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Semiconductor Processing - ASTM International

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Equalization of Axial Neutron Flux Density for the Transmutation<br />

Doping of Silicon in a Heavy Water Reactor—<br />

KIRSTEN ANDRESEN, KAJ HEYDORN, AND ERIK NONB0L 605<br />

Potential for Large-Diameter NTD Silicon Production in the<br />

Advanced Test Reactor—j. STEPHEN HERRING AND<br />

ROBERT E. KORENKE 615<br />

Advanced Test Reactor NTD Silicon Production Hardware—<br />

MARK J. SCHELL 628<br />

APPENDIXES<br />

Appendix I—Panel Discussions<br />

Cooperative Research Programs 647<br />

Appendix H—Workshop Sessions<br />

Control of Contaminants 654<br />

Interconnection Technology 655<br />

Appendix HI—Panel Discussions<br />

Material and Process Induced Defects 657<br />

Ion Implantation 660<br />

Advanced Lithographic Technology 662<br />

Index 665

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