the</strong>performance <strong>of</strong> <strong>the</strong> actual <strong>LET</strong> instrument. In cases where a lorentzian tail in <strong>the</strong>resolution function is particularly detrimental, a more careful analysis is needed.Simul<strong>at</strong>ion <strong>of</strong> jitter effects on future designs <strong>of</strong> high resolution instruments could lead to

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