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52. J. May, D. Amberger, M. Dinkel, H.W. Höppel and M. Göken: Monotonic and<br />

cyclic deformation behaviour of ultrafine-grained aluminium, Materials Science<br />

and Engineering A 483-484 (2008) 481-484.<br />

53. H. Kumar, Siddaramaiah, R. Somashekar, S.S. Mahesh, A. Manjunath:<br />

Nanocrystallite regions of guar gum filled PU/PAN composites before and after<br />

biodegradation using WAXS, J. Appl. Polymer Sci. 108 (2008) 2762-2771.<br />

54. A.P. Zhilyaev, A.A. Gimazov, E.P. Soshnikova, Á. Révész, T.G. Langdon:<br />

Microstructural characteristics of nickel processed to ultrahigh strains by highpressure<br />

torsion, Mater. Sci. Eng. A 489 (2008) 207-212.<br />

55. V. Davydov, P. Lukás, P. Strunz, R. Kuzel,: Single-line diffraction profile analysis<br />

method used for evaluation of microstructural parameters in the plain ferritic steel<br />

upon tensile straining, Materials Science Forum 571-572 (2008) 181-188.<br />

56. M. Huller J. Vlcek, M. Dinkel, H.W. Hoppel, M. Goken: Hardening and thermal<br />

stability of nanocrystalline AlMg4.8 powder, Phil. Mag. 88 (2008) 1209-1226.<br />

57. Sangappa, Demappa T, Mahadevaiah, S. Ganesh, S. Divakara, R. Somashekar:<br />

Microstructural parameters in electron-irradiated hydroxypropyl methylcellulose<br />

films using X-ray line profile analysis, J. Appl. Polymer Sci. 109 (2008) 3983-<br />

3990.<br />

58. M.R. Movaghar Garabagh, S. Hossein Nedjad, H. Shirazi, M. Iranpour<br />

Mobarekeh, M. Nili Ahmadabadi: X-ray diffraction peak profile analysis aiming at<br />

better understanding of the deformation process and deformed structure of a<br />

martensitic steel, Thin Solid Films 516 (2008) 8117-8124.<br />

59. M. Dinkel, F. Pyczak, J. May, H. Werner Höppel, M. Göken: XRD profile analysis<br />

characterization of ultrafine grained Al–Mg alloys. J. Mater. Sci. 43 (2008) 7481-<br />

7487.<br />

60. Sangappa, T. Demappa, Mahadevaiah, S. Ganesha, S. Divakara, Manjunath<br />

Pattabi, R. Somashekar: Physical and thermal properties of 8 MeV electron beam<br />

irradiated HPMC polymer films, Nuclear Instruments and Methods in Physics<br />

Research Section B: Beam Interactions with Materials and Atoms 266 (2008)<br />

3975-3980.<br />

61. M.R. Movaghar Garabagh, S. Hossein Nedjad, M. Nili Ahmadabadi: X-ray<br />

diffraction study on a nanostructured 18Ni maraging steel prepared by equalchannel<br />

angular pressing, Journal of Materials Science 43 (2008) 6840-6847.<br />

62. S.H. Nedjad, M.-R.M. Gharabagh: Dislocation structure and crystallite size<br />

distribution in lath martensite determined by X-ray diffraction peak profile<br />

analysis, International Journal of Materials Research 99 (2008) 1248-1255.<br />

63. P. Parameswara, T. Demappa, T.N.G. Row, R. Somashekar: Microstructural<br />

Parameters of Hydroxypropyl-methylcellulose Films Using X-ray Data, IRANIAN<br />

POLYMER JOURNAL 17 (2008) 821-829.<br />

64. Robert E. Dinnebier, Simon J. L. Billinge: „Powder Diffraction: Theory and<br />

Practice” Royal Society of Chemistry (2008) ISBN 0854042318.<br />

65. R. Kuzel, V. Cherkaska, Z. Matej, M. Janecek, J. Cizek, M. Dopita: Structural<br />

studies of submicrocrystalline copper and copper composites by different methods,<br />

ZEITSCHRIFT FUR KRISTALLOGRAPHIE Suppl. 27 (2008) 73-80.<br />

66. R Kuzel, L Nichtova, Z Matej, J Sicha, J Musil: Magnetron deposited TiO2 thin<br />

films - crystallization and temperature dependence of microstructure and phase<br />

composition, ZEITSCHRIFT FUR KRISTALLOGRAPHIE Suppl. 27 (2008) 287-<br />

294.<br />

34

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