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Vol. 24 No. 19 May 15 2012<br />

www.advmat.de<br />

D10488


www.MaterialsViews.com<br />

A <strong>Self</strong>-healing <strong>Conductive</strong> <strong>Ink</strong><br />

Susan A. Odom , Sarut Chayanupatkul , Benjamin J. Blaiszik , Ou Zhao , Aaron C.<br />

<strong>Paul</strong> V. <strong>Braun</strong> , Nancy R. Sottos , Scott R. White , * and Jeffrey S. Moore *<br />

The mechanical durability of conductive materials affects the<br />

performance and lifetimes of devices ranging from electrical<br />

circuits to battery electrode materials. Mismatches in thermal<br />

expansion coeffi cient, Young’s modulus, and Poisson’s ratio<br />

between the conductive materials and packaging materials in<br />

integrated circuits lead to delaminations and fractures both<br />

within conductive pathways and at interconnects.<br />

Dr. S. A. Odom , O. Zhao , Prof. J. S. Moore<br />

Department of Chemistry<br />

Beckman Institute for Advanced Science & Technology<br />

University of Illinois at Urbana-Champaign<br />

405 N. Mathews Ave. Urbana, IL 61801, USA<br />

E-mail: jsmoore@illinois.edu<br />

S. Chayanupatkul , B. J. Blaiszik , A. C. Jackson ,<br />

Prof. P. V. <strong>Braun</strong> , Prof. N. R. Sottos<br />

Department of Materials Science & Engineering<br />

Beckman Institute for Advanced Science & Technology<br />

University of Illinois at Urbana-Champaign<br />

405 N. Mathews Ave. Urbana, IL 61801, USA<br />

Prof. S. R. White<br />

Department of Aerospace Engineering<br />

Beckman Institute for Advanced Science & Technology<br />

University of Illinois at Urbana-Champaign<br />

405 N. Mathews Ave. Urbana, IL 61801, USA<br />

E-mail: swhite@illinois.edu<br />

DOI: 10.1002/adma.201200196<br />

[ 1 , 2 ]<br />

Fatigue<br />

causes microcracks that can lead to channeling, debonding, and<br />

failure. [ 3–5 ] The repeated lithiation and delithiation of battery<br />

electrode materials upon charging and discharging contribute<br />

to decreased capacitance due to a loss of interparticle connectivity<br />

and conductivity. [ 6–9 ] Numerous approaches have been<br />

used to design circuits and materials to prevent mechanical<br />

failure, but only a few have focused on restoring conductivity<br />

after mechanical damage.<br />

[ 10–15 ]<br />

Autonomic restoration of electrical conductivity may greatly<br />

extend the lifetime of electronic materials. The greatest opportunity<br />

for signifi cant short-term impact may be in devices<br />

in which human intervention is diffi cult and/or costly. For<br />

example, fault-tolerant computer chips are of interest in space<br />

applications in which fi eld-programmable gate arrays<br />

used to self-diagnose and reroute damaged circuits. Redundant<br />

circuitry and integrated sensing add complexity, weight, and<br />

cost to fault-tolerant designs. In battery materials, longevity is<br />

an important concern limiting applications. Improving battery<br />

longevity by repairing mechanical failures in electrode materials<br />

would require complete disassembly of the battery cell to<br />

achieve repair. We are interested in developing general concepts<br />

to restore conductivity in mechanically damaged electronic<br />

materials without external intervention or relying on back-up<br />

circuits.<br />

Adv. Mater. 2012,<br />

DOI: 10.1002/adma.201200196<br />

[ 16 ]<br />

are<br />

www.advmat.de<br />

Jackson ,<br />

Recent efforts towards the autonomic restoration of conductivity<br />

have focused on delivering conductive materials to the<br />

site of damage from core–shell microcapsules. [ 10–12 ] Release<br />

of conductive materials has been demonstrated using microcapsules<br />

containing a suspension of conductive carbon nanotubes,<br />

[ 10 ] solutions of precursors to a conductive charge transfer<br />

salt, [ 11 ] and liquid metal alloys. [ 12 ] Conductivity restoration was<br />

demonstrated by manual delivery of core solutions to simulated<br />

cracks [ 11 ] or autonomic delivery to a cracked circuit. [ 12 ] In<br />

this paper, we report a new approach for self-healing: instead<br />

of releasing conductive materials from microcapsules, we utilize<br />

the conductive particles from the conductive ink itself to<br />

heal damage through subsequent particle redistribution. Upon<br />

mechanical damage, solvent released from microcapsules locally<br />

dissolves the polymer binder of the conductive ink, allowing for<br />

particle redistribution and restoration of conductivity upon solvent<br />

evaporation ( Figure 1 a–c).<br />

<strong>Conductive</strong> inks are a mixture of conductive particles,<br />

poly mer binders, and dispersing solvents, and they have been<br />

used in the metallization of microcircuits, [ 17 ] solar cells, [ 18 ] large<br />

area electronic structures, [ 19 ] and solder for microelectronics<br />

packages. [ 20 ] More recently, conductive inks have been used to<br />

print fl exible silver microelectrodes, [ 21 ] circuits on curvilinear<br />

surfaces, [ 22 ] and conductive text, electronic art, and 3D antennas<br />

on paper. [ 23 ] With direct screen printing, [ 24 ] ink-jet printing, [ 25 ]<br />

dip-pen nanolithography, [ 26 ] e-jet printing, [ 27 ] and direct<br />

writing, [ 28 ] many traditional processing steps can be eliminated,<br />

including the use of photoresists and etching. Metallic particles<br />

and polymer binder are usually mixed with one or more solvents<br />

that dissolve the polymer binder. We envisioned a healing<br />

concept where the polymer binder remains soluble after circuit<br />

deposition and the conductive components could subsequently<br />

redistribute upon contact with appropriate solvents. Here we<br />

demonstrate that encapsulated solvent delivered to particle/<br />

binder circuits autonomically restores conductivity to mechanically<br />

damaged conductive inks, and that circuits with lines<br />

spaced 200–500 μ m apart do not short circuit during the restoration<br />

process.<br />

We fi rst explored the response of mechanically damaged<br />

conductive inks to a variety of solvents. <strong>Ink</strong>s consisted of silver<br />

particles in a acrylic binder, deposited as lines, on a glass substrate.<br />

Scratching these lines resulted in a complete loss of electrical<br />

conductivity. Subsequently, a drop of solvent was applied<br />

to the scratched region. After solvent evaporation, conductivity<br />

was restored for a subset of the solvents screened. Conductivity<br />

restoration occurrs with a variety of organic solvents that<br />

dissolve the polymer binder of the conductive ink including<br />

xylenes, chlorobenzene, ethyl phenylacetate, and hexyl acetate.<br />

Optical microscopy images of a line of conductive ink before<br />

and after solvent healing ( Figure 2 a and b) demonstrate the<br />

© 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim wileyonlinelibrary.com 1<br />

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Figure 1 . Representation of self-healing silver particle sample a) before damage, b) immediately<br />

after damage, showing solvent release from microcapsules, and c) after healing, where<br />

the majority of solvent has evaporated. d) 3D representation of sample used for scratch testing.<br />

e) Top and f) side geometries of samples with dimensions shown. (Samples are not not drawn<br />

to scale.)<br />

Figure 2 . Characterization of conductive ink and microcapsules. Optical micrograph of<br />

scratched silver ink circuits on a glass slide a) before damage and b) after a drop of solvent<br />

was added to the scratch and was allowed to evaporate. c) SEM image of polyurea/polyurea–<br />

formaldehyde (PU/PUF) microcapsules containing hexyl acetate with average diameter of<br />

192 μ m. d) SEM image of silver particles from the commercially available conductive ink.<br />

wileyonlinelibrary.com<br />

© 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim<br />

www.MaterialsViews.com<br />

ability of solvent to enable reorganization of<br />

the conductive particles. In the healed line, a<br />

scar from the original scratch is visible, yet<br />

an intact conductive pathway was formed.<br />

To extend these screening tests to a fully<br />

autonomic healing system, we included coreshell<br />

microcapsules ( Figure 2 c and Supporting<br />

Information (SI), Figure S1a) to supply solvent<br />

to the conductive ink (see conductive ink<br />

particles in Figure 2 d). Our design consists<br />

of silver particle ink lines deposited onto a<br />

plastic substrate with solvent-fi lled microcapsules<br />

incorporated into a polyurethane layer<br />

deposited atop the silver ink line ( Figure 1 a).<br />

Failure of the circuit via mechanical damage<br />

simultaneously releases solvent from the<br />

microcapsules ( Figure 1 b). By the mechanism<br />

described in the screening tests, released<br />

solvent locally dissolves the poly mer binder,<br />

allowing the immobilized silver particles to<br />

redistribute and form a connected pathway<br />

once the solvent evaporates ( Figure 1 c), thus<br />

restoring electrical conductivity.<br />

We previously reported the preparation<br />

of hexyl acetate microcapsules [ 29 ] and chose<br />

to use this solvent because of its lower toxicity<br />

and affi nity to dissolve the polymeric<br />

binder. We used a procedure optimized for<br />

solvent encapsulation [ 30 ] to prepare the capsules<br />

for this application. After fi ltration and<br />

drying, we sieved the capsules to isolate those<br />

ranging from 180–250 μ m in diameter. The<br />

polyurethane layer, which is deposited over<br />

the ink line, contained hexyl acetate microcapsules<br />

for self-healing specimens or, as a<br />

control, no microcapsules (see Figure 1 d–f<br />

for substrate geometry).<br />

To measure conductivity during damage<br />

and in the initial minutes after damage, we<br />

connected the silver ink line to a Wheatstone<br />

bridge via lead wires. For testing over hours<br />

or days, we measured the resistance using<br />

an ohmmeter. We used scratch damage to<br />

approximate stress-induced cracking. To<br />

mechanically damage the samples, a razor<br />

blade was used to apply scratches to the circuits,<br />

causing all samples to fail electrically.<br />

Scanning electron microscopy (SEM) analysis<br />

(SI, Figure S3) shows that the scratch<br />

extends through the conductive ink and into<br />

the underlying plastic substrate. For concentrations<br />

of capsules in the polyurethane layer<br />

between 10 and 30 wt%, a decrease in sample<br />

resistance was observed within 1–10 min<br />

( Figure 3 a and SI, Figure S4). None of the<br />

control samples without microcapsules<br />

regained conductivity. We tested the conductivity<br />

restoration when the voltage was<br />

not actively monitored, and we found that<br />

Adv. Mater. 2012,<br />

DOI: 10.1002/adma.201200196


www.MaterialsViews.com<br />

Figure 3 . Conductivity response for conductive ink samples. a) Normalized<br />

bridge voltage ( V norm ) vs. time for a healing sample containing 30 wt%<br />

microcapsules and a control sample with no microcapsules. Scratch applied<br />

at time t = 20 s. b) Resistance of circuits prior to damage, 5 min after damage,<br />

1 h after damage, and 1 week after damage. c) Percent of healed samples<br />

vs. wt% of microcapsules incorporated into the polyurethane healing layer.<br />

(<strong>Healing</strong> is defi ned as having a normalized bridge voltage of 0.8 or higher.)<br />

Adv. Mater. 2012,<br />

DOI: 10.1002/adma.201200196<br />

© 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim<br />

www.advmat.de<br />

conductivity was restored, whether or not a voltage source was<br />

applied during the healing process.<br />

Although samples containing microcapsules healed within<br />

one hour of the damage event, the process of conductivity restoration<br />

continued on a longer time scale. Therefore, we monitored<br />

the circuit resistance over several days, and the resistance<br />

remained constant after ca. one week. For a representative<br />

sample set ( Figure 3 b), the average resistance of 1.45 Ω after<br />

one week is similar to the original resistance of 0.95 Ω . We<br />

presume the continued repair process is due to continued solvent<br />

evaporation, leading to increased interparticle contact. In<br />

contrast, after one week, the control sample (no microcapsules)<br />

showed no evidence of conductivity restoration.<br />

We investigated the effect of microcapsule concentration in<br />

the polyurethane layer on the percentage of samples in which<br />

conductivity was restored. Initial testing described above was<br />

performed with 30 wt% hexyl acetate capsules, and resulted<br />

restoration in almost 90% of the samples, which we defi ned<br />

as recovery of over 80% of original bridge voltage during initial<br />

testing (within 10 min). At lower capsule concentrations, a<br />

decrease was observed in the percentage of samples in which<br />

a change in resistance occurred ( Figure 3 c), suggesting that<br />

within the tested range of capsule loadings, increased solvent<br />

delivery facilitates the healing process.<br />

Additionally, we monitored adjacent ink lines for short circuits.<br />

We prepared an additional sample type in which a series<br />

of parallel lines with 200–500 μ m separation distance. Simultaneous<br />

scratch damage of these lines initiated loss of conductivity,<br />

and subsequent conductivity restoration of the primary<br />

conductive pathway. However, of the 50 samples tested we did<br />

not observe electrical conduction between neighboring lines.<br />

While this value is larger than those reported in recent printed<br />

conductive ink circuits, which have separation distances of<br />

5–10 μ m, [ 21 ] it is important that at our larger distances do not<br />

result in short circuiting.<br />

In conclusion, we showed that solvent-fi lled microcapsules<br />

autonomically restore conductivity to lines of a conductive<br />

silver ink after scratch damage. Optical microscopy revealed<br />

that the relatively large gaps (ca. 25 μ m) in the conductive ink<br />

are bridged by the reorganized silver particles. We found that a<br />

higher concentration of microcapsules leads to greater percent<br />

of samples that undergo conductivity restoration. It may be possible<br />

to achieve greater success in sample healing by optimizing<br />

the capsule size and volume of solvent released to the damaged<br />

area, and also by varying solvents to change polymer binder solubility<br />

and/or solvent volatility. This result represents the fi rst<br />

example of a self-healing circuit in which the circuit material<br />

itself is used to repair damage. In addition to potential applications<br />

in integrated circuits, a solvent-healing mechanism could<br />

conceivably restore such capacity losses in electrodes fabricated<br />

from a soluble binder. Our system does not require rerouting<br />

to back-up circuitry and does not cause short-circuiting upon<br />

healing. Our result provides a new concept for the realization of<br />

fault-tolerant circuits.<br />

Experimental Section<br />

Silver ink circuits were prepared using SPI <strong>Conductive</strong> silver paint, which<br />

was painted onto acrylic substrates. Acrylic substrates were cut from a clear<br />

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www.advmat.de<br />

cast acrylic sheet 0.15 cm thick, purchased from McMaster-Carr, catalog<br />

number 8560K175. Clear Flex 50, a two-part polyurethane elastomer,<br />

was purchased from Smooth On, Inc. Hexyl acetate, urea, resorcinol,<br />

and formalin were purchased from Aldrich Chemical Co. Ethylene-maleic<br />

anhydride copolymer (Zemac-400) powder with an average molecular<br />

weight of 400 kDa (Vertellus) was used as a 2.5 wt% aqueous solution.<br />

The commercial polyurethane prepolymer, Desmodur L75, was purchased<br />

from Bayer Material Science and was used as received.<br />

Microcapsule Preparation : Microcapsules were prepared with slight<br />

modifi cations using our previously published procedures .<br />

wileyonlinelibrary.com<br />

[ 29 , 30 ]<br />

Similarly,<br />

100 mL of distilled water was placed in a 600 mL beaker, along with<br />

25 mL of 2.5 wt% ethylene co-maleic anhydride as a surfactant. The<br />

beaker was placed in a temperature-controlled water bath equipped<br />

with a mechanical stirring blade (40 mm diameter), which was brought<br />

to 400 rpm. To the aqueous solution was added the solid wall-forming<br />

materials: urea (2.50 g), ammonium chloride (0.25 g), and resorcinol<br />

(0.25 g). Afterward, the pH was raised from 2.7 to 3.5 by addition of<br />

NaOH (aq). Desmodur L75 (4 g) in hexyl acetate (60 mL) was added<br />

to the stirring solution, creating an emulsion. After 10 min, 6.33 g of<br />

formalin solution was added, and the temperature was increased to<br />

55 ºC. The reaction proceeded under continuous stirring for 4 h after<br />

which the reaction mixture was allowed to cool to room temperature.<br />

The microcapsules were fi ltered the next day using a Buchner funnel,<br />

washing with water, and were dried under air for 24 h before sieving.<br />

Microcapsule Analysis : After isolation via fi lteration, microcapsules were<br />

sieved to collect those with diameters ranging from 125–180 μ m. Optical<br />

micrographs of dried capsules in mineral oil on glass slides were taken<br />

using a Leica DMR Optical Microscope. Images of dried capsules were<br />

obtained using SEM (FEI/Philips XL30 ESEM-FEG) after sputter coating<br />

with a gold-palladium source. Thermogravimetric analysis (TGA) was<br />

performed on a Mettler-Toledo TGA851 e , calibrated by indium, aluminum,<br />

and zinc standards. A heating rate of 10 ºC min − 1 was used, and<br />

experiments were performed under nitrogen atmosphere from 25–450 ºC.<br />

For each experiment, approximately 5 mg of sample was used.<br />

Wheatstone Bridge Circuit : The conductive metal in each specimen<br />

acts as one resistor in an unbalanced constant voltage Wheatstone<br />

Bridge circuit. The voltage source is a BK Precision DC Power Supply<br />

(model 1710). The voltage gauge and voltage source are monitored by<br />

LabVIEW DAQ. Scratch damage was applied using a Corrocutter with<br />

razor blades at forces ranging from 28–30 N. A new razor blade was<br />

used for each measurement to ensure consistency in the integrity of the<br />

blade for each sample.<br />

Circuit Fabrication : Each circuit was 3 mm wide and ranged from<br />

20–50 μ m in thickness, as measured by profi lometry. Each test sample<br />

contained three circuits to allow for testing of multiple samples at at<br />

the same time. Using a polydimethylsiloxane (PDMS) mold, a 1 mm<br />

thick fi lm of polyurethane elastomer containing 0, 10, 20, or 30 wt%<br />

microcapsules was deposited on top of the silver particle circuits. Wires<br />

were then attached to the circuits using copper pads and solder.<br />

Sample Imaging : To obtain cross-sectional images, a diamond saw was<br />

used to cut thin slices of the circuits; our cuts were made perpendicular<br />

to the direction in which the scratch was applied. The samples were<br />

analyzed by SEM with analysis in refl ectance mode. Not only are the<br />

conductive ink and capsule-containing polyurethane damaged, but the<br />

scratch also extends into the supporting polymer substrate.<br />

Supporting Information<br />

Supporting Information is available from the Wiley Online Library or<br />

from the author.<br />

Received: January 13, 2012<br />

Published online:<br />

© 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim<br />

www.MaterialsViews.com<br />

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Adv. Mater. 2012,<br />

DOI: 10.1002/adma.201200196

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