Program - 62nd CIRP General Assembly Hong Kong, China. 2012
Program - 62nd CIRP General Assembly Hong Kong, China. 2012
Program - 62nd CIRP General Assembly Hong Kong, China. 2012
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- kong
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Tuesday, 21 August 08:00 – 10:00<br />
Cairo + Canberra, B/F<br />
P5 -<br />
P6 -<br />
P7 -<br />
P8 -<br />
Universal High Precision Reference Spheres for Multisensor<br />
Coordinate Measuring Machines<br />
Claus P. Keferstein (3), Michael Marxer, Reto Götti, Rudolf Thalmann,<br />
Thomas Jordi, Matthias Andräs, Jürgen Becker / L. De Chiffre (1)<br />
Accuracy of industrial computed tomography measurements:<br />
experimental results from an international comparison<br />
Simone Carmignato / L. De Chiffre (1)<br />
Sense and Non-Sense of Beam Hardening Correction in CT Metrology<br />
Wim Dewulf, Ye Tan, Kim Kiekens / P. Wanherck (1)<br />
Three-dimensional holistic approximation of measured points<br />
combined with an automatic separation algorithm<br />
Karsten Lübke, Zhongyuan Sun, Gert Goch (1)<br />
Tuesday, 21 August 10:30 – 12:00<br />
Cairo + Canberra, B/F<br />
P9 -<br />
P10 -<br />
P11 -<br />
A methodology for the quantification of value-adding by<br />
manufacturing metrology<br />
Enrico Savio (2)<br />
Integrating the continuous improvement of measurement systems<br />
into the statistical quality control of manufacturing processes: a<br />
novel link<br />
Maria Villeta, Eva M. Rubio (3), José Luis Valencia, Miguel Angel<br />
Sebastian (3) / R. Bueno (1)<br />
Nano fabrication of star structure for precision metrology developed<br />
by focused ion beam direct writing<br />
Zongwei Xu, Fengzhou Fang (1), Haifeng Gao, Yibo Zhu, Albert<br />
Weckenmann (1)<br />
49<br />
Session on Precision Engineering and Metrology (P)
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