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VOL. 28 NO. 1 (2016)<br />

LITERATURE<br />

Cl<strong>in</strong>ical applications<br />

Shimadzu has published an application<br />

handbook titled Cl<strong>in</strong>ical. Its near<br />

140 pages cover 47 real life applications<br />

<strong>in</strong>clud<strong>in</strong>g Vitam<strong>in</strong> D, steroids, immunosuppresants,<br />

catecholam<strong>in</strong>es and am<strong>in</strong>o<br />

acids analysis, as well as relevant technologies<br />

and solutions <strong>in</strong>clud<strong>in</strong>g chromatography,<br />

mass spectrometry, <strong>spectroscopy</strong><br />

and life science <strong>in</strong>struments. The book<br />

can be downloaded for free from www.<br />

shimadzu.eu/cl<strong>in</strong>ical.<br />

Shimadzu<br />

l<strong>in</strong>k.<strong>spectroscopy</strong>europe.com/28-01-120<br />

<br />

Steel analysis<br />

Rigaku has published a new application<br />

report describ<strong>in</strong>g the analysis <strong>of</strong> lowalloy<br />

steel us<strong>in</strong>g a benchtop wavelength<br />

dispersive X-ray fluorescence (WDXRF)<br />

spectrometer. Rigaku Application Note<br />

# XRF 1042 details the quantitative analysis<br />

<strong>of</strong> elements <strong>in</strong> low-alloy steels, with<br />

complete <strong>in</strong>formation regard<strong>in</strong>g sample<br />

preparation, method calibration and<br />

repeatability. Alloy steel is amalgamated<br />

with various elements to improve its<br />

mechanical properties. Steels comprised<br />

<strong>of</strong> up to 8% alloy<strong>in</strong>g elements are called<br />

low-alloy steels. Low-alloy steels are typically<br />

designed to achieve better hardenability.<br />

Their mechanical properties<br />

are determ<strong>in</strong>ed by the concentrations<br />

<strong>of</strong> the different elements added to the<br />

steel, some <strong>of</strong> which are at very low<br />

levels. The concentrations <strong>of</strong> elements<br />

<strong>in</strong> molten steel are adjusted dur<strong>in</strong>g the<br />

steel mak<strong>in</strong>g process, typically <strong>in</strong> electric<br />

furnaces. Rapid analysis <strong>of</strong> the elemental<br />

composition is therefore essential. As<br />

part <strong>of</strong> the control process, analyses <strong>of</strong><br />

slag and raw materials such as quicklime<br />

and ferroalloys are also required. X-ray<br />

fluorescence spectrometers are rout<strong>in</strong>ely<br />

employed due to their rapid analysis<br />

capabilities and their ability to measure<br />

both bulk metal and powders. For the<br />

analysis detailed <strong>in</strong> the report, certified<br />

standard reference materials <strong>of</strong> low-alloy<br />

steel provided by NIST and JSS (Japan<br />

Steel Standard) were used to establish<br />

the calibration, and measurements were<br />

performed us<strong>in</strong>g the Superm<strong>in</strong>i200 with<br />

a 200 W Pd target X-ray tube.<br />

Rigaku<br />

l<strong>in</strong>k.<strong>spectroscopy</strong>europe.com/28-01-121<br />

<br />

www.<strong>spectroscopy</strong>europe.com<br />

XRF Experimenter’s Kit<br />

Complete X-Ray Spectrometer<br />

®<br />

Overcom<strong>in</strong>g matrix effects<br />

with XRF<br />

Spectro have published a white paper<br />

expla<strong>in</strong><strong>in</strong>g why overcom<strong>in</strong>g matrix effects<br />

associated with X-ray fluorescence (XRF)<br />

analysis is critical to achiev<strong>in</strong>g consistent<br />

high-accuracy results. Mitigat<strong>in</strong>g Matrix<br />

Effects with Advanced Spectra-Handl<strong>in</strong>g<br />

Functionality When Us<strong>in</strong>g XRF for High-<br />

Accuracy Elemental Analysis is available<br />

to download. A great advantage <strong>of</strong> energy<br />

dispersive X-ray fluorescence (ED-XRF)<br />

analysis for rapid screen<strong>in</strong>g analysis is its<br />

ability to measure samples directly with<br />

a m<strong>in</strong>imum <strong>of</strong> preparation. Realis<strong>in</strong>g<br />

this benefit, however, requires elim<strong>in</strong>at<strong>in</strong>g<br />

potential errors that can result when<br />

atoms <strong>in</strong> the sample matrix <strong>in</strong>fluence<br />

the fluorescence <strong>of</strong> others and thus the<br />

<strong>in</strong>tensities measured by the spectrometer<br />

are <strong>in</strong>fluenced. Such effects, which<br />

<strong>in</strong>clude absorption and enhancement,<br />

when taken collectively, are referred to<br />

generally as matrix effects. For quality<br />

control applications, when the sample<br />

matrix is known or can be matched, a<br />

variety <strong>of</strong> standards-based XRF calculation<br />

procedures are available to compensate<br />

for undesirable matrix effects.<br />

However, creat<strong>in</strong>g the right basis<br />

for consistently high-accuracy results<br />

requires additional spectra handl<strong>in</strong>g<br />

functionality to determ<strong>in</strong>e the correct net<br />

<strong>in</strong>tensities <strong>of</strong> the measured spectra. The<br />

new white paper expla<strong>in</strong>s why this additional<br />

functionality is a critical aspect <strong>of</strong><br />

overcom<strong>in</strong>g matrix effects and ensur<strong>in</strong>g<br />

those consistently high-accuracy results.<br />

Spectro<br />

l<strong>in</strong>k.<strong>spectroscopy</strong>europe.com/28-01-122<br />

<br />

Silicon Drift Detectors<br />

Counts<br />

125 eV FWHM<br />

25 mm 2 x 500 µm<br />

11.2 µs peak<strong>in</strong>g time<br />

P/B Ratio: 20000/1<br />

Energy (keV)<br />

5.9<br />

keV<br />

6.4<br />

keV<br />

FAST SDD ®<br />

Count Rate = >1,000,000 CPS<br />

Resolution<br />

55 Fe<br />

Peak<strong>in</strong>g<br />

Time<br />

125 eV FWHM 4 µs<br />

130 eV FWHM 1 µs<br />

140 eV FWHM 0.2 µs<br />

160 eV FWHM 0.05 µs<br />

www.amptek.com<br />

OEM Components<br />

XRF System<br />

SPECTROSCOPYEUROPE 31

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