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Op Amp Applications from Analog Devices - Get a Free Blog

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OP AMP APPLICATIONS<br />

input common mode limits, 7.75-77<br />

input differential protection, 7.86-87<br />

input and output voltage dynamic ranges,<br />

1.18<br />

input overvoltage, 1.43<br />

input and RFI rectification, 7.126-127<br />

input stages, 1.34-43<br />

bias current compensated bipolar,<br />

1.36-37<br />

bias current compensated super-beta<br />

bipolar, 1.38<br />

bipolar, 1.34-35<br />

FET, 1.38-39<br />

overvoltage considerations, 1.43<br />

rail-rail, 1.40-43<br />

integrated circuit, H.45-72<br />

inverter, 1.8<br />

inverting<br />

external offset trim methods, circuit,<br />

1.57<br />

and noninverting, guard techniques,<br />

4.45<br />

protection, 7.82-83<br />

summer, 1.9<br />

inverting mode operation, H.2<br />

JFET<br />

output phase-reversal, 7.90<br />

output voltage phase-reversal, 7.83-84<br />

JFET IC, H.65<br />

Karl Swartzel, H.14-15<br />

limitations in filters, 5.106-107<br />

load immunity, 1.18<br />

long-term stability, 1.58<br />

low noise, filtering, noise performance,<br />

3.45<br />

low noise JFET IC, H.65<br />

low source impedance, 1.4<br />

low-drift, high gain, H.20-21<br />

low-leakage input clamping, 7.78<br />

macromodel<br />

accuracy checking, 7.149<br />

current feedback, input and gain<br />

stages, 7.147<br />

metal migration, 7.76<br />

model 3xx series varactor bridge, H.35<br />

modern IC packages, scale, H.59<br />

modular, H.30<br />

designs, H.31-40<br />

multiplexed data acquisition,<br />

applications, 3.26-27<br />

multistage, 1.26<br />

naming, H.16<br />

by Ragazinni, 1.3<br />

noise, 1.76-87<br />

components, 6.148<br />

frequency characteristic, diagram,<br />

1.79<br />

popcorn noise, 1.80<br />

Index 26<br />

RMS noise, 1.80-83<br />

total noise calculations, 1.83-87<br />

noise figure, 1.79<br />

noise gain and signal gain, manipulation,<br />

1.63<br />

noise model, 1.84<br />

first-order circuit, 3.12<br />

RTI and RTO noise, 3.12<br />

second-order system, 1.85-86<br />

non-IC solid state, H.1<br />

non-ideal<br />

circuit, 1.10<br />

error multiplier, 1.11<br />

gain stability, 1.12<br />

loop gain, 1.12-13<br />

frequency dependence, 1.13-15<br />

plots, 1.13<br />

noise gain, 1.11-12<br />

signal gain, 1.11<br />

static errors <strong>from</strong> finite amplifier<br />

gain, 1.10-15<br />

voltage feedback, 1.14<br />

non-inverting, external offset trim<br />

methods, circuit, 1.57<br />

non-inverting input, H.19-20<br />

normal signals, 7.75<br />

offset voltage, 1.4<br />

open-loop gain, 1.4<br />

out-of-circuit voltage, 7.75<br />

output noise, calculation, 3.12-13<br />

output stages, 1.44-49<br />

offset voltage trim processes, 1.47-49<br />

surge protection, 1.46<br />

output voltage phase-reversal, 7.83-84<br />

over-voltage protection, clamping diode<br />

leakage, 7.77-78<br />

overall loop feedback, H.3<br />

packaging, H.59<br />

passive components, 7.1-24<br />

performance, JFET versus bipolar, 4.65-66<br />

power supply<br />

conditioning techniques, summary, 7.72<br />

and decoupling, 1.92<br />

and power dissipation, 1.92<br />

regulation, 7.51<br />

systems, 7.51-74<br />

precision, 1.18, 1.95-102<br />

characteristics, 1.96<br />

DC error budget analysis, 1.96-97<br />

open-loop gain, 1.95<br />

resolution error, 1.96-97<br />

selection, 1.95<br />

single-supply, performance<br />

characteristics, compared to<br />

OP177F, 1.97<br />

precision bipolar IC, H.55-59<br />

precision JFET IC, H.60-66<br />

process technologies, 1.50

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