1 Gubicza Jenő publikációinak idézettsége (1400 db független ...

R. Z. Valiev, S. I. Semiatin, D. H. Shin, T. C. Lowe, TMS (The Minerals, Metals
and Materials Society), 2004, p. 37-44.
6. T. Ungár: Microstructural parameters from X-ray diffraction peak broadening,
Scripta Mater., 51 (2004) 777-781.
7. T. Ungár: Microstructure parameters from X-ray line profile analysis, in:
Advanced X-ray Techniques in Research and Industry, Editor: Ashok Kumar
Singh, IOS-Press, Amsterdam, The Netherlands, ISBN 1-58603-537-1 (2005) 268-
286.
8. V. Medri, S. Guicciardi, V. Dupont, C. Melandri, A. Bellosi: Effects of testing
temperatures and thermal treatments on flexural strength of Si3N4-MoSi2-BN
composites, Adv. Eng. Mater. 8 (2006) 1001-1007.
J. Gubicza and F. Wéber: Comparison of oxidation behaviour of sintered ceramics produced
from various silicon nitride powders, Mater. Sci. Eng. A263 (1999) 101-104.
1. M. I. L. L. Oliviera, K. Chen and J. M. F. Ferreira: Influence of powder pretreatments
on dispersion ability of aqueous silicon nitride-based suspensions, J.
Eur. Cer. Soc. 21 (2001) 2413-2421.
2. T. Ungár: The meaning of size obtained from broadened X-ray diffraction peaks,
Adv. Eng. Mater. 5 (2003) 323-329.
3. T. Ungár: Characterization of ultra-fine-grain materials by X-ray diffraction peak
profile analysis, in Ultrafine Grained Materials III, Eds. Y. T. Zhu, T. G. Langdon,
R. Z. Valiev, S. I. Semiatin, D. H. Shin, T. C. Lowe, TMS (The Minerals, Metals
and Materials Society), 2004, p. 37-44.
4. K. Máthis, K. Nyilas, A. Axt, I. Dragomir-Cernatescu, T. Ungár and P. Lukác: The
evolution of non-basal dislocations as a function of deformation temperature in
pure magnesium determined by X-ray diffraction, Acta Mater. 52 (2004) 2889-
2894.
5. T. Ungár: Microstructural parameters from X-ray diffraction peak broadening,
Scripta Mater. 51 (2004) 777-781.
6. N. Q. Chinh, Gy. Horváth, Zs. Kovács, A. Juhász, Gy. Bérces and J. Lendvai:
Kinematic and dynamic characterization of plastic instabilities occurring in nano-
and microindentation tests, Mater. Sci. Eng. A 409 (2005) 100-107.
7. T. Ungár: Microstructure parameters from X-ray line profile analysis, in:
Advanced X-ray Techniques in Research and Industry, Editor: Ashok Kumar
Singh, IOS-Press, Amsterdam, The Netherlands, ISBN 1-58603-537-1 (2005)
268-286.
8. F. Kang, Z. Li, J.T. Wang, P. Cheng, H.Y. Wu: The activation of c+a non-basal
slip in Magnesium alloys, J. Mater. Sci. 47 (2012) 7854-7859.
J. Gubicza, J. Szépvölgyi, I. Mohai, L. Zsoldos and T. Ungár: Particle size distribution and the
dislocation density determined by high resolution X-ray diffraction in nanocrystalline silicon
nitride powders, Mater. Sci. Eng. A280 (2000) 263-269.
1. J. I. Langford, D. Louer and P. Scardi: Effect of crystallite size distribution on Xray
diffraction line profiles and whole-powder-pattern fitting, J. Appl. Cryst. 33
(2000) 964-974.
2. J. I. Langford: Crystallite size from diffraction data, IUCr Newsletter, No24.
(2000) 11-14.
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